JPS6441889A - X-ray detect apparatus - Google Patents

X-ray detect apparatus

Info

Publication number
JPS6441889A
JPS6441889A JP19837887A JP19837887A JPS6441889A JP S6441889 A JPS6441889 A JP S6441889A JP 19837887 A JP19837887 A JP 19837887A JP 19837887 A JP19837887 A JP 19837887A JP S6441889 A JPS6441889 A JP S6441889A
Authority
JP
Japan
Prior art keywords
condenser
ray
amplifier
diode
expressed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19837887A
Other languages
Japanese (ja)
Inventor
Satoru Murakami
Yoshinori Yamaguchi
Meihou Hayashi
Yoshihisa Owada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanegafuchi Chemical Industry Co Ltd
Original Assignee
Kanegafuchi Chemical Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanegafuchi Chemical Industry Co Ltd filed Critical Kanegafuchi Chemical Industry Co Ltd
Priority to JP19837887A priority Critical patent/JPS6441889A/en
Priority to US07/299,103 priority patent/US5066861A/en
Publication of JPS6441889A publication Critical patent/JPS6441889A/en
Pending legal-status Critical Current

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  • Measurement Of Radiation (AREA)

Abstract

PURPOSE:To detect X rays with a high response speed and with a low noise level, by detecting an electric charge by a condenser connected to an X-ray detector in series. CONSTITUTION:An X-ray detector is formed with an transparent electrode- membrane 3 formed on a fluorescent layer placed on a base plate 1, and then with a semiconductive layer of p-i-n type 4 and finally with an Al or Cr electrode membrane 5. After a condenser 11 being shortcircuitted by closing a switch 10 temporarily, this switch 12 is opened. When no X-ray comes to a diode 10, an output voltage V00 of an amplifier 15 is expressed as V00=ExC1/(C 1+C2). (E is a voltage of a power supply 14, C1 and C2 are a capacity of condenser 13 and 11, respectively). When an electric current flows into the condenser 11 by X-ray projection to the diode 10, this current is integrated in the condenser 11 and the integral value is charged into the amplifier 15, and then an output voltage V01 of the amplifier 15 is expressed to be V0-1/Cintegral idt, when C=C1/(C1+C2). Thereby, the X-ray detection with low noise level can be accomplished.
JP19837887A 1987-07-22 1987-08-07 X-ray detect apparatus Pending JPS6441889A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP19837887A JPS6441889A (en) 1987-08-07 1987-08-07 X-ray detect apparatus
US07/299,103 US5066861A (en) 1987-07-22 1989-01-19 X ray detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19837887A JPS6441889A (en) 1987-08-07 1987-08-07 X-ray detect apparatus

Publications (1)

Publication Number Publication Date
JPS6441889A true JPS6441889A (en) 1989-02-14

Family

ID=16390122

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19837887A Pending JPS6441889A (en) 1987-07-22 1987-08-07 X-ray detect apparatus

Country Status (1)

Country Link
JP (1) JPS6441889A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009243960A (en) * 2008-03-28 2009-10-22 Fujifilm Corp Radiation image taking device
JP2015172590A (en) * 2010-07-26 2015-10-01 富士フイルム株式会社 radiation detection panel

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009243960A (en) * 2008-03-28 2009-10-22 Fujifilm Corp Radiation image taking device
JP2015172590A (en) * 2010-07-26 2015-10-01 富士フイルム株式会社 radiation detection panel

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