JPWO2021084645A1 - - Google Patents

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Publication number
JPWO2021084645A1
JPWO2021084645A1 JP2021553954A JP2021553954A JPWO2021084645A1 JP WO2021084645 A1 JPWO2021084645 A1 JP WO2021084645A1 JP 2021553954 A JP2021553954 A JP 2021553954A JP 2021553954 A JP2021553954 A JP 2021553954A JP WO2021084645 A1 JPWO2021084645 A1 JP WO2021084645A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2021553954A
Other versions
JP7239863B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication of JPWO2021084645A1 publication Critical patent/JPWO2021084645A1/ja
Application granted granted Critical
Publication of JP7239863B2 publication Critical patent/JP7239863B2/ja
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Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1028—Calibration at two points of the transfer characteristic, i.e. by adjusting two reference values, e.g. offset and gain error
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/257—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H03M1/54—Input signal sampled and held with linear return to datum

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
JP2021553954A 2019-10-30 2019-10-30 自己校正機能付きａｄコンバータ Active JP7239863B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/042542 WO2021084645A1 (ja) 2019-10-30 2019-10-30 自己校正機能付きａｄコンバータ

Publications (2)

Publication Number Publication Date
JPWO2021084645A1 true JPWO2021084645A1 (ja) 2021-05-06
JP7239863B2 JP7239863B2 (ja) 2023-03-15

Family

ID=75714924

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021553954A Active JP7239863B2 (ja) 2019-10-30 2019-10-30 自己校正機能付きａｄコンバータ

Country Status (3)

Country Link
US (1) US11936396B2 (ja)
JP (1) JP7239863B2 (ja)
WO (1) WO2021084645A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11714437B2 (en) * 2019-05-28 2023-08-01 Nippon Telegraph And Telephone Corporation Variable reference voltage source
JPWO2022264307A1 (ja) * 2021-06-16 2022-12-22

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59191930A (ja) * 1983-04-15 1984-10-31 Hitachi Ltd アナログ・デイジタル変換回路
JPS6074820A (ja) * 1983-09-30 1985-04-27 Toshiba Corp Ａ／ｄ変換器
JPH05346441A (ja) * 1991-01-31 1993-12-27 Toshiba Corp コンパレータ
JP2003078365A (ja) * 2001-09-05 2003-03-14 Sony Corp オペアンプ回路、静電容量検出装置および指紋照合装置
JP2013191988A (ja) * 2012-03-13 2013-09-26 Ricoh Co Ltd 積分回路及びａｄ変換回路

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5027116A (en) * 1987-02-24 1991-06-25 Micro Linear Corporation Self-calibrating analog to digital converter
JP5346441B2 (ja) 2006-02-24 2013-11-20 株式会社半導体エネルギー研究所 液晶表示装置
US7825838B1 (en) * 2008-09-05 2010-11-02 National Semiconductor Corporation Capacitor rotation method for removing gain error in sigma-delta analog-to-digital converters
US8638248B2 (en) * 2011-10-07 2014-01-28 Nxp, B.V. Input-independent self-calibration method and apparatus for successive approximation analog-to-digital converter with charge-redistribution digital to analog converter
JP6074820B2 (ja) 2015-01-23 2017-02-08 国立研究開発法人情報通信研究機構 アノテーション補助装置及びそのためのコンピュータプログラム
US9356615B1 (en) * 2015-11-06 2016-05-31 Inphi Corporation Systems and methods for comparator calibration

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59191930A (ja) * 1983-04-15 1984-10-31 Hitachi Ltd アナログ・デイジタル変換回路
JPS6074820A (ja) * 1983-09-30 1985-04-27 Toshiba Corp Ａ／ｄ変換器
JPH05346441A (ja) * 1991-01-31 1993-12-27 Toshiba Corp コンパレータ
JP2003078365A (ja) * 2001-09-05 2003-03-14 Sony Corp オペアンプ回路、静電容量検出装置および指紋照合装置
JP2013191988A (ja) * 2012-03-13 2013-09-26 Ricoh Co Ltd 積分回路及びａｄ変換回路

Also Published As

Publication number Publication date
WO2021084645A1 (ja) 2021-05-06
US20220393696A1 (en) 2022-12-08
JP7239863B2 (ja) 2023-03-15
US11936396B2 (en) 2024-03-19

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