JPS6490533A - Plasma processing device - Google Patents
Plasma processing deviceInfo
- Publication number
- JPS6490533A JPS6490533A JP24839587A JP24839587A JPS6490533A JP S6490533 A JPS6490533 A JP S6490533A JP 24839587 A JP24839587 A JP 24839587A JP 24839587 A JP24839587 A JP 24839587A JP S6490533 A JPS6490533 A JP S6490533A
- Authority
- JP
- Japan
- Prior art keywords
- fluctuation
- information
- detecting means
- state value
- power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Drying Of Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24839587A JPS6490533A (en) | 1987-09-30 | 1987-09-30 | Plasma processing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24839587A JPS6490533A (en) | 1987-09-30 | 1987-09-30 | Plasma processing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6490533A true JPS6490533A (en) | 1989-04-07 |
Family
ID=17177469
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24839587A Pending JPS6490533A (en) | 1987-09-30 | 1987-09-30 | Plasma processing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6490533A (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09232289A (ja) * | 1996-02-28 | 1997-09-05 | Nec Kyushu Ltd | ドライエッチング装置 |
US6858446B2 (en) | 1998-07-10 | 2005-02-22 | Seiko Epson Corporation | Plasma monitoring method and semiconductor production apparatus |
-
1987
- 1987-09-30 JP JP24839587A patent/JPS6490533A/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09232289A (ja) * | 1996-02-28 | 1997-09-05 | Nec Kyushu Ltd | ドライエッチング装置 |
US6858446B2 (en) | 1998-07-10 | 2005-02-22 | Seiko Epson Corporation | Plasma monitoring method and semiconductor production apparatus |
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