JPS6437867A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS6437867A
JPS6437867A JP62194654A JP19465487A JPS6437867A JP S6437867 A JPS6437867 A JP S6437867A JP 62194654 A JP62194654 A JP 62194654A JP 19465487 A JP19465487 A JP 19465487A JP S6437867 A JPS6437867 A JP S6437867A
Authority
JP
Japan
Prior art keywords
electrodes
thresholds
sections
threshold voltage
gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62194654A
Other languages
Japanese (ja)
Inventor
Kazuyoshi Hirakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP62194654A priority Critical patent/JPS6437867A/en
Publication of JPS6437867A publication Critical patent/JPS6437867A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To bring an alignment margin to zero, and to enable the improvement of the degree of integration by conducting a kind of self-alignment-like ion implantation using a gate electrode. CONSTITUTION:Gate electrodes 103 through a gate oxide film 102 and gate electrodes 107 through a gate oxide film 105 are arranged alternately on an silicon substrate 101, and impurity layers 104 for controlling threshold voltage are formed near the surface of Si only in sections, threshold voltage of which must be fluctuated, in the electrodes 103. There is no ion implanting layer at sections where thresholds are not changed, and there are ion implanting layers at sections where thresholds do not exceed the thresholds of the electrodes 107 among the electrodes 103. There are impurity layers 106 for controlling threshold voltage only at sections, thresholds of which must be altered, under the electrodes 107. Accordingly, the ion implanting impurity layers for controlling threshold voltage are shaped in a self-alignment manner with the gate electrodes.
JP62194654A 1987-08-04 1987-08-04 Semiconductor device Pending JPS6437867A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62194654A JPS6437867A (en) 1987-08-04 1987-08-04 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62194654A JPS6437867A (en) 1987-08-04 1987-08-04 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS6437867A true JPS6437867A (en) 1989-02-08

Family

ID=16328102

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62194654A Pending JPS6437867A (en) 1987-08-04 1987-08-04 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS6437867A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991003837A1 (en) * 1989-09-04 1991-03-21 Kabushiki Kaisha Toshiba Method of producing read-only semiconductor memory
US8438890B2 (en) 2007-04-26 2013-05-14 Goal Co., Ltd. Cylinder lock

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991003837A1 (en) * 1989-09-04 1991-03-21 Kabushiki Kaisha Toshiba Method of producing read-only semiconductor memory
US5094971A (en) * 1989-09-04 1992-03-10 Kabushiki Kaisha Toshiba Method of manufacturing a read only semiconductor memory device
US8438890B2 (en) 2007-04-26 2013-05-14 Goal Co., Ltd. Cylinder lock

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