JPS6444025A - System for assembling semiconductor device - Google Patents
System for assembling semiconductor deviceInfo
- Publication number
- JPS6444025A JPS6444025A JP20113387A JP20113387A JPS6444025A JP S6444025 A JPS6444025 A JP S6444025A JP 20113387 A JP20113387 A JP 20113387A JP 20113387 A JP20113387 A JP 20113387A JP S6444025 A JPS6444025 A JP S6444025A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- automatically
- bonder
- die
- curing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/85009—Pre-treatment of the connector or the bonding area
Abstract
PURPOSE:To shorten a leading time, to eliminate an insufficient curing, and to smoothly and efficiently assemble a semiconductor device by composing a die bonder, a die bonding paste curing furnace, an inspecting unit, a defective component container, a good component container and a wire bonder in in-line. CONSTITUTION:A die bonder 1 for automatically die bonding to a predetermined part of a substrate, a curing furnace 3 for curing the die bonded substrate automatically conveyed from the bonder 1, an inspecting unit 5 for automatically inspecting the presence or absence of a predetermined type of malfunction of the cured substrate automatically conveyed from the furnace, a defective component container 8 for automatically containing the substrate judged as being improper by the unit 5, a good component contained 10 for automatically containing the substrate judged as being good by the unit 5, and a wire bonder 11 of the good substrate are provided. Accordingly, according to this assembling system, since a series of processes to the wire bonding can be performed in in-line, an insufficient curing might not occur, energy-saving is performed, and a leading time can be shortened.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62201133A JP2605725B2 (en) | 1987-08-12 | 1987-08-12 | Semiconductor device assembly system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62201133A JP2605725B2 (en) | 1987-08-12 | 1987-08-12 | Semiconductor device assembly system |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6444025A true JPS6444025A (en) | 1989-02-16 |
JP2605725B2 JP2605725B2 (en) | 1997-04-30 |
Family
ID=16435952
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62201133A Expired - Fee Related JP2605725B2 (en) | 1987-08-12 | 1987-08-12 | Semiconductor device assembly system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2605725B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005026695A (en) * | 2003-07-01 | 2005-01-27 | Samsung Electronics Co Ltd | Manufacturing equipment of inline integrated circuit chip package, and manufacturing method of integrated circuit chip package using the same |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5925234A (en) * | 1982-08-03 | 1984-02-09 | Toshiba Corp | Assembly method for semiconductor |
JPS59232430A (en) * | 1983-06-16 | 1984-12-27 | Nec Corp | Apparatus for manufacturing semiconductor element |
JPS61154041A (en) * | 1984-12-26 | 1986-07-12 | Toshiba Corp | Fabricating apparatus of semiconductor |
JPS61177732A (en) * | 1985-02-01 | 1986-08-09 | Hitachi Ltd | Producer |
JPS6220333A (en) * | 1985-07-19 | 1987-01-28 | Hitachi Ltd | Semiconductor manufacturing equipment |
-
1987
- 1987-08-12 JP JP62201133A patent/JP2605725B2/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5925234A (en) * | 1982-08-03 | 1984-02-09 | Toshiba Corp | Assembly method for semiconductor |
JPS59232430A (en) * | 1983-06-16 | 1984-12-27 | Nec Corp | Apparatus for manufacturing semiconductor element |
JPS61154041A (en) * | 1984-12-26 | 1986-07-12 | Toshiba Corp | Fabricating apparatus of semiconductor |
JPS61177732A (en) * | 1985-02-01 | 1986-08-09 | Hitachi Ltd | Producer |
JPS6220333A (en) * | 1985-07-19 | 1987-01-28 | Hitachi Ltd | Semiconductor manufacturing equipment |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005026695A (en) * | 2003-07-01 | 2005-01-27 | Samsung Electronics Co Ltd | Manufacturing equipment of inline integrated circuit chip package, and manufacturing method of integrated circuit chip package using the same |
Also Published As
Publication number | Publication date |
---|---|
JP2605725B2 (en) | 1997-04-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |