JPWO2020194524A1 - - Google Patents

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Publication number
JPWO2020194524A1
JPWO2020194524A1 JP2021508486A JP2021508486A JPWO2020194524A1 JP WO2020194524 A1 JPWO2020194524 A1 JP WO2020194524A1 JP 2021508486 A JP2021508486 A JP 2021508486A JP 2021508486 A JP2021508486 A JP 2021508486A JP WO2020194524 A1 JPWO2020194524 A1 JP WO2020194524A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021508486A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Publication of JPWO2020194524A1 publication Critical patent/JPWO2020194524A1/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2021508486A 2019-03-26 2019-03-26 Pending JPWO2020194524A1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/012936 WO2020194524A1 (ja) 2019-03-26 2019-03-26 基板解析装置

Publications (1)

Publication Number Publication Date
JPWO2020194524A1 true JPWO2020194524A1 (ja) 2020-10-01

Family

ID=72609644

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021508486A Pending JPWO2020194524A1 (ja) 2019-03-26 2019-03-26

Country Status (2)

Country Link
JP (1) JPWO2020194524A1 (ja)
WO (1) WO2020194524A1 (ja)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02128171A (ja) * 1988-11-07 1990-05-16 Hioki Ee Corp 回路基板検査装置における良否判定用比較基準値及び許容差の補正方法
JP2002174674A (ja) * 2000-12-05 2002-06-21 Advantest Corp 半導体試験装置及びその予防保守方法
JP2005189115A (ja) * 2003-12-25 2005-07-14 Ricoh Co Ltd 基板解析装置
JP2005315867A (ja) * 2004-03-30 2005-11-10 System Jd:Kk 保持具、検査装置、検査方法及び製品
JP2006229087A (ja) * 2005-02-21 2006-08-31 Matsushita Electric Ind Co Ltd 半導体集積回路とその検査方法
JP2013207292A (ja) * 2012-03-29 2013-10-07 Nec Networks & System Integration Corp 電子部品実装回路基板のショート検査方法
JP2018194512A (ja) * 2017-05-22 2018-12-06 日立オートモティブシステムズ株式会社 電子制御装置の検査方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN206773147U (zh) * 2017-05-27 2017-12-19 浙江万里学院 一种通用电路板板上器件故障检测系统

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02128171A (ja) * 1988-11-07 1990-05-16 Hioki Ee Corp 回路基板検査装置における良否判定用比較基準値及び許容差の補正方法
JP2002174674A (ja) * 2000-12-05 2002-06-21 Advantest Corp 半導体試験装置及びその予防保守方法
JP2005189115A (ja) * 2003-12-25 2005-07-14 Ricoh Co Ltd 基板解析装置
JP2005315867A (ja) * 2004-03-30 2005-11-10 System Jd:Kk 保持具、検査装置、検査方法及び製品
JP2006229087A (ja) * 2005-02-21 2006-08-31 Matsushita Electric Ind Co Ltd 半導体集積回路とその検査方法
JP2013207292A (ja) * 2012-03-29 2013-10-07 Nec Networks & System Integration Corp 電子部品実装回路基板のショート検査方法
JP2018194512A (ja) * 2017-05-22 2018-12-06 日立オートモティブシステムズ株式会社 電子制御装置の検査方法

Also Published As

Publication number Publication date
WO2020194524A1 (ja) 2020-10-01

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