JPS6423175A - Logic circuit testing machine - Google Patents
Logic circuit testing machineInfo
- Publication number
- JPS6423175A JPS6423175A JP62179533A JP17953387A JPS6423175A JP S6423175 A JPS6423175 A JP S6423175A JP 62179533 A JP62179533 A JP 62179533A JP 17953387 A JP17953387 A JP 17953387A JP S6423175 A JPS6423175 A JP S6423175A
- Authority
- JP
- Japan
- Prior art keywords
- pin
- circuit
- terminal
- substitute
- electronic circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To substitute a faulty pin electronic circuit with a pin electronics circuit for an unused pin, etc., by connecting the pin electronic circuit connected to the input/output pin terminal of an adjacent pin as a substitute in case of the trouble of the pin electronic circuit. CONSTITUTION:A pin electronic circuit 14 connected to a number pin (m-1) is healthy, so a transfer relay 17 is off, and a pin electronic circuit 14' connected to a number pin (m) is faulty, so a break contact RS1 disconnects the input/ output terminal through the operation of relays 17 and 16. At the same time, contacts RS2 and RS3 are made to connect the circuit 14 to be connected to an adjacent number pin (m+1) as a substitute. Further, a circuit 14'' to be connected to a number pin (m+2) as an adjacent unused terminal 15 is connected to the input/output pin terminal 15 of the pin (m+1) as a substitute. Further, the circuit 14 corresponding to the terminal 15 of a number pin (m+2) is healthy, so a relay circuit having the same connection condition with the circuit 14 connected to a pin (m-1) terminal 15 is obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62179533A JPS6423175A (en) | 1987-07-17 | 1987-07-17 | Logic circuit testing machine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62179533A JPS6423175A (en) | 1987-07-17 | 1987-07-17 | Logic circuit testing machine |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6423175A true JPS6423175A (en) | 1989-01-25 |
Family
ID=16067417
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62179533A Pending JPS6423175A (en) | 1987-07-17 | 1987-07-17 | Logic circuit testing machine |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6423175A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07191096A (en) * | 1993-12-27 | 1995-07-28 | Nec Corp | Testing device |
JP2010101771A (en) * | 2008-10-24 | 2010-05-06 | Yokogawa Electric Corp | Semiconductor test apparatus, semiconductor test method, and semiconductor test program |
-
1987
- 1987-07-17 JP JP62179533A patent/JPS6423175A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07191096A (en) * | 1993-12-27 | 1995-07-28 | Nec Corp | Testing device |
JP2010101771A (en) * | 2008-10-24 | 2010-05-06 | Yokogawa Electric Corp | Semiconductor test apparatus, semiconductor test method, and semiconductor test program |
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