JPWO2021069921A5 - - Google Patents

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Publication number
JPWO2021069921A5
JPWO2021069921A5 JP2022521213A JP2022521213A JPWO2021069921A5 JP WO2021069921 A5 JPWO2021069921 A5 JP WO2021069921A5 JP 2022521213 A JP2022521213 A JP 2022521213A JP 2022521213 A JP2022521213 A JP 2022521213A JP WO2021069921 A5 JPWO2021069921 A5 JP WO2021069921A5
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JP
Japan
Prior art keywords
signal
sample
detector
spatial filter
splitting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022521213A
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English (en)
Japanese (ja)
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JP2022552253A (ja
Publication date
Priority claimed from GB1914669.5A external-priority patent/GB2588378A/en
Application filed filed Critical
Publication of JP2022552253A publication Critical patent/JP2022552253A/ja
Publication of JPWO2021069921A5 publication Critical patent/JPWO2021069921A5/ja
Pending legal-status Critical Current

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JP2022521213A 2019-10-10 2020-10-09 最適化された干渉散乱顕微鏡法のための方法および装置 Pending JP2022552253A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1914669.5 2019-10-10
GB1914669.5A GB2588378A (en) 2019-10-10 2019-10-10 Methods and apparatus for optimised interferometric scattering microscopy
PCT/GB2020/052522 WO2021069921A1 (en) 2019-10-10 2020-10-09 Methods and apparatus for optimised interferometric scattering microscopy

Publications (2)

Publication Number Publication Date
JP2022552253A JP2022552253A (ja) 2022-12-15
JPWO2021069921A5 true JPWO2021069921A5 (zh) 2023-09-20

Family

ID=68619476

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022521213A Pending JP2022552253A (ja) 2019-10-10 2020-10-09 最適化された干渉散乱顕微鏡法のための方法および装置

Country Status (6)

Country Link
US (1) US20220365329A1 (zh)
EP (1) EP4042223B1 (zh)
JP (1) JP2022552253A (zh)
CN (1) CN114787609A (zh)
GB (1) GB2588378A (zh)
WO (1) WO2021069921A1 (zh)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7223986B2 (en) * 2002-08-29 2007-05-29 Olympus Optical Co., Ltd. Laser scanning microscope
JP5259154B2 (ja) * 2007-10-24 2013-08-07 オリンパス株式会社 走査型レーザ顕微鏡
GB2552195A (en) * 2016-07-13 2018-01-17 Univ Oxford Innovation Ltd Interferometric scattering microscopy
US10422984B2 (en) * 2017-05-12 2019-09-24 Applied Materials, Inc. Flexible mode scanning optical microscopy and inspection system

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