JPS5797463A - Testing device for device dielectric strength - Google Patents

Testing device for device dielectric strength

Info

Publication number
JPS5797463A
JPS5797463A JP17426180A JP17426180A JPS5797463A JP S5797463 A JPS5797463 A JP S5797463A JP 17426180 A JP17426180 A JP 17426180A JP 17426180 A JP17426180 A JP 17426180A JP S5797463 A JPS5797463 A JP S5797463A
Authority
JP
Japan
Prior art keywords
cnps
circuit
relay contact
switch
cnp
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17426180A
Other languages
Japanese (ja)
Inventor
Akira Aida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP17426180A priority Critical patent/JPS5797463A/en
Publication of JPS5797463A publication Critical patent/JPS5797463A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Relating To Insulation (AREA)

Abstract

PURPOSE:To simplify circuitry for a test of the dielectric strength of a device, such as a photocoupler, by using a high-voltage relay circuit, which applies a high voltage to an individual compound device, for the selection of a 4-pin or 6- pin device in common. CONSTITUTION:To respective terminals of couples A-F of terminals, one-side terminals of switch circuits (A1-F1)-(A4-F4) are connected, and between the other-side terminals of the A1-F4 and arrayed contact pins (CNP) of contacts 13 and 14, wiring circuits 71-75 are inserted selectively. The switch of the circuit 71 is connected in series to two CNPs. The switch of the circuit 72 is connected directly to two CNPs or to the CNPs through a relay contact. The switch of the circuit 73 is connected to one CNP directly or to two CNPs individually through a relay contact. The switch of the circuit 74 is connected to one CNP directly or to the CNP through a relay contact, and also connected to two CNPs in common through another relay contact. The circuit 75 is connected to two CNPs in common through one relay contact or to two different CNPs in common through another relay contact.
JP17426180A 1980-12-10 1980-12-10 Testing device for device dielectric strength Pending JPS5797463A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17426180A JPS5797463A (en) 1980-12-10 1980-12-10 Testing device for device dielectric strength

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17426180A JPS5797463A (en) 1980-12-10 1980-12-10 Testing device for device dielectric strength

Publications (1)

Publication Number Publication Date
JPS5797463A true JPS5797463A (en) 1982-06-17

Family

ID=15975536

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17426180A Pending JPS5797463A (en) 1980-12-10 1980-12-10 Testing device for device dielectric strength

Country Status (1)

Country Link
JP (1) JPS5797463A (en)

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