JPS6479647A - Detecting function self-diagnosing apparatus for pinhole tester - Google Patents

Detecting function self-diagnosing apparatus for pinhole tester

Info

Publication number
JPS6479647A
JPS6479647A JP62236643A JP23664387A JPS6479647A JP S6479647 A JPS6479647 A JP S6479647A JP 62236643 A JP62236643 A JP 62236643A JP 23664387 A JP23664387 A JP 23664387A JP S6479647 A JPS6479647 A JP S6479647A
Authority
JP
Japan
Prior art keywords
pinhole
detection system
generation circuit
signal
signal generation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62236643A
Other languages
Japanese (ja)
Other versions
JPH0820381B2 (en
Inventor
Yasuyuki Kasanami
Hiromasa Shiyoubutani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Metal Corp
Original Assignee
Mitsubishi Metal Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Metal Corp filed Critical Mitsubishi Metal Corp
Priority to JP62236643A priority Critical patent/JPH0820381B2/en
Publication of JPS6479647A publication Critical patent/JPS6479647A/en
Publication of JPH0820381B2 publication Critical patent/JPH0820381B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/909—Investigating the presence of flaws or contamination in a container or its contents in opaque containers or opaque container parts, e.g. cans, tins, caps, labels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/894—Pinholes

Abstract

PURPOSE:To enable self-diagnosis on the propriety of a detecting function of the apparatus, by providing a pinhole for resting to always inspect operating condition of a detection system. CONSTITUTION:When a pinhole 13 for testing gets to a test position, light from a light source 10 reaches a photosensor passing through the pinhole 13 for testing. So, when the photosensor operates normally, a level discrimination circuit outputs a light leakage signal '1'. On the other hand, an angle signal generation circuit outputs a test position signal at this position. Then, as these signals are supplied to a detection system deficiency signal generation circuit, the detection system deficiency signal generation circuit judges that no abnormality exists and outputs no deficiency signal. On the other hand, when there is no output from the photosensor 9 with the pinhole 13 at the test position, a light leakage signal remains '0' from a level discrimination circuit. Thus, the detection system deficiency signal generation circuit sends the deficiency signal to an interface to stop the rotation of a turret disc 1 through a main motor interlock or the like and an alarm is outputted while the flow of cans 3 can be stopped.
JP62236643A 1987-09-21 1987-09-21 Pinhole tester detection function Self-diagnosis device Expired - Fee Related JPH0820381B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62236643A JPH0820381B2 (en) 1987-09-21 1987-09-21 Pinhole tester detection function Self-diagnosis device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62236643A JPH0820381B2 (en) 1987-09-21 1987-09-21 Pinhole tester detection function Self-diagnosis device

Publications (2)

Publication Number Publication Date
JPS6479647A true JPS6479647A (en) 1989-03-24
JPH0820381B2 JPH0820381B2 (en) 1996-03-04

Family

ID=17003662

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62236643A Expired - Fee Related JPH0820381B2 (en) 1987-09-21 1987-09-21 Pinhole tester detection function Self-diagnosis device

Country Status (1)

Country Link
JP (1) JPH0820381B2 (en)

Also Published As

Publication number Publication date
JPH0820381B2 (en) 1996-03-04

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees