JPS6444864A - Ic test handler - Google Patents
Ic test handlerInfo
- Publication number
- JPS6444864A JPS6444864A JP62202210A JP20221087A JPS6444864A JP S6444864 A JPS6444864 A JP S6444864A JP 62202210 A JP62202210 A JP 62202210A JP 20221087 A JP20221087 A JP 20221087A JP S6444864 A JPS6444864 A JP S6444864A
- Authority
- JP
- Japan
- Prior art keywords
- socket
- individual substrates
- measuring electrode
- supplied
- wiring pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To efficiently perform highly reliable measurement, by mounting an IC device to an IC socket and obtaining electrical connection with respect to a measuring electrode. CONSTITUTION:An IC device to be measured falls on an IC guide rail 1 under its own wt. to be supplied. A feed means 2 sucks and secures the supplied IC device from the surface thereof to mount the same on each of the IC socket 4 mounted to the IC block board 3 provided under said feed means 2. The board 3 consists of one common substrate and individual substrates each having the socket 4 mounted thereon. That is, the sockets corresponding to the IC devices to be measured are fixedly mounted on the surfaces of the individual substrates. Therefore, a through-hole having pin of the socket inserted therein to be soldered thereto and the wiring pattern electrically connected to said through-hole are formed to each of the individual substrates. The terminal of the wiring pattern is set to a measuring electrode and the arrangement of said measuring electrode is standardized with respect to various IC sockets. Further, each of the individual substrates is mounted to the common substrate in a detachable manner by a screw.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62202210A JPS6444864A (en) | 1987-08-13 | 1987-08-13 | Ic test handler |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62202210A JPS6444864A (en) | 1987-08-13 | 1987-08-13 | Ic test handler |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6444864A true JPS6444864A (en) | 1989-02-17 |
Family
ID=16453783
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62202210A Pending JPS6444864A (en) | 1987-08-13 | 1987-08-13 | Ic test handler |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6444864A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7926482B2 (en) | 2004-04-27 | 2011-04-19 | Consort Medical Plc | Dispensing apparatus |
-
1987
- 1987-08-13 JP JP62202210A patent/JPS6444864A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7926482B2 (en) | 2004-04-27 | 2011-04-19 | Consort Medical Plc | Dispensing apparatus |
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