JPWO2020203568A1 - - Google Patents
Info
- Publication number
- JPWO2020203568A1 JPWO2020203568A1 JP2021511874A JP2021511874A JPWO2020203568A1 JP WO2020203568 A1 JPWO2020203568 A1 JP WO2020203568A1 JP 2021511874 A JP2021511874 A JP 2021511874A JP 2021511874 A JP2021511874 A JP 2021511874A JP WO2020203568 A1 JPWO2020203568 A1 JP WO2020203568A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019066612 | 2019-03-29 | ||
PCT/JP2020/013390 WO2020203568A1 (ja) | 2019-03-29 | 2020-03-25 | 研磨用組成物の製造方法および研磨方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2020203568A1 true JPWO2020203568A1 (ja) | 2020-10-08 |
Family
ID=72667674
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021511874A Pending JPWO2020203568A1 (ja) | 2019-03-29 | 2020-03-25 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPWO2020203568A1 (ja) |
WO (1) | WO2020203568A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP4067449A1 (en) * | 2021-04-02 | 2022-10-05 | SKC Solmics Co., Ltd. | Polishing composition for semiconductor process and method for manufacturing semiconductor device by using the same |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001335319A (ja) * | 2000-05-23 | 2001-12-04 | Jsr Corp | 酸化セリウムの水性分散体の製造方法 |
JP2008028232A (ja) * | 2006-07-24 | 2008-02-07 | Sharp Corp | 半導体基板研磨装置および半導体基板研磨方法、半導体装置の製造方法 |
WO2013073025A1 (ja) * | 2011-11-16 | 2013-05-23 | 日産化学工業株式会社 | 半導体ウェーハ用研磨液組成物 |
JP2014239228A (ja) * | 2014-06-27 | 2014-12-18 | 日立化成株式会社 | Cmp研磨液 |
CN107002280B (zh) * | 2014-11-27 | 2019-06-18 | 住友电气工业株式会社 | 碳化硅基板、其制造方法和制造碳化硅半导体装置的方法 |
JP6768717B2 (ja) * | 2016-02-09 | 2020-10-14 | 三井金属鉱業株式会社 | 研摩スラリー及び研摩材 |
JP6304841B2 (ja) * | 2016-10-25 | 2018-04-04 | 花王株式会社 | 研磨液組成物の製造方法 |
-
2020
- 2020-03-25 WO PCT/JP2020/013390 patent/WO2020203568A1/ja active Application Filing
- 2020-03-25 JP JP2021511874A patent/JPWO2020203568A1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2020203568A1 (ja) | 2020-10-08 |
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