JPS649376A - Timing calibration system - Google Patents
Timing calibration systemInfo
- Publication number
- JPS649376A JPS649376A JP62162306A JP16230687A JPS649376A JP S649376 A JPS649376 A JP S649376A JP 62162306 A JP62162306 A JP 62162306A JP 16230687 A JP16230687 A JP 16230687A JP S649376 A JPS649376 A JP S649376A
- Authority
- JP
- Japan
- Prior art keywords
- value
- time difference
- voltage
- time
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To shorten the executing time of calibration and to make it possible to perform highly accurate timing calibration, by using the same device for a DA converter, which converts a time difference into a digital (D) value, and for a DA converter, which converts a time value for setting a delay time into an analog (A) voltage value. CONSTITUTION:At first, a delay time for a switch circuit 6 is obtained as a time difference with respect to a reference clock in a phase comparator 14. The time difference is converted into a D value. Namely, the time difference with respect to the reference clock, which is obtained in the comparator 14, is converted into a DC voltage. A D input value of a DAC 17 is controlled so that the DC voltage and the A output of a DA converter (C) 17 become equal. The output of the time difference from comparator 14 undergoes D conversion. When the time difference correction is set, the D value obtained by the D conversion of the delay time is added to the correcting value. The result is inputted into the DAC 17 as the D value. A variable D delay circuit 4 is controlled so that the A output of the DAC 17 agrees with the DC voltage, which is obtained by converting the output of the comparator into the DC voltage. Thus the time difference correction is set.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62162306A JPS649376A (en) | 1987-07-01 | 1987-07-01 | Timing calibration system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62162306A JPS649376A (en) | 1987-07-01 | 1987-07-01 | Timing calibration system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS649376A true JPS649376A (en) | 1989-01-12 |
Family
ID=15752001
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62162306A Pending JPS649376A (en) | 1987-07-01 | 1987-07-01 | Timing calibration system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS649376A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7094067B2 (en) | 2002-10-21 | 2006-08-22 | Hosiden Corporation | Connection structure between printed circuit board and flexible circuit board |
JP2008286524A (en) * | 2007-05-15 | 2008-11-27 | Yokogawa Electric Corp | Apparatus for testing semiconductor |
-
1987
- 1987-07-01 JP JP62162306A patent/JPS649376A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7094067B2 (en) | 2002-10-21 | 2006-08-22 | Hosiden Corporation | Connection structure between printed circuit board and flexible circuit board |
JP2008286524A (en) * | 2007-05-15 | 2008-11-27 | Yokogawa Electric Corp | Apparatus for testing semiconductor |
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