JPS643576A - Method for acceleration test of semiconductor integrated circuit - Google Patents
Method for acceleration test of semiconductor integrated circuitInfo
- Publication number
- JPS643576A JPS643576A JP62159334A JP15933487A JPS643576A JP S643576 A JPS643576 A JP S643576A JP 62159334 A JP62159334 A JP 62159334A JP 15933487 A JP15933487 A JP 15933487A JP S643576 A JPS643576 A JP S643576A
- Authority
- JP
- Japan
- Prior art keywords
- ics
- power source
- circuits
- tested
- signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62159334A JP2740167B2 (ja) | 1987-06-25 | 1987-06-25 | 半導体集積回路の加速試験方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62159334A JP2740167B2 (ja) | 1987-06-25 | 1987-06-25 | 半導体集積回路の加速試験方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS643576A true JPS643576A (en) | 1989-01-09 |
JP2740167B2 JP2740167B2 (ja) | 1998-04-15 |
Family
ID=15691555
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62159334A Expired - Fee Related JP2740167B2 (ja) | 1987-06-25 | 1987-06-25 | 半導体集積回路の加速試験方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2740167B2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011145207A (ja) * | 2010-01-15 | 2011-07-28 | Renesas Electronics Corp | 半導体製造検査装置と半導体装置 |
-
1987
- 1987-06-25 JP JP62159334A patent/JP2740167B2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011145207A (ja) * | 2010-01-15 | 2011-07-28 | Renesas Electronics Corp | 半導体製造検査装置と半導体装置 |
Also Published As
Publication number | Publication date |
---|---|
JP2740167B2 (ja) | 1998-04-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313532 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313113 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
LAPS | Cancellation because of no payment of annual fees |