JPWO2010073358A1 - 半導体成膜時の温度測定方法および温度測定装置 - Google Patents
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Abstract
Description
前記半導体層に光を与えながら前記半導体層の温度を上昇させる過程で、前記半導体層を透過する光の透過率が低下するときの、前記半導体層の温度Tsと透過率が低下する光の波長λsとの関係を予め求めておき、
成膜中または成膜後の前記半導体層に前記波長λsの光を照射し、前記基板の温度を下降させて、前記半導体層に対する前記波長λsの光の透過率が上昇したときに、前記半導体層が前記温度Tsに至ったと判断し、または、前記基板の温度を上昇させて、前記半導体層に対する前記波長λsの光の透過率が低下したときに、前記半導体層が前記温度Tsに至ったと判断することを特徴とするものである。
所定の波長λsの光を成膜中または成膜後の前記半導体層に与える発光装置と、前記半導体層を透過した前記波長λsの光の光量を検出する光検出装置と、前記光検出装置からの測定値が与えられるとともに前記基板を加熱する加熱装置を制御する制御部とが設けられており、
前記半導体に前記波長λsの光を与えながら前記半導体層の温度を上昇させる過程で、前記半導体層を透過する前記光の透過率が低下するときの、前記半導体層の温度Tsと前記波長λsとの関係の情報が、前記制御部に保持されており、
前記制御部は、成膜中または成膜後の前記半導体層に前記波長λsの光を照射し且つ前記加熱装置を制御して前記基板の温度を下降させて、前記光検出装置で検出される前記波長λsの光の光量が上昇したときに、前記半導体層が前記温度Tsに至ったと判断し、または前記基板の温度を上昇させて、前記光検出装置で検出される前記波長λsの光の光量が低下したときに、前記半導体層が前記温度Tsに至ったと判断することを特徴とするものである。
前記制御部では、前記半導体層が前記温度Tsに至ったと判断した時刻に前記温度変化測定装置で測定された温度Tdを、前記温度Tsと比較し、その差に基づいて、前記温度変化測定装置の測定誤差を較正することもできる。
発光装置21からは所定の波長λsのレーザ光が発せられる。レーザ光の波長と成膜中のまたは成膜後のと半導体層7の光透過率および温度との関係は図3(A)(B)に示されている。
2 チャンバ
3 テーブル
6 基板
7 半導体層
8 第1の窓
9 第2の窓
10 パイロメータ
11 受光部
20 温度測定装置
21 発光装置
Claims (7)
- チャンバ内で基板を加熱しながら前記チャンバ内へ原料分子を供給して前記基板上に半導体層を成膜し、成膜中または成膜後に前記半導体層の温度を測定する測定方法において、
前記半導体層に光を与えながら前記半導体層の温度を上昇させる過程で、前記半導体層を透過する光の透過率が低下するときの、前記半導体層の温度Tsと透過率が低下する光の波長λsとの関係を予め求めておき、
成膜中または成膜後の前記半導体層に前記波長λsの光を照射し、前記基板の温度を下降させて、前記半導体層に対する前記波長λsの光の透過率が上昇したときに、前記半導体層が前記温度Tsに至ったと判断し、または、前記基板の温度を上昇させて、前記半導体層に対する前記波長λsの光の透過率が低下したときに、前記半導体層が前記温度Tsに至ったと判断することを特徴とする温度測定方法。 - 前記基板の温度を継続的に測定する温度変化測定装置を使用し、前記半導体層が前記温度Tsに至ったと判断した時刻に前記温度変化測定装置で測定された温度Tdを、前記温度Tsと比較し、その差に基づいて、前記温度変化測定装置の測定誤差を較正する請求項1記載の温度測定方法。
- 前記基板の温度を前記温度Tsよりも高い温度に設定して前記半導体層の成膜を開始し、その後に前記基板の温度を下降させて、成膜中の前記半導体層に対する前記波長λsの光の透過率が上昇した時刻に、前記半導体層が前記温度Tsに至ったと判断し、前記時刻に前記温度変化測定装置で測定された温度Tdと前記温度Tsとから、前記温度変化測定装置の測定誤差を較正する請求項2記載の温度測定方法。
- 前記基板の温度を前記温度Tsよりも高い温度に設定して前記半導体層の成膜を開始し、その後に前記基板の温度を下降させて、成膜中の前記半導体層に対する前記波長λsの光の透過率が上昇した第1の時刻に、前記半導体層が前記温度Tsに至ったと判断し、その後に前記基板の温度を上昇させて、前記半導体層に対する前記波長λsの光の透過率が低下した第2の時刻に、前記半導体層が前記温度Tsに至ったと判断し、前記第1時刻と前記第2の時刻に前記温度変化測定装置で2回測定された温度の測定値と前記温度Tsとから前記温度変化測定装置の測定誤差を較正する請求項2記載の温度測定方法。
- 前記半導体層の成膜が完了した後に、前記基板の温度を下降させて、成膜後の前記半導体層に対する前記波長λsの光の透過率が上昇した時刻に、前記半導体層が前記温度Tsに至ったと判断し、前記時刻に前記温度変化測定装置で測定された温度Tdと前記温度Tsとから、前記温度変化測定装置の測定誤差を較正する請求項2記載の温度測定方法。
- チャンバ内で基板を加熱しながら前記チャンバ内へ原料分子を供給して前記基板上に半導体層を成膜する成膜装置に設けられて、成膜中または成膜後の前記半導体層の温度を測定する温度測定装置において、
所定の波長λsの光を成膜中または成膜後の前記半導体層に与える発光装置と、前記半導体層を透過した前記波長λsの光の光量を検出する光検出装置と、前記光検出装置からの測定値が与えられるとともに前記基板を加熱する加熱装置を制御する制御部とが設けられており、
前記半導体に前記波長λsの光を与えながら前記半導体層の温度を上昇させる過程で、前記半導体層を透過する前記光の透過率が低下するときの、前記半導体層の温度Tsと前記波長λsとの関係の情報が、前記制御部に保持されており、
前記制御部は、成膜中または成膜後の前記半導体層に前記波長λsの光を照射し且つ前記加熱装置を制御して前記基板の温度を下降させて、前記光検出装置で検出される前記波長λsの光の光量が上昇したときに、前記半導体層が前記温度Tsに至ったと判断し、または前記基板の温度を上昇させて、前記光検出装置で検出される前記波長λsの光の光量が低下したときに、前記半導体層が前記温度Tsに至ったと判断することを特徴とする温度測定装置。 - 前記基板が加熱されたときの温度を継続的に測定する温度変化測定装置が設けられており、
前記制御部では、前記半導体層が前記温度Tsに至ったと判断した時刻に前記温度変化測定装置で測定された温度Tdを、前記温度Tsと比較し、その差に基づいて、前記温度変化測定装置の測定誤差を較正する請求項6記載の温度測定装置。
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US7734439B2 (en) * | 2002-06-24 | 2010-06-08 | Mattson Technology, Inc. | System and process for calibrating pyrometers in thermal processing chambers |
JP5076278B2 (ja) * | 2005-03-14 | 2012-11-21 | 日亜化学工業株式会社 | 電界効果トランジスタ |
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