JPS64345U - - Google Patents

Info

Publication number
JPS64345U
JPS64345U JP9436087U JP9436087U JPS64345U JP S64345 U JPS64345 U JP S64345U JP 9436087 U JP9436087 U JP 9436087U JP 9436087 U JP9436087 U JP 9436087U JP S64345 U JPS64345 U JP S64345U
Authority
JP
Japan
Prior art keywords
sequencer
test
circuits
gate array
test mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9436087U
Other languages
Japanese (ja)
Other versions
JPH069516Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9436087U priority Critical patent/JPH069516Y2/en
Publication of JPS64345U publication Critical patent/JPS64345U/ja
Application granted granted Critical
Publication of JPH069516Y2 publication Critical patent/JPH069516Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Landscapes

  • Programmable Controllers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の基本的な構成ブロツク図、第
2図は本考案の一実施例を示す構成ブロツク図、
第3図はその動作波形図、第4図は従来のゲート
アレイの構成概念図、第5図はシーケンサの状態
遷移図である。 1……シーケンサ、2……その他の回路、3…
…テスト用回路、F……フリツプフロツプ。
FIG. 1 is a basic configuration block diagram of the present invention, FIG. 2 is a configuration block diagram showing an embodiment of the present invention,
FIG. 3 is an operational waveform diagram, FIG. 4 is a conceptual diagram of the configuration of a conventional gate array, and FIG. 5 is a state transition diagram of a sequencer. 1...Sequencer, 2...Other circuits, 3...
...Test circuit, F...Flip-flop.

Claims (1)

【実用新案登録請求の範囲】 内部にシーケンサと、その他の回路とを含むゲ
ートアレイであつて、 テストモードの時印加するテスト信号と前記そ
の他の回路へ入力される信号のひとつを入力し、
テストモード時前記シーケンサ内の各フリツプフ
ロツプを当該シーケンサへの入力信号とは関係な
くセツトするテスト用回路を設けたことを特徴と
するゲートアレイ。
[Claims for Utility Model Registration] A gate array including a sequencer and other circuits therein, which inputs a test signal applied in a test mode and one of the signals input to the other circuits,
A gate array characterized in that a test circuit is provided for setting each flip-flop in the sequencer in a test mode regardless of an input signal to the sequencer.
JP9436087U 1987-06-19 1987-06-19 Gate array Expired - Lifetime JPH069516Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9436087U JPH069516Y2 (en) 1987-06-19 1987-06-19 Gate array

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9436087U JPH069516Y2 (en) 1987-06-19 1987-06-19 Gate array

Publications (2)

Publication Number Publication Date
JPS64345U true JPS64345U (en) 1989-01-05
JPH069516Y2 JPH069516Y2 (en) 1994-03-09

Family

ID=30957738

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9436087U Expired - Lifetime JPH069516Y2 (en) 1987-06-19 1987-06-19 Gate array

Country Status (1)

Country Link
JP (1) JPH069516Y2 (en)

Also Published As

Publication number Publication date
JPH069516Y2 (en) 1994-03-09

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