JPWO2019235172A1 - 接続装置およびこれを備えた検体検査自動化システム - Google Patents
接続装置およびこれを備えた検体検査自動化システム Download PDFInfo
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- JPWO2019235172A1 JPWO2019235172A1 JP2020523595A JP2020523595A JPWO2019235172A1 JP WO2019235172 A1 JPWO2019235172 A1 JP WO2019235172A1 JP 2020523595 A JP2020523595 A JP 2020523595A JP 2020523595 A JP2020523595 A JP 2020523595A JP WO2019235172 A1 JPWO2019235172 A1 JP WO2019235172A1
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- 230000002093 peripheral effect Effects 0.000 claims description 4
- 239000000523 sample Substances 0.000 description 328
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- 238000003745 diagnosis Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/0092—Scheduling
- G01N35/0095—Scheduling introducing urgent samples with priority, e.g. Short Turn Around Time Samples [STATS]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
- G01N2035/00742—Type of codes
- G01N2035/00752—Type of codes bar codes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
- G01N2035/00742—Type of codes
- G01N2035/00762—Type of codes magnetic code
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
- G01N2035/00792—Type of components bearing the codes, other than sample carriers
- G01N2035/00801—Holders for sample carriers, e.g. trays, caroussel, racks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
- G01N2035/00821—Identification of carriers, materials or components in automatic analysers nature of coded information
- G01N2035/00831—Identification of carriers, materials or components in automatic analysers nature of coded information identification of the sample, e.g. patient identity, place of sampling
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/046—General conveyor features
- G01N2035/0465—Loading or unloading the conveyor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/046—General conveyor features
- G01N2035/0467—Switching points ("aiguillages")
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Abstract
Description
11 検体容器
100 検体前処理装置
111 ホストコンピュータ
200 検体搬送装置
210 検体バッファ
220 接続装置
221 カルーセル
223 検体キャリア分離部
224 検体識別情報読み取り部
225 検体キャリア搬送部
226 シャッタ機構
227 検体クランプ機構
228 検体クランプ機構用カム
229 検体キャリア昇降ランプ
230 検体キャリア搬送ガイド
250 制御部
291a 検体キャリア搬入位置
291b 検体キャリア搬出位置
292a 検体キャリア上昇エリア
292b 検体キャリア下降エリア
293a 第一の検体採取位置
293b 第二の検体採取位置
293c 第三の検体採取位置
298a 第一の高さ
298b 第二の高さ
300 自動分析装置
305 検体採取機構
Claims (8)
- 検体を収容した検体キャリアを搬送する検体キャリア搬送部と、
前記検体キャリア搬送部から搬入された複数の前記検体キャリアを保持可能に構成され、保持した複数の前記検体キャリアを、外部の自動分析装置からの検体採取機構を受け入れる検体採取位置へ、所定の間隔で搬送するカルーセルと、
を備えた接続装置。 - 請求項1に記載の接続装置であって、
前記カルーセルが、
前記検体キャリアの搬入位置から前記検体採取位置までの間に、前記外部の自動分析装置が所定の時間で処理可能な検体数のキャリアを保持可能な数の検体キャリア保持部を有し、
前記検体キャリアの搬入位置から前記検体採取位置まで、前記検体キャリアを検体キャリア保持部の1ピッチ分ずつ回動させる接続装置。 - 請求項1に記載の接続装置であって、
前記カルーセルが、
前記外部の自動分析装置が所定の時間で処理可能な検体数のキャリアを保持可能な数(2n、ただしnは正の偶数)の検体キャリア保持部を有し、
前記検体キャリアの搬入位置から前記検体採取位置まで、検体キャリア保持部を複数ピッチ(n±1)ずつ回動させる接続装置。 - 請求項1乃至3のいずれかに記載の接続装置であって、
当該接続装置の筐体の少なくとも2つの側面と前記カルーセルの検体搬送路の周縁との最短距離がほぼ同じである接続装置。 - 請求項1乃至4のいずれかに記載の接続装置であって、
前記検体キャリア搬送部によって搬送された複数の前記検体キャリアを停止させ、1つずつ前記カルーセルへ送り出す検体キャリア分離部をさらに備える接続装置。 - 請求項1乃至5のいずれかに記載の接続装置であって、
制御部と、
前記検体キャリア搬送部の搬送経路上に設けられた前記検体の識別情報を読み取る検体識別情報読み取り部をさらに備え、
前記制御部が、前記識別情報を前記外部へ送信する接続装置。 - 請求項6に記載の接続装置であって、
前記制御部は、前記検体識別情報読み取り部で読み取った識別情報と、前記カルーセル上の前記検体キャリアのポジションとを関連付けて管理する接続装置。 - 検体検査自動化システムであって、
前処理装置と、
検体搬送装置と、
請求項1乃至7のいずれかに記載の接続装置と、
前記接続装置と接続された自動分析装置と、を備えた検体検査自動化システム。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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JP2018106611 | 2018-06-04 | ||
JP2018106611 | 2018-06-04 | ||
PCT/JP2019/019669 WO2019235172A1 (ja) | 2018-06-04 | 2019-05-17 | 接続装置およびこれを備えた検体検査自動化システム |
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JPWO2019235172A1 true JPWO2019235172A1 (ja) | 2021-06-10 |
JP7124073B2 JP7124073B2 (ja) | 2022-08-23 |
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JP2020523595A Active JP7124073B2 (ja) | 2018-06-04 | 2019-05-17 | 接続装置およびこれを備えた検体検査自動化システム |
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Country | Link |
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US (1) | US20210215730A1 (ja) |
EP (1) | EP3805766B1 (ja) |
JP (1) | JP7124073B2 (ja) |
CN (1) | CN112243498B (ja) |
WO (1) | WO2019235172A1 (ja) |
Families Citing this family (3)
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JP7278207B2 (ja) * | 2019-12-26 | 2023-05-19 | アークレイ株式会社 | ノズルを有する装置の安全装置 |
CN115667908A (zh) | 2020-03-17 | 2023-01-31 | 沃特世科技公司 | 样品管理器、系统和方法 |
CN115516308A (zh) | 2020-03-17 | 2022-12-23 | 沃特世科技公司 | 针驱动器、系统和方法 |
Citations (5)
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JPH01250759A (ja) * | 1988-03-31 | 1989-10-05 | Toshiba Corp | 自動化学分析装置 |
JPH0835970A (ja) * | 1994-07-25 | 1996-02-06 | Hitachi Ltd | 自動分析装置 |
JP2008122421A (ja) * | 2008-02-18 | 2008-05-29 | Hitachi Ltd | 自動分析装置及びラック搬送方法 |
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JP5792566B2 (ja) * | 2011-09-08 | 2015-10-14 | 靜甲株式会社 | グリップ式物品搬送装置 |
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WO2015198764A1 (ja) * | 2014-06-26 | 2015-12-30 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
WO2017051642A1 (ja) * | 2015-09-25 | 2017-03-30 | 株式会社日立ハイテクノロジーズ | 検体検査自動化システム |
KR101830100B1 (ko) * | 2017-10-11 | 2018-02-20 | 전재호 | 산업 부품용 자동 코팅장치 |
-
2019
- 2019-05-17 JP JP2020523595A patent/JP7124073B2/ja active Active
- 2019-05-17 US US15/734,040 patent/US20210215730A1/en active Pending
- 2019-05-17 CN CN201980037113.XA patent/CN112243498B/zh active Active
- 2019-05-17 EP EP19814087.3A patent/EP3805766B1/en active Active
- 2019-05-17 WO PCT/JP2019/019669 patent/WO2019235172A1/ja unknown
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH01250759A (ja) * | 1988-03-31 | 1989-10-05 | Toshiba Corp | 自動化学分析装置 |
JPH0835970A (ja) * | 1994-07-25 | 1996-02-06 | Hitachi Ltd | 自動分析装置 |
JP2008122421A (ja) * | 2008-02-18 | 2008-05-29 | Hitachi Ltd | 自動分析装置及びラック搬送方法 |
US8834791B2 (en) * | 2010-03-12 | 2014-09-16 | Sysmex Corporation | Sample analyzer and non-transitory storage medium |
JP2015152406A (ja) * | 2014-02-14 | 2015-08-24 | 株式会社日立ハイテクノロジーズ | 検体処理システム |
Also Published As
Publication number | Publication date |
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EP3805766A1 (en) | 2021-04-14 |
WO2019235172A1 (ja) | 2019-12-12 |
CN112243498A (zh) | 2021-01-19 |
EP3805766A4 (en) | 2022-03-09 |
CN112243498B (zh) | 2024-05-17 |
US20210215730A1 (en) | 2021-07-15 |
JP7124073B2 (ja) | 2022-08-23 |
EP3805766B1 (en) | 2023-07-05 |
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