JPS642214B2 - - Google Patents
Info
- Publication number
- JPS642214B2 JPS642214B2 JP15447781A JP15447781A JPS642214B2 JP S642214 B2 JPS642214 B2 JP S642214B2 JP 15447781 A JP15447781 A JP 15447781A JP 15447781 A JP15447781 A JP 15447781A JP S642214 B2 JPS642214 B2 JP S642214B2
- Authority
- JP
- Japan
- Prior art keywords
- sample surface
- sample
- data
- discharge
- analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000004458 analytical method Methods 0.000 claims description 12
- 238000005259 measurement Methods 0.000 claims description 5
- 238000009826 distribution Methods 0.000 description 8
- 238000004993 emission spectroscopy Methods 0.000 description 3
- 238000012935 Averaging Methods 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000005375 photometry Methods 0.000 description 2
- 238000005204 segregation Methods 0.000 description 2
- 238000011088 calibration curve Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 238000007431 microscopic evaluation Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
Landscapes
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15447781A JPS5855736A (ja) | 1981-09-28 | 1981-09-28 | 発光分光分析による濃度分布解析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15447781A JPS5855736A (ja) | 1981-09-28 | 1981-09-28 | 発光分光分析による濃度分布解析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5855736A JPS5855736A (ja) | 1983-04-02 |
JPS642214B2 true JPS642214B2 (cs) | 1989-01-17 |
Family
ID=15585102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15447781A Granted JPS5855736A (ja) | 1981-09-28 | 1981-09-28 | 発光分光分析による濃度分布解析装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5855736A (cs) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0629857B2 (ja) * | 1986-01-13 | 1994-04-20 | 新日本製鐵株式会社 | 鋼材の表面疵要因判定法 |
JP2722852B2 (ja) * | 1991-04-08 | 1998-03-09 | 住友金属工業株式会社 | 発光分光分析方法及び発光分光分析装置 |
EP1351049A3 (en) * | 2002-04-01 | 2004-02-25 | Central Iron & Steel Research Institute | Analyzer for metal |
FR2838827B3 (fr) * | 2002-04-19 | 2004-04-02 | Central Iron & Steel Res Inst | Methode d'analyse de distribution statistique de position originale pour un metal |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57122351A (en) * | 1981-01-21 | 1982-07-30 | Nippon Steel Corp | Method of spectrochemical analysis wherein continuous light emission is utilized |
-
1981
- 1981-09-28 JP JP15447781A patent/JPS5855736A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5855736A (ja) | 1983-04-02 |
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