JPS6436019A - Mask adhesion device and usage of same - Google Patents

Mask adhesion device and usage of same

Info

Publication number
JPS6436019A
JPS6436019A JP19200987A JP19200987A JPS6436019A JP S6436019 A JPS6436019 A JP S6436019A JP 19200987 A JP19200987 A JP 19200987A JP 19200987 A JP19200987 A JP 19200987A JP S6436019 A JPS6436019 A JP S6436019A
Authority
JP
Japan
Prior art keywords
ray mask
flatness
alignment
reinforcement frame
function
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19200987A
Other languages
Japanese (ja)
Other versions
JPH0750670B2 (en
Inventor
Misao Sekimoto
Takashi Okubo
Hideo Yoshihara
Munenori Kanai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP19200987A priority Critical patent/JPH0750670B2/en
Publication of JPS6436019A publication Critical patent/JPS6436019A/en
Publication of JPH0750670B2 publication Critical patent/JPH0750670B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To secure the high flatness, the positional accuracy and the interval accuracy by providing the following: an alignment function or an X-ray mask and a reinforcement frame; a function to measure the flatness of the X-ray mask; a suction function to correct the flatness of the X-ray mask and to hold the X-ray mask. CONSTITUTION:Two or more alignment marks 17 are formed on the rear of the X-ray mask 16; alignment marks 19 corresponding to the marks are formed on a reinforcement frame 18. Then, the X-ray mask 16 is mounted on a suction mechanism 12 of a vacuum chuck system in such a way that a pattern-formed part of an absorber of the X-ray mask 16 is situated on an escape hole 13; it is sucked and held. Then, the flatness of the X-ray mask 16 in a sucked and held state is measured by using a flatness measuring optical system 15 of Fizeau's interference system; while a suction force is adjusted, the high flatness is corrected. Then, the reinforcement frame 18 composed of quartz or the like is mounted on the X-ray mask 16; the mutual alignment marks 17, 19 are detected and aligned by using an alignment optical system 14 such as an optical microscope or the like. Lastly, an epoxy adhesive 20 applied between the masks is solidified.
JP19200987A 1987-07-31 1987-07-31 Mask bonding apparatus and method of using the same Expired - Fee Related JPH0750670B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19200987A JPH0750670B2 (en) 1987-07-31 1987-07-31 Mask bonding apparatus and method of using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19200987A JPH0750670B2 (en) 1987-07-31 1987-07-31 Mask bonding apparatus and method of using the same

Publications (2)

Publication Number Publication Date
JPS6436019A true JPS6436019A (en) 1989-02-07
JPH0750670B2 JPH0750670B2 (en) 1995-05-31

Family

ID=16284086

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19200987A Expired - Fee Related JPH0750670B2 (en) 1987-07-31 1987-07-31 Mask bonding apparatus and method of using the same

Country Status (1)

Country Link
JP (1) JPH0750670B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0453133A2 (en) * 1990-04-12 1991-10-23 Canon Kabushiki Kaisha Method and apparatus for manufacture of X-ray mask
JPH03259509A (en) * 1990-03-09 1991-11-19 Canon Inc Mask structure body for radiation exposure
EP0706210A1 (en) * 1994-09-13 1996-04-10 Hughes Aircraft Company Transparent optical chuck incorporating optical monitoring
US5932045A (en) * 1997-06-02 1999-08-03 Lucent Technologies Inc. Method for fabricating a multilayer optical article
US6212252B1 (en) * 1998-04-01 2001-04-03 Mitsubishi Denki Kabushiki Kaisha X-ray mask provided with an alignment mark and method of manufacturing the same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03259509A (en) * 1990-03-09 1991-11-19 Canon Inc Mask structure body for radiation exposure
EP0453133A2 (en) * 1990-04-12 1991-10-23 Canon Kabushiki Kaisha Method and apparatus for manufacture of X-ray mask
EP0706210A1 (en) * 1994-09-13 1996-04-10 Hughes Aircraft Company Transparent optical chuck incorporating optical monitoring
US5932045A (en) * 1997-06-02 1999-08-03 Lucent Technologies Inc. Method for fabricating a multilayer optical article
US6212252B1 (en) * 1998-04-01 2001-04-03 Mitsubishi Denki Kabushiki Kaisha X-ray mask provided with an alignment mark and method of manufacturing the same

Also Published As

Publication number Publication date
JPH0750670B2 (en) 1995-05-31

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees