JPS56634A - Mtf measuring unit for half-lens - Google Patents
Mtf measuring unit for half-lensInfo
- Publication number
- JPS56634A JPS56634A JP7643579A JP7643579A JPS56634A JP S56634 A JPS56634 A JP S56634A JP 7643579 A JP7643579 A JP 7643579A JP 7643579 A JP7643579 A JP 7643579A JP S56634 A JPS56634 A JP S56634A
- Authority
- JP
- Japan
- Prior art keywords
- lens
- inspected
- chart
- frequency
- mtf
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0292—Testing optical properties of objectives by measuring the optical modulation transfer function
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
PURPOSE:To facilitate measuring operations by arranging a frequency chart and a solid scanning element at a distance of the double of the approximate focal length from an inspected half-lens. CONSTITUTION:Inspected half-lens L is set, and illumination lamp 4 is caused to emit light. When the light from lamp 4 illuminates frequency chart 10 through support plate 5, the euqual-size image of frequency chart 10 and so on is focused onto the light receiving region of corresponding solid scanning element 20 and so on due to the focusing function of lens L; and when element 20 and so on perform self-scanning under this state, a vibratory time series electric signal is obtained according to the space frequency of the chart. This signal is input to operation processing part Op. The electric signal is processed in processing part Op by arithmetic operations which consider two kinds of modulation transfer function MTF and are set previously, thereby calculating MTF of the inspected half-lens.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7643579A JPS56634A (en) | 1979-06-18 | 1979-06-18 | Mtf measuring unit for half-lens |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7643579A JPS56634A (en) | 1979-06-18 | 1979-06-18 | Mtf measuring unit for half-lens |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56634A true JPS56634A (en) | 1981-01-07 |
Family
ID=13605065
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7643579A Pending JPS56634A (en) | 1979-06-18 | 1979-06-18 | Mtf measuring unit for half-lens |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56634A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103454066A (en) * | 2012-06-05 | 2013-12-18 | 深圳市豪恩安全科技有限公司 | Convex lens focal length detecting device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5180110A (en) * | 1975-01-08 | 1976-07-13 | Nippon Electric Co | ccd rainsensaano hoshiki |
-
1979
- 1979-06-18 JP JP7643579A patent/JPS56634A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5180110A (en) * | 1975-01-08 | 1976-07-13 | Nippon Electric Co | ccd rainsensaano hoshiki |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103454066A (en) * | 2012-06-05 | 2013-12-18 | 深圳市豪恩安全科技有限公司 | Convex lens focal length detecting device |
CN103454066B (en) * | 2012-06-05 | 2016-04-06 | 深圳市豪恩安全科技有限公司 | Focal length of convex lens pick-up unit |
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