JPWO2021050400A5 - - Google Patents
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- Publication number
- JPWO2021050400A5 JPWO2021050400A5 JP2022515620A JP2022515620A JPWO2021050400A5 JP WO2021050400 A5 JPWO2021050400 A5 JP WO2021050400A5 JP 2022515620 A JP2022515620 A JP 2022515620A JP 2022515620 A JP2022515620 A JP 2022515620A JP WO2021050400 A5 JPWO2021050400 A5 JP WO2021050400A5
- Authority
- JP
- Japan
- Prior art keywords
- layer
- capacitor
- metal
- capacitor plate
- trench
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16/564,849 US11075157B2 (en) | 2019-09-09 | 2019-09-09 | IC having trench-based metal-insulator-metal capacitor |
US16/564,849 | 2019-09-09 | ||
PCT/US2020/049632 WO2021050400A1 (en) | 2019-09-09 | 2020-09-08 | Ic having trench-based metal-insulator-metal capacitor |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2022547946A JP2022547946A (ja) | 2022-11-16 |
JPWO2021050400A5 true JPWO2021050400A5 (de) | 2023-09-12 |
Family
ID=74851174
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022515620A Pending JP2022547946A (ja) | 2019-09-09 | 2020-09-08 | トレンチベースの金属・絶縁体・金属コンデンサを有するic |
Country Status (5)
Country | Link |
---|---|
US (2) | US11075157B2 (de) |
EP (1) | EP4029054A4 (de) |
JP (1) | JP2022547946A (de) |
CN (1) | CN114342063A (de) |
WO (1) | WO2021050400A1 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113394341A (zh) * | 2020-03-13 | 2021-09-14 | 联华电子股份有限公司 | 金属-绝缘层-金属电容器及其制作方法 |
CN113497186A (zh) * | 2020-04-01 | 2021-10-12 | 联华电子股份有限公司 | 并联的电容结构及其制作方法 |
US11854770B2 (en) * | 2021-01-14 | 2023-12-26 | Applied Materials, Inc. | Plasma processing with independent temperature control |
WO2024087187A1 (zh) * | 2022-10-28 | 2024-05-02 | 华为技术有限公司 | 一种集成装置、制作方法、探测装置及终端 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6329234B1 (en) * | 2000-07-24 | 2001-12-11 | Taiwan Semiconductor Manufactuirng Company | Copper process compatible CMOS metal-insulator-metal capacitor structure and its process flow |
US6838352B1 (en) * | 2002-07-05 | 2005-01-04 | Newport Fab, Llc. | Damascene trench capacitor for mixed-signal/RF IC applications |
TWI229411B (en) * | 2004-04-20 | 2005-03-11 | Powerchip Semiconductor Corp | Method of manufacturing a semiconductor device |
US7470991B2 (en) * | 2005-02-24 | 2008-12-30 | Texas Instruments Incorporated | Integrated high voltage capacitor having capacitance uniformity structures and a method of manufacture therefor |
WO2008010028A1 (en) | 2006-06-15 | 2008-01-24 | Freescale Semiconductor, Inc. | Mim capacitor integration |
US20080277761A1 (en) * | 2007-05-08 | 2008-11-13 | Texas Instruments, Inc. | On-chip isolation capacitors, circuits therefrom, and methods for forming the same |
US8716100B2 (en) * | 2011-08-18 | 2014-05-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of fabricating metal-insulator-metal (MIM) capacitor within topmost thick inter-metal dielectric layers |
KR101720117B1 (ko) * | 2011-12-14 | 2017-03-27 | 인텔 코포레이션 | 복수의 금속 산화물층들을 구비한 절연체 스택을 갖는 금속―절연체―금속(mim)커패시터 |
US9741817B2 (en) * | 2016-01-21 | 2017-08-22 | Tower Semiconductor Ltd. | Method for manufacturing a trench metal insulator metal capacitor |
-
2019
- 2019-09-09 US US16/564,849 patent/US11075157B2/en active Active
-
2020
- 2020-09-08 EP EP20862109.4A patent/EP4029054A4/de active Pending
- 2020-09-08 CN CN202080062936.0A patent/CN114342063A/zh active Pending
- 2020-09-08 WO PCT/US2020/049632 patent/WO2021050400A1/en unknown
- 2020-09-08 JP JP2022515620A patent/JP2022547946A/ja active Pending
-
2021
- 2021-06-28 US US17/360,183 patent/US11616011B2/en active Active
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