JPWO2021070428A1 - - Google Patents

Info

Publication number
JPWO2021070428A1
JPWO2021070428A1 JP2021550333A JP2021550333A JPWO2021070428A1 JP WO2021070428 A1 JPWO2021070428 A1 JP WO2021070428A1 JP 2021550333 A JP2021550333 A JP 2021550333A JP 2021550333 A JP2021550333 A JP 2021550333A JP WO2021070428 A1 JPWO2021070428 A1 JP WO2021070428A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021550333A
Other versions
JPWO2021070428A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021070428A1 publication Critical patent/JPWO2021070428A1/ja
Publication of JPWO2021070428A5 publication Critical patent/JPWO2021070428A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/11Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths for generating image signals from visible and infrared light wavelengths
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765Method using an image detector and processing of image signal

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2021550333A 2019-10-09 2020-06-24 Pending JPWO2021070428A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019185627 2019-10-09
PCT/JP2020/024787 WO2021070428A1 (ja) 2019-10-09 2020-06-24 撮影装置

Publications (2)

Publication Number Publication Date
JPWO2021070428A1 true JPWO2021070428A1 (ja) 2021-04-15
JPWO2021070428A5 JPWO2021070428A5 (ja) 2022-07-28

Family

ID=75437083

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021550333A Pending JPWO2021070428A1 (ja) 2019-10-09 2020-06-24

Country Status (5)

Country Link
US (1) US20220224845A1 (ja)
EP (1) EP4043865A4 (ja)
JP (1) JPWO2021070428A1 (ja)
CN (1) CN114402191A (ja)
WO (1) WO2021070428A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022234685A1 (ja) * 2021-05-06 2022-11-10 パナソニックIpマネジメント株式会社 拡散部材

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US8021008B2 (en) * 2008-05-27 2011-09-20 Abl Ip Holding Llc Solid state lighting using quantum dots in a liquid
US9160996B2 (en) * 2008-06-27 2015-10-13 Texas Instruments Incorporated Imaging input/output with shared spatial modulator
FI20095065A0 (fi) * 2009-01-26 2009-01-26 Wallac Oy Yhdistetty linssi ja heijastin sekä sitä käyttävä optinen laite
JP5363199B2 (ja) * 2009-06-04 2013-12-11 日本分光株式会社 顕微全反射測定装置
US8350223B2 (en) * 2009-07-31 2013-01-08 Raytheon Company Quantum dot based radiation source and radiometric calibrator using the same
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KR101781249B1 (ko) * 2011-10-13 2017-09-22 오츠카 일렉트로닉스 가부시키가이샤 광학 측정 시스템, 광학 측정 방법, 및 광학 측정 시스템용 경면판
DE102012204174B4 (de) * 2012-03-16 2022-03-10 Rohde & Schwarz GmbH & Co. Kommanditgesellschaft Verfahren, System und Kalibrierobjekt zur automatischen Kalibrierung einer bildgebenden Antennenanordnung
JP5962167B2 (ja) * 2012-04-19 2016-08-03 セイコーエプソン株式会社 検出回路、センサーデバイス及び電子機器
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WO2019059120A1 (ja) * 2017-09-22 2019-03-28 日本電気株式会社 情報処理装置、情報処理システム、情報処理方法、及び、記録媒体
KR20190046112A (ko) * 2017-10-25 2019-05-07 한국전자통신연구원 다면체 회전 거울과 텔레센트릭 f-세타 렌즈를 이용한 테라헤르츠 반사 영상 시스템
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US11297255B1 (en) * 2020-09-18 2022-04-05 Raytheon Company On-board light source calibration

Also Published As

Publication number Publication date
US20220224845A1 (en) 2022-07-14
WO2021070428A1 (ja) 2021-04-15
EP4043865A4 (en) 2022-11-23
EP4043865A1 (en) 2022-08-17
CN114402191A (zh) 2022-04-26

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