JPS643576A - Method for acceleration test of semiconductor integrated circuit - Google Patents

Method for acceleration test of semiconductor integrated circuit

Info

Publication number
JPS643576A
JPS643576A JP62159334A JP15933487A JPS643576A JP S643576 A JPS643576 A JP S643576A JP 62159334 A JP62159334 A JP 62159334A JP 15933487 A JP15933487 A JP 15933487A JP S643576 A JPS643576 A JP S643576A
Authority
JP
Japan
Prior art keywords
ics
power source
circuits
tested
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62159334A
Other languages
English (en)
Other versions
JP2740167B2 (ja
Inventor
Chihiro Oshita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamaguchi Ltd
Original Assignee
NEC Yamaguchi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamaguchi Ltd filed Critical NEC Yamaguchi Ltd
Priority to JP62159334A priority Critical patent/JP2740167B2/ja
Publication of JPS643576A publication Critical patent/JPS643576A/ja
Application granted granted Critical
Publication of JP2740167B2 publication Critical patent/JP2740167B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP62159334A 1987-06-25 1987-06-25 半導体集積回路の加速試験方法 Expired - Fee Related JP2740167B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62159334A JP2740167B2 (ja) 1987-06-25 1987-06-25 半導体集積回路の加速試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62159334A JP2740167B2 (ja) 1987-06-25 1987-06-25 半導体集積回路の加速試験方法

Publications (2)

Publication Number Publication Date
JPS643576A true JPS643576A (en) 1989-01-09
JP2740167B2 JP2740167B2 (ja) 1998-04-15

Family

ID=15691555

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62159334A Expired - Fee Related JP2740167B2 (ja) 1987-06-25 1987-06-25 半導体集積回路の加速試験方法

Country Status (1)

Country Link
JP (1) JP2740167B2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011145207A (ja) * 2010-01-15 2011-07-28 Renesas Electronics Corp 半導体製造検査装置と半導体装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011145207A (ja) * 2010-01-15 2011-07-28 Renesas Electronics Corp 半導体製造検査装置と半導体装置

Also Published As

Publication number Publication date
JP2740167B2 (ja) 1998-04-15

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