JPS6459087A - Measuring socket jig for flat package type ic - Google Patents
Measuring socket jig for flat package type icInfo
- Publication number
- JPS6459087A JPS6459087A JP62215588A JP21558887A JPS6459087A JP S6459087 A JPS6459087 A JP S6459087A JP 62215588 A JP62215588 A JP 62215588A JP 21558887 A JP21558887 A JP 21558887A JP S6459087 A JPS6459087 A JP S6459087A
- Authority
- JP
- Japan
- Prior art keywords
- contactor
- package type
- flat package
- sockets
- combination
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE:To measure various flat package type ICs by dividing a conventional socket jig into common substrates together with a socket for combination, and further dividing the sockets for combination and allowing them to be replaced. CONSTITUTION:Four divided sockets 5 for combination has a contactor 2 which contacts the contactor (a) of an IC 4, a contactor 2a for an IC measuring circuit, and wiring internally. The sockets 5 are fitted in the common substrates 7 so that respective socket side contactors 2a and common-substrate side contactors 8 are connected mutually. Then the measuring flat package type IC 4 is pressed and fitted from above by a lid so as to perform an electric connection between its lead 4a and contactor 2a. The other terminal of the contactor 8 of a substrate 7 is connected to the IC measuring circuit to measure the IC 4. Consequently, various flag package type ICs are measured.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62215588A JPS6459087A (en) | 1987-08-28 | 1987-08-28 | Measuring socket jig for flat package type ic |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62215588A JPS6459087A (en) | 1987-08-28 | 1987-08-28 | Measuring socket jig for flat package type ic |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6459087A true JPS6459087A (en) | 1989-03-06 |
Family
ID=16674918
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62215588A Pending JPS6459087A (en) | 1987-08-28 | 1987-08-28 | Measuring socket jig for flat package type ic |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6459087A (en) |
-
1987
- 1987-08-28 JP JP62215588A patent/JPS6459087A/en active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB858336A (en) | Electric terminal pin for printed circuit boards | |
EP0248521A3 (en) | Electrical contactors | |
JPS51144988A (en) | Electric connector | |
EP0735623A3 (en) | Electrical connector | |
MY112140A (en) | Jig for measuring the characteristics of a semiconductor, manufacturing method for the same, and usage of the same | |
EP0280565A3 (en) | Test socket incorporating circuit elements | |
JPS6459087A (en) | Measuring socket jig for flat package type ic | |
JPS55112517A (en) | Measuring equipment | |
JPS6459081A (en) | Handler | |
JPS63280432A (en) | Ic package | |
JPS5735342A (en) | Manufacturing method of large scale integrated circuit | |
JPS57128938A (en) | Device for measuring characteristic of semiconductor | |
JPS5487070A (en) | Simultaneous multi-contact probe | |
WO2000004585A3 (en) | Chip carrier device and method for the production of a chip carrier device with an electrical test | |
JPS649377A (en) | Testing method and sheet for integrated circuit package | |
JPS6473629A (en) | Semiconductor integrated circuit | |
JPH02162671A (en) | Ic package converting socket | |
JPS51138358A (en) | Electronic circuit testing apparatus | |
JPS6484630A (en) | Measuring jig for semiconductor integrated circuit | |
JPS6444864A (en) | Ic test handler | |
JPS57114866A (en) | Measuring device of semiconductor device | |
JPS5692474A (en) | Aging tester of ic | |
JPS643577A (en) | Contactor for inspecting semiconductor | |
JPS5362479A (en) | Integrated circuit with power terminals for testing | |
JPS5679262A (en) | Testing method for leadless parts |