JPWO2005052503A1 - 形状測定装置 - Google Patents
形状測定装置 Download PDFInfo
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- JPWO2005052503A1 JPWO2005052503A1 JP2005515757A JP2005515757A JPWO2005052503A1 JP WO2005052503 A1 JPWO2005052503 A1 JP WO2005052503A1 JP 2005515757 A JP2005515757 A JP 2005515757A JP 2005515757 A JP2005515757 A JP 2005515757A JP WO2005052503 A1 JPWO2005052503 A1 JP WO2005052503A1
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- Prior art keywords
- roller
- dpf
- measured
- shape
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- 238000006073 displacement reaction Methods 0.000 claims abstract description 25
- 238000005096 rolling process Methods 0.000 claims abstract description 6
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- 101100444142 Neurospora crassa (strain ATCC 24698 / 74-OR23-1A / CBS 708.71 / DSM 1257 / FGSC 987) dut-1 gene Proteins 0.000 abstract 1
- 101100224414 Caenorhabditis elegans dpf-1 gene Proteins 0.000 description 30
- GWGQWFHTAOMUBD-UHFFFAOYSA-N [[3-[bis(phosphonomethyl)amino]-2-hydroxypropyl]-(phosphonomethyl)amino]methylphosphonic acid Chemical compound OP(=O)(O)CN(CP(O)(O)=O)CC(O)CN(CP(O)(O)=O)CP(O)(O)=O GWGQWFHTAOMUBD-UHFFFAOYSA-N 0.000 description 30
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- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
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- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- JSKIRARMQDRGJZ-UHFFFAOYSA-N dimagnesium dioxido-bis[(1-oxido-3-oxo-2,4,6,8,9-pentaoxa-1,3-disila-5,7-dialuminabicyclo[3.3.1]nonan-7-yl)oxy]silane Chemical compound [Mg++].[Mg++].[O-][Si]([O-])(O[Al]1O[Al]2O[Si](=O)O[Si]([O-])(O1)O2)O[Al]1O[Al]2O[Si](=O)O[Si]([O-])(O1)O2 JSKIRARMQDRGJZ-UHFFFAOYSA-N 0.000 description 2
- KZHJGOXRZJKJNY-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Si]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O KZHJGOXRZJKJNY-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910052863 mullite Inorganic materials 0.000 description 2
- SBEQWOXEGHQIMW-UHFFFAOYSA-N silicon Chemical compound [Si].[Si] SBEQWOXEGHQIMW-UHFFFAOYSA-N 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 229910000505 Al2TiO5 Inorganic materials 0.000 description 1
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- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 102100029859 Zinc finger protein neuro-d4 Human genes 0.000 description 1
- JFBZPFYRPYOZCQ-UHFFFAOYSA-N [Li].[Al] Chemical compound [Li].[Al] JFBZPFYRPYOZCQ-UHFFFAOYSA-N 0.000 description 1
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- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
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- AABBHSMFGKYLKE-SNAWJCMRSA-N propan-2-yl (e)-but-2-enoate Chemical compound C\C=C\C(=O)OC(C)C AABBHSMFGKYLKE-SNAWJCMRSA-N 0.000 description 1
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- 239000010703 silicon Substances 0.000 description 1
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- 238000005245 sintering Methods 0.000 description 1
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
- G01B7/287—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
- G01B5/207—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2273/00—Operation of filters specially adapted for separating dispersed particles from gases or vapours
- B01D2273/18—Testing of filters, filter elements, sealings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
Description
である。
Claims (3)
- セグメントが複数列並べられて接合された被測定物を一方向に相対的に移動をさせながら前記被測定物の形状を測定する装置であって、
前記セグメントの各列に対応して設けられ、前記相対的な移動に伴って被測定物の端面上を転動しながら端面の凹凸に倣って変位する複数のローラと、
その複数のローラの各々に対応して設けられ、それぞれのローラの変位量を検出する検出手段と、
その検出手段が検出した前記ローラの変位量に基づいて前記被測定物の形状データを算出する演算手段と、
を備えている形状測定装置。 - 前記検出手段は、前記ローラが回転自在に取り付けられたローラフレームに接触しており、ローラの前記変位に伴って変位するローラフレームの変位量を検出する接触プローブである請求項1に記載の形状測定装置。
- 前記ローラが、カムフォロアである請求項1又は2に記載の形状測定装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003400171 | 2003-11-28 | ||
JP2003400171 | 2003-11-28 | ||
PCT/JP2004/016994 WO2005052503A1 (ja) | 2003-11-28 | 2004-11-16 | 形状測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2005052503A1 true JPWO2005052503A1 (ja) | 2007-06-21 |
JP4515386B2 JP4515386B2 (ja) | 2010-07-28 |
Family
ID=34631632
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005515757A Active JP4515386B2 (ja) | 2003-11-28 | 2004-11-16 | 形状測定装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7343690B2 (ja) |
EP (1) | EP1688703B1 (ja) |
JP (1) | JP4515386B2 (ja) |
KR (1) | KR100798718B1 (ja) |
PL (1) | PL1688703T3 (ja) |
WO (1) | WO2005052503A1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007086143A1 (ja) * | 2006-01-30 | 2007-08-02 | Ibiden Co., Ltd. | ハニカム構造体の検査方法、及び、ハニカム構造体の製造方法 |
JP5183070B2 (ja) * | 2006-02-17 | 2013-04-17 | イビデン株式会社 | ハニカム構造体の検査方法、及び、ハニカム構造体の製造方法 |
JP2009214224A (ja) * | 2008-03-10 | 2009-09-24 | Toyo Knife Co Ltd | 刃物研削盤 |
US8201813B2 (en) * | 2009-04-30 | 2012-06-19 | The United States Of America As Represented By The Secretary Of The Navy | Head window fixture and method |
KR100998506B1 (ko) * | 2009-09-09 | 2010-12-07 | 최상철 | 항공기 날개의 비선형 부품 검사 장치 |
GB201104410D0 (en) * | 2011-03-16 | 2011-04-27 | Rolls Royce Plc | A method of measuring a component |
CN107300354A (zh) * | 2017-07-21 | 2017-10-27 | 中信戴卡股份有限公司 | 一种车轮法兰平面度检测装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS498271A (ja) * | 1972-05-10 | 1974-01-24 | ||
JPS5737406U (ja) * | 1980-08-12 | 1982-02-27 | ||
JPH11160006A (ja) * | 1997-11-28 | 1999-06-18 | Takasago Ind Co Ltd | 陶磁製タイルの自動検査装置 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3303571A (en) * | 1964-06-22 | 1967-02-14 | William E Veals | Apparatus for testing wheel mounted inflated tires |
DE2633351C2 (de) * | 1976-07-24 | 1983-11-17 | Hoesch Werke Ag, 4600 Dortmund | Einrichtung zum Messen der Planheit von Metallbändern |
JPS6013443B2 (ja) | 1978-09-11 | 1985-04-08 | 日本碍子株式会社 | 被測定物の高さ測定装置 |
JPS5737406A (en) | 1980-08-19 | 1982-03-01 | Suzuki Hideko | Umbrella |
US4577494A (en) * | 1983-08-19 | 1986-03-25 | Jackson Jordan, Inc. | Apparatus and method for measuring the wear of railroad rail |
JPS6085308A (ja) | 1983-10-17 | 1985-05-14 | Fujitsu Ltd | スル−ホ−ル欠陥検査法 |
JPS6085308U (ja) * | 1983-11-11 | 1985-06-12 | 渡辺 義雄 | 路面の凹凸量の測定装置 |
JPH0615970B2 (ja) * | 1987-09-01 | 1994-03-02 | 三菱重工業株式会社 | ロールプロフィール計測方法 |
JPH0712501A (ja) * | 1993-06-25 | 1995-01-17 | Sumitomo Metal Ind Ltd | 管体の形状測定装置 |
US5535143A (en) * | 1993-12-15 | 1996-07-09 | Face; Allen | Rolling digital surface measurement apparatus |
GB2335493B (en) * | 1998-03-20 | 2000-09-13 | Mitsubishi Heavy Ind Ltd | Method for measuring roll profile |
US6658947B1 (en) * | 2000-08-25 | 2003-12-09 | T. Sendzimir, Inc. | Strip flatness measuring device |
DE10241069B4 (de) * | 2002-09-05 | 2004-07-15 | Aesculap Ag & Co. Kg | Vorrichtung zur Erfassung der Kontur einer Oberfläche |
US6954991B2 (en) * | 2002-09-12 | 2005-10-18 | Showa Denko K.K. | Method and apparatus for measuring shape of tubular body |
-
2004
- 2004-11-16 WO PCT/JP2004/016994 patent/WO2005052503A1/ja active Application Filing
- 2004-11-16 EP EP20040819310 patent/EP1688703B1/en active Active
- 2004-11-16 JP JP2005515757A patent/JP4515386B2/ja active Active
- 2004-11-16 KR KR1020067012678A patent/KR100798718B1/ko not_active IP Right Cessation
- 2004-11-16 PL PL04819310T patent/PL1688703T3/pl unknown
- 2004-11-16 US US10/579,495 patent/US7343690B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS498271A (ja) * | 1972-05-10 | 1974-01-24 | ||
JPS5737406U (ja) * | 1980-08-12 | 1982-02-27 | ||
JPH11160006A (ja) * | 1997-11-28 | 1999-06-18 | Takasago Ind Co Ltd | 陶磁製タイルの自動検査装置 |
Also Published As
Publication number | Publication date |
---|---|
KR100798718B1 (ko) | 2008-01-28 |
PL1688703T3 (pl) | 2015-10-30 |
JP4515386B2 (ja) | 2010-07-28 |
US7343690B2 (en) | 2008-03-18 |
EP1688703B1 (en) | 2015-04-22 |
EP1688703A1 (en) | 2006-08-09 |
EP1688703A4 (en) | 2010-01-20 |
KR20060105793A (ko) | 2006-10-11 |
US20070144024A1 (en) | 2007-06-28 |
WO2005052503A1 (ja) | 2005-06-09 |
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