JPS6444864A - Ic test handler - Google Patents

Ic test handler

Info

Publication number
JPS6444864A
JPS6444864A JP62202210A JP20221087A JPS6444864A JP S6444864 A JPS6444864 A JP S6444864A JP 62202210 A JP62202210 A JP 62202210A JP 20221087 A JP20221087 A JP 20221087A JP S6444864 A JPS6444864 A JP S6444864A
Authority
JP
Japan
Prior art keywords
socket
individual substrates
measuring electrode
supplied
wiring pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62202210A
Other languages
Japanese (ja)
Inventor
Kiyoshi Koizumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP62202210A priority Critical patent/JPS6444864A/en
Publication of JPS6444864A publication Critical patent/JPS6444864A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To efficiently perform highly reliable measurement, by mounting an IC device to an IC socket and obtaining electrical connection with respect to a measuring electrode. CONSTITUTION:An IC device to be measured falls on an IC guide rail 1 under its own wt. to be supplied. A feed means 2 sucks and secures the supplied IC device from the surface thereof to mount the same on each of the IC socket 4 mounted to the IC block board 3 provided under said feed means 2. The board 3 consists of one common substrate and individual substrates each having the socket 4 mounted thereon. That is, the sockets corresponding to the IC devices to be measured are fixedly mounted on the surfaces of the individual substrates. Therefore, a through-hole having pin of the socket inserted therein to be soldered thereto and the wiring pattern electrically connected to said through-hole are formed to each of the individual substrates. The terminal of the wiring pattern is set to a measuring electrode and the arrangement of said measuring electrode is standardized with respect to various IC sockets. Further, each of the individual substrates is mounted to the common substrate in a detachable manner by a screw.
JP62202210A 1987-08-13 1987-08-13 Ic test handler Pending JPS6444864A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62202210A JPS6444864A (en) 1987-08-13 1987-08-13 Ic test handler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62202210A JPS6444864A (en) 1987-08-13 1987-08-13 Ic test handler

Publications (1)

Publication Number Publication Date
JPS6444864A true JPS6444864A (en) 1989-02-17

Family

ID=16453783

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62202210A Pending JPS6444864A (en) 1987-08-13 1987-08-13 Ic test handler

Country Status (1)

Country Link
JP (1) JPS6444864A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7926482B2 (en) 2004-04-27 2011-04-19 Consort Medical Plc Dispensing apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7926482B2 (en) 2004-04-27 2011-04-19 Consort Medical Plc Dispensing apparatus

Similar Documents

Publication Publication Date Title
CA1195386A (en) Testing device
EP0406919A3 (en) Arrangement for electronically testing printed circuits with extremely fine contact-point screen
GB1399006A (en) Circuit boards
GB2146849B (en) Electrical test probe head assembly
DE3779623D1 (en) DEVICE FOR TESTING ELECTRICAL BOARDS.
KR100272715B1 (en) Probe unit and inspection head
JPS6444864A (en) Ic test handler
ATE69652T1 (en) DEVICE FOR AUTOMATIC CHECKING OF COMPONENTS TO BE MOUNTED ON SURFACE.
JPH077038B2 (en) Printed circuit board inspection equipment
JPH03124088A (en) Printed board device
KR930001586Y1 (en) Testboard pin connecting equipment
JP2601680Y2 (en) Contact board for auto handler with ground board
DE3568085D1 (en) Device for testing printed circuit boards with a grid of contact points of elevated density
JPS57122368A (en) Inspecting apparatus for printed circuit board
JPS5679262A (en) Testing method for leadless parts
GB1408203A (en) Printed circuit cards
JPS6240539Y2 (en)
JP2759451B2 (en) Printed circuit board inspection jig
JPS63153481A (en) Connecting device for measuring integrated circuit
JP2528910Y2 (en) Contact probe support cover
JP3287184B2 (en) Inspection circuit structure of semiconductor device
JPS5692474A (en) Aging tester of ic
JPH0690263B2 (en) Printed board test connection device
JPH05242939A (en) Ic socket for measuring plcc
KR20000017256U (en) Module for a test of semiconductors