JPWO2020256132A1 - - Google Patents

Info

Publication number
JPWO2020256132A1
JPWO2020256132A1 JP2021526938A JP2021526938A JPWO2020256132A1 JP WO2020256132 A1 JPWO2020256132 A1 JP WO2020256132A1 JP 2021526938 A JP2021526938 A JP 2021526938A JP 2021526938 A JP2021526938 A JP 2021526938A JP WO2020256132 A1 JPWO2020256132 A1 JP WO2020256132A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2021526938A
Other languages
Japanese (ja)
Other versions
JPWO2020256132A5 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2020256132A1 publication Critical patent/JPWO2020256132A1/ja
Publication of JPWO2020256132A5 publication Critical patent/JPWO2020256132A5/ja
Abandoned legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C99/00—Subject matter not provided for in other groups of this subclass
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H01R43/16—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for manufacturing contact members, e.g. by punching and by bending

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2021526938A 2019-06-21 2020-06-19 Abandoned JPWO2020256132A1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019115847 2019-06-21
PCT/JP2020/024208 WO2020256132A1 (ja) 2019-06-21 2020-06-19 金属製品の微細加工装置、金属製品の微細加工方法

Publications (2)

Publication Number Publication Date
JPWO2020256132A1 true JPWO2020256132A1 (ko) 2020-12-24
JPWO2020256132A5 JPWO2020256132A5 (ko) 2022-03-15

Family

ID=74036955

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021526938A Abandoned JPWO2020256132A1 (ko) 2019-06-21 2020-06-19

Country Status (4)

Country Link
JP (1) JPWO2020256132A1 (ko)
KR (1) KR20220024107A (ko)
TW (1) TW202104907A (ko)
WO (1) WO2020256132A1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI783744B (zh) * 2021-10-22 2022-11-11 中華精測科技股份有限公司 懸臂式探針結構

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55133549A (en) * 1979-04-03 1980-10-17 Yoshie Hasegawa Probe card
SG75186A1 (en) * 1998-11-30 2000-09-19 Advantest Corp Method for producing contact structures
JP4039839B2 (ja) * 2001-03-12 2008-01-30 株式会社アドテックエンジニアリング 多層回路基板製造用の露光装置
JP5609513B2 (ja) * 2010-10-05 2014-10-22 株式会社ニコン 露光装置、露光方法、及びデバイス製造方法
JP2015152577A (ja) * 2014-02-19 2015-08-24 富士通コンポーネント株式会社 接続用コネクタ及び接続用コネクタの製造方法
JP6642359B2 (ja) 2016-09-21 2020-02-05 オムロン株式会社 プローブピンおよび検査ユニット

Also Published As

Publication number Publication date
WO2020256132A1 (ja) 2020-12-24
KR20220024107A (ko) 2022-03-03
TW202104907A (zh) 2021-02-01

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Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20211222

A621 Written request for application examination

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Effective date: 20230609

A762 Written abandonment of application

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Effective date: 20231013