JPWO2021090827A1 - - Google Patents

Info

Publication number
JPWO2021090827A1
JPWO2021090827A1 JP2021554949A JP2021554949A JPWO2021090827A1 JP WO2021090827 A1 JPWO2021090827 A1 JP WO2021090827A1 JP 2021554949 A JP2021554949 A JP 2021554949A JP 2021554949 A JP2021554949 A JP 2021554949A JP WO2021090827 A1 JPWO2021090827 A1 JP WO2021090827A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021554949A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021090827A1 publication Critical patent/JPWO2021090827A1/ja
Priority to JP2025016696A priority Critical patent/JP7829755B2/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2021554949A 2019-11-05 2020-11-04 Pending JPWO2021090827A1 (https=)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2025016696A JP7829755B2 (ja) 2019-11-05 2025-02-04 検査装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019201017 2019-11-05
JP2019201016 2019-11-05
PCT/JP2020/041175 WO2021090827A1 (ja) 2019-11-05 2020-11-04 検査装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2025016696A Division JP7829755B2 (ja) 2019-11-05 2025-02-04 検査装置

Publications (1)

Publication Number Publication Date
JPWO2021090827A1 true JPWO2021090827A1 (https=) 2021-05-14

Family

ID=75847979

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2021554949A Pending JPWO2021090827A1 (https=) 2019-11-05 2020-11-04
JP2025016696A Active JP7829755B2 (ja) 2019-11-05 2025-02-04 検査装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2025016696A Active JP7829755B2 (ja) 2019-11-05 2025-02-04 検査装置

Country Status (2)

Country Link
JP (2) JPWO2021090827A1 (https=)
WO (1) WO2021090827A1 (https=)

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001305074A (ja) * 2000-04-19 2001-10-31 Dainippon Printing Co Ltd 板状ワークの検査方法及び装置
JP2007040783A (ja) * 2005-08-02 2007-02-15 Shinko Seiki Co Ltd 外観検査用容器
JP2008249568A (ja) * 2007-03-30 2008-10-16 Fujifilm Corp 外観検査装置
JP2009537022A (ja) * 2006-05-12 2009-10-22 コーニング インコーポレイテッド 透明基板の欠陥の特性評価のための装置及び方法
US20100051834A1 (en) * 2007-01-12 2010-03-04 Aleksey Lopatin Bright field and dark field channels, used for automotive glass inspection systems
JP2012526968A (ja) * 2009-05-15 2012-11-01 サン−ゴバン グラス フランス 透過サブストレートの欠陥を検出するための方法とシステム
JP2013501211A (ja) * 2009-07-31 2013-01-10 サン−ゴバン グラス フランス 基板の欠陥を検出及び分類する方法及びシステム
JP2013040915A (ja) * 2011-08-18 2013-02-28 Samsung Corning Precision Materials Co Ltd ガラス基板の表面不良検査装置および検査方法
JP2014025884A (ja) * 2012-07-30 2014-02-06 Asahi Glass Co Ltd 外観検査方法及び外観検査装置
WO2018088423A1 (ja) * 2016-11-09 2018-05-17 株式会社ブイ・テクノロジー 光学検査装置
JP2018112478A (ja) * 2017-01-12 2018-07-19 リコーエレメックス株式会社 画像検査装置および画像検査方法
JP2018112411A (ja) * 2017-01-06 2018-07-19 日本電気硝子株式会社 ガラス板の検査方法及びその製造方法並びにガラス板の検査装置
KR20180083135A (ko) * 2017-01-12 2018-07-20 (주)트라이시스 곡면 디스플레이 패널 검사 장치
JP2018146239A (ja) * 2017-03-01 2018-09-20 Hoya株式会社 欠陥検査装置、および欠陥検査装置の製造方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11242004A (ja) * 1997-12-26 1999-09-07 Toshiba Corp 陰極線管の蛍光面検査方法およびその装置
JP4613086B2 (ja) * 2005-03-25 2011-01-12 倉敷紡績株式会社 欠陥検査装置
JP2009208963A (ja) * 2008-02-07 2009-09-17 Ryowa Denshi Kk コンベア反転装置及びそれを用いた検査装置

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001305074A (ja) * 2000-04-19 2001-10-31 Dainippon Printing Co Ltd 板状ワークの検査方法及び装置
JP2007040783A (ja) * 2005-08-02 2007-02-15 Shinko Seiki Co Ltd 外観検査用容器
JP2009537022A (ja) * 2006-05-12 2009-10-22 コーニング インコーポレイテッド 透明基板の欠陥の特性評価のための装置及び方法
US20100051834A1 (en) * 2007-01-12 2010-03-04 Aleksey Lopatin Bright field and dark field channels, used for automotive glass inspection systems
JP2008249568A (ja) * 2007-03-30 2008-10-16 Fujifilm Corp 外観検査装置
JP2012526968A (ja) * 2009-05-15 2012-11-01 サン−ゴバン グラス フランス 透過サブストレートの欠陥を検出するための方法とシステム
JP2013501211A (ja) * 2009-07-31 2013-01-10 サン−ゴバン グラス フランス 基板の欠陥を検出及び分類する方法及びシステム
JP2013040915A (ja) * 2011-08-18 2013-02-28 Samsung Corning Precision Materials Co Ltd ガラス基板の表面不良検査装置および検査方法
JP2014025884A (ja) * 2012-07-30 2014-02-06 Asahi Glass Co Ltd 外観検査方法及び外観検査装置
WO2018088423A1 (ja) * 2016-11-09 2018-05-17 株式会社ブイ・テクノロジー 光学検査装置
JP2018112411A (ja) * 2017-01-06 2018-07-19 日本電気硝子株式会社 ガラス板の検査方法及びその製造方法並びにガラス板の検査装置
JP2018112478A (ja) * 2017-01-12 2018-07-19 リコーエレメックス株式会社 画像検査装置および画像検査方法
KR20180083135A (ko) * 2017-01-12 2018-07-20 (주)트라이시스 곡면 디스플레이 패널 검사 장치
JP2018146239A (ja) * 2017-03-01 2018-09-20 Hoya株式会社 欠陥検査装置、および欠陥検査装置の製造方法

Also Published As

Publication number Publication date
WO2021090827A1 (ja) 2021-05-14
JP2025069345A (ja) 2025-04-30
JP7829755B2 (ja) 2026-03-13

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