JPWO2021075254A1 - - Google Patents

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Publication number
JPWO2021075254A1
JPWO2021075254A1 JP2021552300A JP2021552300A JPWO2021075254A1 JP WO2021075254 A1 JPWO2021075254 A1 JP WO2021075254A1 JP 2021552300 A JP2021552300 A JP 2021552300A JP 2021552300 A JP2021552300 A JP 2021552300A JP WO2021075254 A1 JPWO2021075254 A1 JP WO2021075254A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021552300A
Other languages
Japanese (ja)
Other versions
JPWO2021075254A5 (https=
JP7215591B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed filed Critical
Publication of JPWO2021075254A1 publication Critical patent/JPWO2021075254A1/ja
Publication of JPWO2021075254A5 publication Critical patent/JPWO2021075254A5/ja
Application granted granted Critical
Publication of JP7215591B2 publication Critical patent/JP7215591B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/623—Ion mobility spectrometry combined with mass spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Toxicology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Molecular Biology (AREA)
JP2021552300A 2019-10-16 2020-09-29 イメージング質量分析装置 Active JP7215591B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019189191 2019-10-16
JP2019189191 2019-10-16
PCT/JP2020/036855 WO2021075254A1 (ja) 2019-10-16 2020-09-29 イメージング質量分析装置

Publications (3)

Publication Number Publication Date
JPWO2021075254A1 true JPWO2021075254A1 (https=) 2021-04-22
JPWO2021075254A5 JPWO2021075254A5 (https=) 2022-03-14
JP7215591B2 JP7215591B2 (ja) 2023-01-31

Family

ID=75537957

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021552300A Active JP7215591B2 (ja) 2019-10-16 2020-09-29 イメージング質量分析装置

Country Status (4)

Country Link
US (1) US12154772B2 (https=)
JP (1) JP7215591B2 (https=)
CN (1) CN114450587A (https=)
WO (1) WO2021075254A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7147990B2 (ja) * 2019-07-29 2022-10-05 株式会社島津製作所 イオン化装置
CN121367112A (zh) * 2025-12-23 2026-01-20 联影越质科学仪器(武汉)有限公司 检测设备的参数调整方法、装置、设备、介质和程序产品

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007020862A1 (ja) * 2005-08-12 2007-02-22 Shimadzu Corporation 質量分析装置
JP2007257851A (ja) * 2006-03-20 2007-10-04 Shimadzu Corp 質量分析装置
JP2007530156A (ja) * 2004-03-24 2007-11-01 ヴィズイクス・インコーポレーテッド イメージ・キャプチャ・デバイスを使用するレーザ・ビームの位置および形状の較正
WO2014174659A1 (ja) * 2013-04-26 2014-10-30 三菱電機株式会社 曲率制御装置およびレーザ加工機
WO2017183086A1 (ja) * 2016-04-18 2017-10-26 株式会社島津製作所 質量分析装置
JP2019513222A (ja) * 2016-01-11 2019-05-23 エレメンタル サイエンティフィック レーザーズ エルエルシー サンプル処理中における同時パターンスキャン配置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007097023A1 (ja) 2006-02-27 2007-08-30 Shimadzu Corporation 質量分析装置
JP5359924B2 (ja) * 2010-02-18 2013-12-04 株式会社島津製作所 質量分析装置
JP5502717B2 (ja) * 2010-12-20 2014-05-28 株式会社東芝 重粒子線治療用重粒子イオン発生装置
US9673029B2 (en) 2013-03-15 2017-06-06 Micromass Uk Limited Automated tuning for MALDI ion imaging
CN103499335B (zh) * 2013-09-10 2015-06-10 紫光股份有限公司 一种三维测距方法及其装置
CN104765128B (zh) * 2015-04-21 2017-01-11 长春理工大学 机载激光通信系统环境离焦自适应补偿方法
CN109642889B (zh) 2016-08-24 2021-08-10 株式会社岛津制作所 成像质谱分析装置
CN109961438A (zh) * 2019-04-08 2019-07-02 武汉华工激光工程有限责任公司 一种光斑图像分析方法及装置
CN110132150A (zh) * 2019-05-10 2019-08-16 公安部第三研究所 可见光源光斑尺寸测试的系统及其方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007530156A (ja) * 2004-03-24 2007-11-01 ヴィズイクス・インコーポレーテッド イメージ・キャプチャ・デバイスを使用するレーザ・ビームの位置および形状の較正
WO2007020862A1 (ja) * 2005-08-12 2007-02-22 Shimadzu Corporation 質量分析装置
JP2007257851A (ja) * 2006-03-20 2007-10-04 Shimadzu Corp 質量分析装置
WO2014174659A1 (ja) * 2013-04-26 2014-10-30 三菱電機株式会社 曲率制御装置およびレーザ加工機
JP2019513222A (ja) * 2016-01-11 2019-05-23 エレメンタル サイエンティフィック レーザーズ エルエルシー サンプル処理中における同時パターンスキャン配置
WO2017183086A1 (ja) * 2016-04-18 2017-10-26 株式会社島津製作所 質量分析装置

Also Published As

Publication number Publication date
US20220326181A1 (en) 2022-10-13
US12154772B2 (en) 2024-11-26
CN114450587A (zh) 2022-05-06
WO2021075254A1 (ja) 2021-04-22
JP7215591B2 (ja) 2023-01-31

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