JPWO2021069921A5 - - Google Patents
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- Publication number
- JPWO2021069921A5 JPWO2021069921A5 JP2022521213A JP2022521213A JPWO2021069921A5 JP WO2021069921 A5 JPWO2021069921 A5 JP WO2021069921A5 JP 2022521213 A JP2022521213 A JP 2022521213A JP 2022521213 A JP2022521213 A JP 2022521213A JP WO2021069921 A5 JPWO2021069921 A5 JP WO2021069921A5
- Authority
- JP
- Japan
- Prior art keywords
- signal
- sample
- detector
- spatial filter
- splitting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1914669.5 | 2019-10-10 | ||
GB1914669.5A GB2588378A (en) | 2019-10-10 | 2019-10-10 | Methods and apparatus for optimised interferometric scattering microscopy |
PCT/GB2020/052522 WO2021069921A1 (en) | 2019-10-10 | 2020-10-09 | Methods and apparatus for optimised interferometric scattering microscopy |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2022552253A JP2022552253A (ja) | 2022-12-15 |
JPWO2021069921A5 true JPWO2021069921A5 (zh) | 2023-09-20 |
Family
ID=68619476
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022521213A Pending JP2022552253A (ja) | 2019-10-10 | 2020-10-09 | 最適化された干渉散乱顕微鏡法のための方法および装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20220365329A1 (zh) |
EP (1) | EP4042223B1 (zh) |
JP (1) | JP2022552253A (zh) |
CN (1) | CN114787609A (zh) |
GB (1) | GB2588378A (zh) |
WO (1) | WO2021069921A1 (zh) |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7223986B2 (en) * | 2002-08-29 | 2007-05-29 | Olympus Optical Co., Ltd. | Laser scanning microscope |
JP5259154B2 (ja) * | 2007-10-24 | 2013-08-07 | オリンパス株式会社 | 走査型レーザ顕微鏡 |
GB2552195A (en) * | 2016-07-13 | 2018-01-17 | Univ Oxford Innovation Ltd | Interferometric scattering microscopy |
US10422984B2 (en) * | 2017-05-12 | 2019-09-24 | Applied Materials, Inc. | Flexible mode scanning optical microscopy and inspection system |
-
2019
- 2019-10-10 GB GB1914669.5A patent/GB2588378A/en not_active Withdrawn
-
2020
- 2020-10-09 CN CN202080071106.4A patent/CN114787609A/zh active Pending
- 2020-10-09 JP JP2022521213A patent/JP2022552253A/ja active Pending
- 2020-10-09 US US17/767,274 patent/US20220365329A1/en active Pending
- 2020-10-09 WO PCT/GB2020/052522 patent/WO2021069921A1/en active Search and Examination
- 2020-10-09 EP EP20792704.7A patent/EP4042223B1/en active Active
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