JPS6459860A - Preparation of ion implantation mask - Google Patents

Preparation of ion implantation mask

Info

Publication number
JPS6459860A
JPS6459860A JP21532587A JP21532587A JPS6459860A JP S6459860 A JPS6459860 A JP S6459860A JP 21532587 A JP21532587 A JP 21532587A JP 21532587 A JP21532587 A JP 21532587A JP S6459860 A JPS6459860 A JP S6459860A
Authority
JP
Japan
Prior art keywords
liquid
source gas
ion implantation
layer
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21532587A
Other languages
Japanese (ja)
Inventor
Tsunetoshi Arikado
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP21532587A priority Critical patent/JPS6459860A/en
Publication of JPS6459860A publication Critical patent/JPS6459860A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To enable the material to be an ion implantation mask to be formed on the sidewall of a polycrystalline silicon electrode, by employing a series of processes in which the temperature of a wafer is lowered to the condensation temperature of a source gas at a predetermined pressures to condense the gas on the surface of the wafer, the condensation layer is then resolved into a deposition layer by a light illuminating or a plasma. CONSTITUTION:When the temperature of a substrate is lowered to the condensation temperature of a source gas, the source gas is condensed into liquid on the surface of the substrate. At this time, the liquid so starts the deposition thereof from the place in which the liquid can have the minimum surface area as to minimize the surface energy thereof. For example, when a trench is previously formed in the silicon substrate 31 and the source gas is made to condensed into liquid thereon, the liquid 32 starts the deposition thereof from an angular bottom. Now, the condensation layer, which is deposited on the bottom, is illuminated with light to be resolved into a solid layer. Similarly, the cooling of a sample may be performed within a plasma system. Accordingly, the ion implantation mask suitable for an LDD structure can be made of the solid film deposited on the such the angular bottom without an etching process therefor being employed.
JP21532587A 1987-08-31 1987-08-31 Preparation of ion implantation mask Pending JPS6459860A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21532587A JPS6459860A (en) 1987-08-31 1987-08-31 Preparation of ion implantation mask

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21532587A JPS6459860A (en) 1987-08-31 1987-08-31 Preparation of ion implantation mask

Publications (1)

Publication Number Publication Date
JPS6459860A true JPS6459860A (en) 1989-03-07

Family

ID=16670431

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21532587A Pending JPS6459860A (en) 1987-08-31 1987-08-31 Preparation of ion implantation mask

Country Status (1)

Country Link
JP (1) JPS6459860A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006013653A1 (en) * 2004-08-04 2006-02-09 Mitsubishi Denki Kabushiki Kaisha Sensor for transmitting and receiving ultrasonic wave radiation, position detector, and dehumidifier

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006013653A1 (en) * 2004-08-04 2006-02-09 Mitsubishi Denki Kabushiki Kaisha Sensor for transmitting and receiving ultrasonic wave radiation, position detector, and dehumidifier

Similar Documents

Publication Publication Date Title
US5151296A (en) Method for forming polycrystalline film by chemical vapor deposition process
MX167077B (en) MICROWAVE SYSTEM AND METHOD FOR FORMING SEMICONDUCTORS
EP1126514A3 (en) Etching method
JPS5767173A (en) Plasma etching device
KR910008803A (en) Selective Removal Method of Insulation Film
KR870011702A (en) Back Channel Surface Stabilization Method for Amorphous Silicon Field Effect Transistor
EP0841689A3 (en) Method of processing semiconductor substrate
JPS6459860A (en) Preparation of ion implantation mask
KR860006566A (en) Method for forming metal thin film and apparatus for forming same
EP0170560A3 (en) Backside gettering of silicon wafers
Condas et al. Properties of Thin Antimony Films Deposited in High Vacuum
JPS57202729A (en) Manufacture of semiconductor device
JPS6420663A (en) Manufacture of semiconductor device
JPS6419760A (en) Semiconductor integrated circuit device
JPS6439080A (en) Method for stabilizing surface of infrared-ray detecting element
JPS6450426A (en) Surface treatment
JPS6472533A (en) Manufacture of single crystal semiconductor substrate
JPS6428809A (en) Laser annealing device
JPS6459851A (en) Manufacture of soi wafer
JPS54125967A (en) Crystal growth method
JPS57159017A (en) Manufacture of semiconductor single crystal film
JPS5678422A (en) Preparation of electrically conductive transparent thin film
JPS57204135A (en) Manufacture of semiconductor device
JPS5766624A (en) Manufacture of photo conductive amorphous silicon thin film
JPS6464336A (en) Manufacture of semiconductor device