JPWO2019136396A5 - - Google Patents

Download PDF

Info

Publication number
JPWO2019136396A5
JPWO2019136396A5 JP2020536864A JP2020536864A JPWO2019136396A5 JP WO2019136396 A5 JPWO2019136396 A5 JP WO2019136396A5 JP 2020536864 A JP2020536864 A JP 2020536864A JP 2020536864 A JP2020536864 A JP 2020536864A JP WO2019136396 A5 JPWO2019136396 A5 JP WO2019136396A5
Authority
JP
Japan
Prior art keywords
plasma processing
processing chamber
application example
component
ring structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2020536864A
Other languages
English (en)
Japanese (ja)
Other versions
JP7333780B2 (ja
JP2021509770A (ja
Publication date
Application filed filed Critical
Priority claimed from PCT/US2019/012570 external-priority patent/WO2019136396A2/en
Publication of JP2021509770A publication Critical patent/JP2021509770A/ja
Publication of JPWO2019136396A5 publication Critical patent/JPWO2019136396A5/ja
Priority to JP2023132188A priority Critical patent/JP2023159242A/ja
Application granted granted Critical
Publication of JP7333780B2 publication Critical patent/JP7333780B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2020536864A 2018-01-08 2019-01-07 プラズマ処理副生成物を管理するための構成要素および処理 Active JP7333780B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2023132188A JP2023159242A (ja) 2018-01-08 2023-08-15 プラズマ処理副生成物を管理するための構成要素および処理

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201862614974P 2018-01-08 2018-01-08
US62/614,974 2018-01-08
PCT/US2019/012570 WO2019136396A2 (en) 2018-01-08 2019-01-07 Components and processes for managing plasma process byproduct materials

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2023132188A Division JP2023159242A (ja) 2018-01-08 2023-08-15 プラズマ処理副生成物を管理するための構成要素および処理

Publications (3)

Publication Number Publication Date
JP2021509770A JP2021509770A (ja) 2021-04-01
JPWO2019136396A5 true JPWO2019136396A5 (zh) 2022-01-17
JP7333780B2 JP7333780B2 (ja) 2023-08-25

Family

ID=67144280

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2020536864A Active JP7333780B2 (ja) 2018-01-08 2019-01-07 プラズマ処理副生成物を管理するための構成要素および処理
JP2023132188A Pending JP2023159242A (ja) 2018-01-08 2023-08-15 プラズマ処理副生成物を管理するための構成要素および処理

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2023132188A Pending JP2023159242A (ja) 2018-01-08 2023-08-15 プラズマ処理副生成物を管理するための構成要素および処理

Country Status (7)

Country Link
US (1) US20210225616A1 (zh)
EP (1) EP3738136A4 (zh)
JP (2) JP7333780B2 (zh)
KR (1) KR20200099203A (zh)
CN (1) CN111566778A (zh)
SG (1) SG11202005688TA (zh)
WO (1) WO2019136396A2 (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN208835019U (zh) * 2018-11-12 2019-05-07 江苏鲁汶仪器有限公司 一种反应腔内衬
KR20210121275A (ko) * 2019-02-21 2021-10-07 램 리써치 코포레이션 양극 산화되고 코팅된 표면을 위한 거시적 텍스처링 (macroscopic texturing)
US20210265137A1 (en) * 2020-02-26 2021-08-26 Intel Corporation Reconditioning of reactive process chamber components for reduced surface oxidation
EP4189731A4 (en) * 2020-07-31 2024-09-04 Lam Res Corp THIN PROTECTION RING FOR LOW INCLINATION TRENCH ENGRAVING
US12060637B2 (en) * 2020-12-01 2024-08-13 Applied Materials, Inc. Actively cooled foreline trap to reduce throttle valve drift
CN117897794A (zh) * 2021-08-19 2024-04-16 朗姆研究公司 经处理的陶瓷室部件
CN113953981B (zh) * 2021-10-29 2023-05-09 山东工业陶瓷研究设计院有限公司 一种金属连接环预处理方法及粗化系统

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5474649A (en) * 1994-03-08 1995-12-12 Applied Materials, Inc. Plasma processing apparatus employing a textured focus ring
US5916454A (en) * 1996-08-30 1999-06-29 Lam Research Corporation Methods and apparatus for reducing byproduct particle generation in a plasma processing chamber
US6007673A (en) * 1996-10-02 1999-12-28 Matsushita Electronics Corporation Apparatus and method of producing an electronic device
JP3251215B2 (ja) * 1996-10-02 2002-01-28 松下電器産業株式会社 電子デバイスの製造装置及び電子デバイスの製造方法
JP3164559B2 (ja) 1998-12-28 2001-05-08 太平洋セメント株式会社 処理容器用部材
JP4544700B2 (ja) 1999-07-29 2010-09-15 京セラ株式会社 真空容器及びその製造方法
KR100315088B1 (ko) 1999-09-29 2001-11-24 윤종용 포커스 링을 갖는 반도체 웨이퍼 제조 장치
US6423175B1 (en) * 1999-10-06 2002-07-23 Taiwan Semiconductor Manufacturing Co., Ltd Apparatus and method for reducing particle contamination in an etcher
US6623595B1 (en) * 2000-03-27 2003-09-23 Applied Materials, Inc. Wavy and roughened dome in plasma processing reactor
EP1162284A1 (en) * 2000-06-05 2001-12-12 Alstom (Switzerland) Ltd Process of repairing a coated component
US6797639B2 (en) * 2000-11-01 2004-09-28 Applied Materials Inc. Dielectric etch chamber with expanded process window
US6777045B2 (en) * 2001-06-27 2004-08-17 Applied Materials Inc. Chamber components having textured surfaces and method of manufacture
US20030047464A1 (en) * 2001-07-27 2003-03-13 Applied Materials, Inc. Electrochemically roughened aluminum semiconductor processing apparatus surfaces
US6780787B2 (en) * 2002-03-21 2004-08-24 Lam Research Corporation Low contamination components for semiconductor processing apparatus and methods for making components
US7311797B2 (en) 2002-06-27 2007-12-25 Lam Research Corporation Productivity enhancing thermal sprayed yttria-containing coating for plasma reactor
US7250114B2 (en) 2003-05-30 2007-07-31 Lam Research Corporation Methods of finishing quartz glass surfaces and components made by the methods
JP2007525820A (ja) 2003-06-04 2007-09-06 東京エレクトロン株式会社 処理システムのための適応可能な処理部材ならびにその製造方法
US7618769B2 (en) * 2004-06-07 2009-11-17 Applied Materials, Inc. Textured chamber surface
US7578945B2 (en) * 2004-09-27 2009-08-25 Lam Research Corporation Method and apparatus for tuning a set of plasma processing steps
US20060086458A1 (en) * 2004-10-25 2006-04-27 Kim Hong J Ceramic materials in plasma tool environments
US20080233403A1 (en) * 2007-02-07 2008-09-25 Timothy Dyer Method of Making Ceramic Reactor Components and Ceramic Reactor Component Made Therefrom
JP2008288348A (ja) * 2007-05-16 2008-11-27 Canon Inc プラズマ処理装置及びプラズマ処理方法
US20090261065A1 (en) * 2008-04-18 2009-10-22 Lam Research Corporation Components for use in a plasma chamber having reduced particle generation and method of making
SG162642A1 (en) * 2009-01-06 2010-07-29 Frontken Singapore Pte Ltd Techniques for maintaining a substrate processing system
WO2011100527A1 (en) * 2010-02-12 2011-08-18 Morgan Advanced Ceramics, Inc. Method for texturing ceramic components
US20120258280A1 (en) * 2011-04-11 2012-10-11 Applied Materials, Inc. Extended life textured chamber components and method for fabricating same
US10557197B2 (en) * 2014-10-17 2020-02-11 Lam Research Corporation Monolithic gas distribution manifold and various construction techniques and use cases therefor
US9478455B1 (en) * 2015-06-12 2016-10-25 Applied Materials, Inc. Thermal pyrolytic graphite shadow ring assembly for heat dissipation in plasma chamber

Similar Documents

Publication Publication Date Title
JP7333780B2 (ja) プラズマ処理副生成物を管理するための構成要素および処理
JP4879738B2 (ja) 温度を制御したチャンバシールドの使用によるパーティクルの低減化
RU2237314C2 (ru) Камера плазменной обработки и способ обработки полупроводниковой подложки в такой камере
TWI616552B (zh) 製程工具防護板及具有防護板之物理氣相沉積室
US5748434A (en) Shield for an electrostatic chuck
US6798519B2 (en) Method and apparatus for an improved optical window deposition shield in a plasma processing system
KR100625928B1 (ko) 반도체기판의 처리장치 및 처리방법
TWI593011B (zh) 用於電漿處理室之邊緣環組件及其製造方法
KR101992702B1 (ko) 고순도 알루미늄 코팅 경질 양극산화
JP2006501608A (ja) プラズマ処理システムにおける改良された堆積シールドのための方法及び装置
TW200834799A (en) Substrate stage and plasma processing apparatus
JP2006500766A (ja) 基板上のポリマーの堆積を減少させるためのデバイスを備えたプラズマ装置及びポリマーの堆積を減少させるための方法
KR20070055413A (ko) 챔버 스퍼터링용 타깃 및 프로세스 키트
KR20160030812A (ko) 플라즈마 처리 장치
JP2017212427A (ja) 半導体製造用部品の再生方法、その再生装置及び再生部品
JP6937753B2 (ja) 融合されたカバーリング
KR20010014842A (ko) 반도체 장치를 제조하기 위한 장치 및 방법
JP3919409B2 (ja) プラズマ処理装置および半導体製造装置のフォーカスリング
JP3162873U (ja) プラズマ処理装置の交換可能な上側チャンバ部
JPWO2019136396A5 (zh)
TWI652145B (zh) 基板支撐件及其形成方法
TW202231921A (zh) 用於減少斜面沉積的背側氣體洩漏
CN113678226B (zh) 易耗部件、构建其工程化表面的方法及等离子体处理室
CN117980528A (zh) 用于物理气相沉积(pvd)腔室的遮盘
TWI801632B (zh) 用於電漿處理腔室的處理套件、用於rfpvd腔室的處理套件、及pvd腔室