JPS6431959A - Formation of thin compound film - Google Patents

Formation of thin compound film

Info

Publication number
JPS6431959A
JPS6431959A JP18726187A JP18726187A JPS6431959A JP S6431959 A JPS6431959 A JP S6431959A JP 18726187 A JP18726187 A JP 18726187A JP 18726187 A JP18726187 A JP 18726187A JP S6431959 A JPS6431959 A JP S6431959A
Authority
JP
Japan
Prior art keywords
gas
sputtering
compound film
thin compound
active
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18726187A
Other languages
Japanese (ja)
Inventor
Youichi Hirukawa
Machio Dobashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP18726187A priority Critical patent/JPS6431959A/en
Publication of JPS6431959A publication Critical patent/JPS6431959A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To form a thin compound film consisting of metallic target-composing materials and active gas-composing materials to the desired composition with good reproducibility, by monitoring sputtering speed at the time of carrying out sputtering by introducing active gas and inert gas into a vacuum vessel to exert glow discharge. CONSTITUTION:Ar gas is introduced from a mass flow controller 11 into a vacuum vessel 1 and, while holding a pressure at about 5X10<-6>, nitrogen gas is introduced from a mass controller 12, and then, a voltage is impressed on a metallic target 4 by means of a D.C. power source 14 to start sputtering. At this time, the consumption of active gas incorporated into a thin film under sputtering and consumed and sputtering speed detected by means of a spectrometry equipment 16 are monitored, and, according to the composition of the thin compound film to be formed, active-gas consumption and sputtering speed ratio are set up. By this method, the thin compound film of the desired composition having good reproducibility can be formed.
JP18726187A 1987-07-27 1987-07-27 Formation of thin compound film Pending JPS6431959A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18726187A JPS6431959A (en) 1987-07-27 1987-07-27 Formation of thin compound film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18726187A JPS6431959A (en) 1987-07-27 1987-07-27 Formation of thin compound film

Publications (1)

Publication Number Publication Date
JPS6431959A true JPS6431959A (en) 1989-02-02

Family

ID=16202881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18726187A Pending JPS6431959A (en) 1987-07-27 1987-07-27 Formation of thin compound film

Country Status (1)

Country Link
JP (1) JPS6431959A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5283435A (en) * 1991-11-27 1994-02-01 Leybold Aktiengesellschaft Apparatus for determining the concentration of a gas in a vacuum chamber

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54153791A (en) * 1978-05-24 1979-12-04 Gould Inc Method and apparatus for watching and controlling sputtering adhesion
JPS596376A (en) * 1982-06-30 1984-01-13 Anelva Corp Sputtering apparatus
JPS61242631A (en) * 1985-04-20 1986-10-28 Nippon Soken Inc Method and device for producing ultrafine particles of compound

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54153791A (en) * 1978-05-24 1979-12-04 Gould Inc Method and apparatus for watching and controlling sputtering adhesion
JPS596376A (en) * 1982-06-30 1984-01-13 Anelva Corp Sputtering apparatus
JPS61242631A (en) * 1985-04-20 1986-10-28 Nippon Soken Inc Method and device for producing ultrafine particles of compound

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5283435A (en) * 1991-11-27 1994-02-01 Leybold Aktiengesellschaft Apparatus for determining the concentration of a gas in a vacuum chamber

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