JPWO2021090827A1 - - Google Patents

Info

Publication number
JPWO2021090827A1
JPWO2021090827A1 JP2021554949A JP2021554949A JPWO2021090827A1 JP WO2021090827 A1 JPWO2021090827 A1 JP WO2021090827A1 JP 2021554949 A JP2021554949 A JP 2021554949A JP 2021554949 A JP2021554949 A JP 2021554949A JP WO2021090827 A1 JPWO2021090827 A1 JP WO2021090827A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021554949A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021090827A1 publication Critical patent/JPWO2021090827A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
JP2021554949A 2019-11-05 2020-11-04 Pending JPWO2021090827A1 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019201016 2019-11-05
JP2019201017 2019-11-05
PCT/JP2020/041175 WO2021090827A1 (ja) 2019-11-05 2020-11-04 検査装置

Publications (1)

Publication Number Publication Date
JPWO2021090827A1 true JPWO2021090827A1 (ja) 2021-05-14

Family

ID=75847979

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021554949A Pending JPWO2021090827A1 (ja) 2019-11-05 2020-11-04

Country Status (2)

Country Link
JP (1) JPWO2021090827A1 (ja)
WO (1) WO2021090827A1 (ja)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007040783A (ja) * 2005-08-02 2007-02-15 Shinko Seiki Co Ltd 外観検査用容器
US7567344B2 (en) * 2006-05-12 2009-07-28 Corning Incorporated Apparatus and method for characterizing defects in a transparent substrate
US8242477B2 (en) * 2007-01-12 2012-08-14 Synergx Technologies Inc. Bright field and dark field channels, used for automotive glass inspection systems
JP2008249568A (ja) * 2007-03-30 2008-10-16 Fujifilm Corp 外観検査装置
KR101324015B1 (ko) * 2011-08-18 2013-10-31 바슬러 비전 테크놀로지스 에이지 유리기판 표면 불량 검사 장치 및 검사 방법
JP2014025884A (ja) * 2012-07-30 2014-02-06 Asahi Glass Co Ltd 外観検査方法及び外観検査装置
KR102339677B1 (ko) * 2016-11-09 2021-12-14 브이 테크놀로지 씨오. 엘티디 광학 검사 장치
JP2018112478A (ja) * 2017-01-12 2018-07-19 リコーエレメックス株式会社 画像検査装置および画像検査方法
KR101898042B1 (ko) * 2017-01-12 2018-09-12 (주)트라이시스 곡면 디스플레이 패널 검사 장치
JP6895768B2 (ja) * 2017-03-01 2021-06-30 Hoya株式会社 欠陥検査装置、および欠陥検査方法

Also Published As

Publication number Publication date
WO2021090827A1 (ja) 2021-05-14

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