JPS6423174A - Testing device for semiconductor device - Google Patents
Testing device for semiconductor deviceInfo
- Publication number
- JPS6423174A JPS6423174A JP18029587A JP18029587A JPS6423174A JP S6423174 A JPS6423174 A JP S6423174A JP 18029587 A JP18029587 A JP 18029587A JP 18029587 A JP18029587 A JP 18029587A JP S6423174 A JPS6423174 A JP S6423174A
- Authority
- JP
- Japan
- Prior art keywords
- contactor
- suspender
- presser
- same time
- lowered
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
PURPOSE:To correct the position of a device with the reaction of a contactor unless the device is accurately positioned, and to obtain uniform contacting pressure by suspending and supporting a mount part by a suspender so that it can be elevated from above the contactor. CONSTITUTION:A semiconductor device 2 is mounted on the mount part 10a of the suspender 10 and a presser 8 is lowered opposite it to clamp the semiconductor device with a specific gap to the mount part 10a. Then the presser 8 of the suspender 10 is lowered at the same time and then its external lead 2a contacts a corresponding contactor 3 in the holder 1. In this state, electric characteristics, etc., are tested and then the presser 8 and suspender 10 are elevated at the same time to release the device 2 from a group of contactors 3 at the same time. Then the lead 2a of the device 2 receives the reaction of the contactor 3 while the device is lowered to correct its position to the center of the contactor group unless the device is accurately positioned, thereby obtaining the uniform contacting pressure.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18029587A JPH0827326B2 (en) | 1987-07-20 | 1987-07-20 | Semiconductor device testing equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18029587A JPH0827326B2 (en) | 1987-07-20 | 1987-07-20 | Semiconductor device testing equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6423174A true JPS6423174A (en) | 1989-01-25 |
JPH0827326B2 JPH0827326B2 (en) | 1996-03-21 |
Family
ID=16080714
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18029587A Expired - Lifetime JPH0827326B2 (en) | 1987-07-20 | 1987-07-20 | Semiconductor device testing equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0827326B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5504436A (en) * | 1993-04-28 | 1996-04-02 | Sony Corporation | Socket apparatus for member testing |
-
1987
- 1987-07-20 JP JP18029587A patent/JPH0827326B2/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5504436A (en) * | 1993-04-28 | 1996-04-02 | Sony Corporation | Socket apparatus for member testing |
Also Published As
Publication number | Publication date |
---|---|
JPH0827326B2 (en) | 1996-03-21 |
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