JPS6431040A - Method and apparatus for inspecting inferior container - Google Patents

Method and apparatus for inspecting inferior container

Info

Publication number
JPS6431040A
JPS6431040A JP18815587A JP18815587A JPS6431040A JP S6431040 A JPS6431040 A JP S6431040A JP 18815587 A JP18815587 A JP 18815587A JP 18815587 A JP18815587 A JP 18815587A JP S6431040 A JPS6431040 A JP S6431040A
Authority
JP
Japan
Prior art keywords
ampule
projected
light
scorch
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18815587A
Other languages
English (en)
Other versions
JP2591620B2 (ja
Inventor
Yasuo Sonobe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Eisai Co Ltd
Original Assignee
Eisai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eisai Co Ltd filed Critical Eisai Co Ltd
Priority to JP62188155A priority Critical patent/JP2591620B2/ja
Publication of JPS6431040A publication Critical patent/JPS6431040A/ja
Application granted granted Critical
Publication of JP2591620B2 publication Critical patent/JP2591620B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP62188155A 1987-07-28 1987-07-28 不良容器の検査方法及び装置 Expired - Fee Related JP2591620B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62188155A JP2591620B2 (ja) 1987-07-28 1987-07-28 不良容器の検査方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62188155A JP2591620B2 (ja) 1987-07-28 1987-07-28 不良容器の検査方法及び装置

Publications (2)

Publication Number Publication Date
JPS6431040A true JPS6431040A (en) 1989-02-01
JP2591620B2 JP2591620B2 (ja) 1997-03-19

Family

ID=16218716

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62188155A Expired - Fee Related JP2591620B2 (ja) 1987-07-28 1987-07-28 不良容器の検査方法及び装置

Country Status (1)

Country Link
JP (1) JP2591620B2 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0698776A3 (en) * 1994-08-25 1997-05-21 Owens Brockway Glass Container Optical inspection of dimension parameters of containers
KR100429593B1 (ko) * 2000-07-06 2004-05-04 린나이코리아 주식회사 석쇠

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5388751A (en) * 1977-01-14 1978-08-04 Omron Tateisi Electronics Co System for simultaneously detecting ampul and luquid level
JPS5666741A (en) * 1979-11-02 1981-06-05 Hoshitaka Nakamura Automatic inspection device for object
JPS61128144A (ja) * 1984-11-26 1986-06-16 Dai Ichi Seiyaku Co Ltd 溶閉容器の異物検査装置
JPS62191743A (ja) * 1986-02-19 1987-08-22 Hitachi Ltd 針状物品の先端部検査方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5388751A (en) * 1977-01-14 1978-08-04 Omron Tateisi Electronics Co System for simultaneously detecting ampul and luquid level
JPS5666741A (en) * 1979-11-02 1981-06-05 Hoshitaka Nakamura Automatic inspection device for object
JPS61128144A (ja) * 1984-11-26 1986-06-16 Dai Ichi Seiyaku Co Ltd 溶閉容器の異物検査装置
JPS62191743A (ja) * 1986-02-19 1987-08-22 Hitachi Ltd 針状物品の先端部検査方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0698776A3 (en) * 1994-08-25 1997-05-21 Owens Brockway Glass Container Optical inspection of dimension parameters of containers
US5753905A (en) * 1994-08-25 1998-05-19 Owens-Brockway Glass Container Inc. Optical inspection of container finish dimensional parameters
AU695387B2 (en) * 1994-08-25 1998-08-13 Owens-Brockway Glass Container Inc. Optical inspection of container finish dimensional parameters
KR100429593B1 (ko) * 2000-07-06 2004-05-04 린나이코리아 주식회사 석쇠

Also Published As

Publication number Publication date
JP2591620B2 (ja) 1997-03-19

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Legal Events

Date Code Title Description
S111 Request for change of ownership or part of ownership

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R350 Written notification of registration of transfer

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LAPS Cancellation because of no payment of annual fees