JPS648655A - Test mode voltage detection circuit - Google Patents

Test mode voltage detection circuit

Info

Publication number
JPS648655A
JPS648655A JP62164242A JP16424287A JPS648655A JP S648655 A JPS648655 A JP S648655A JP 62164242 A JP62164242 A JP 62164242A JP 16424287 A JP16424287 A JP 16424287A JP S648655 A JPS648655 A JP S648655A
Authority
JP
Japan
Prior art keywords
test mode
current
inputting
intermediate potential
detection circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62164242A
Other languages
Japanese (ja)
Inventor
Kayoko Katayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62164242A priority Critical patent/JPS648655A/en
Publication of JPS648655A publication Critical patent/JPS648655A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)

Abstract

PURPOSE:To use a normal protective circuit as compared with a conventional method of inputting a high voltage and to eliminate a special device configuration for inputting the high voltage by providing an intermediate potential detector inputting an intermediate potential voltage value of binary voltage values for detecting its through current, and an integrator. CONSTITUTION:When an intermediate potential of binary voltage value VCC and a zero voltage is input from an input terminal 1 for a predetermined time at the time of a test mode, a through current iD flows to a channel transistor 9, and a current iD' responsive to a ratio by a current mirror type flows to an n-channel transistor 10. Further, it is A/D-converted, input to an integrator 3, and detected for a predetermined time to be set to a test mode.
JP62164242A 1987-06-30 1987-06-30 Test mode voltage detection circuit Pending JPS648655A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62164242A JPS648655A (en) 1987-06-30 1987-06-30 Test mode voltage detection circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62164242A JPS648655A (en) 1987-06-30 1987-06-30 Test mode voltage detection circuit

Publications (1)

Publication Number Publication Date
JPS648655A true JPS648655A (en) 1989-01-12

Family

ID=15789375

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62164242A Pending JPS648655A (en) 1987-06-30 1987-06-30 Test mode voltage detection circuit

Country Status (1)

Country Link
JP (1) JPS648655A (en)

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