JPS641925A - Device for testing light radiating device - Google Patents

Device for testing light radiating device

Info

Publication number
JPS641925A
JPS641925A JP63067976A JP6797688A JPS641925A JP S641925 A JPS641925 A JP S641925A JP 63067976 A JP63067976 A JP 63067976A JP 6797688 A JP6797688 A JP 6797688A JP S641925 A JPS641925 A JP S641925A
Authority
JP
Japan
Prior art keywords
probe
state
light radiating
testing device
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63067976A
Other languages
English (en)
Other versions
JPH011925A (ja
JP2755952B2 (ja
Inventor
Frank J Langley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Genrad Inc
Original Assignee
Genrad Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Genrad Inc filed Critical Genrad Inc
Publication of JPH011925A publication Critical patent/JPH011925A/ja
Publication of JPS641925A publication Critical patent/JPS641925A/ja
Application granted granted Critical
Publication of JP2755952B2 publication Critical patent/JP2755952B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0425—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using optical fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Tests Of Electronic Circuits (AREA)
JP63067976A 1987-03-23 1988-03-22 光放射装置をテストするための装置 Expired - Fee Related JP2755952B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/029,451 US4808815A (en) 1987-03-23 1987-03-23 Apparatus for testing light-emitting devices using probe means having a preselected pattern arrangement
US29451 1987-03-23

Publications (3)

Publication Number Publication Date
JPH011925A JPH011925A (ja) 1989-01-06
JPS641925A true JPS641925A (en) 1989-01-06
JP2755952B2 JP2755952B2 (ja) 1998-05-25

Family

ID=21849069

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63067976A Expired - Fee Related JP2755952B2 (ja) 1987-03-23 1988-03-22 光放射装置をテストするための装置

Country Status (4)

Country Link
US (1) US4808815A (ja)
EP (1) EP0285493B1 (ja)
JP (1) JP2755952B2 (ja)
DE (1) DE3853644T2 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107607850A (zh) * 2017-09-21 2018-01-19 重庆秉为科技有限公司 一种半导体照明产品散热性能检测装置
JP2022097804A (ja) * 2020-12-21 2022-07-01 株式会社日本マイクロニクス 測定システム

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US5134280A (en) * 1990-05-21 1992-07-28 Everett/Charles Contact Products, Inc. Optical fiber test probe having a sleeve-like plunger movable in a barrel
US5317656A (en) * 1991-05-17 1994-05-31 Texas Instruments Incorporated Fiber optic network for multi-point emissivity-compensated semiconductor wafer pyrometry
DE4119109A1 (de) * 1991-06-10 1992-12-17 Grundig Emv Verfahren zum testen von displaybausteinen und anordnung zur durchfuehrung des verfahrens
US5630001A (en) * 1995-05-22 1997-05-13 Motorola Image generator for use in image manifestation apparatus
US5956447A (en) * 1996-05-07 1999-09-21 Univ Central Florida Device and method for image acquisition through multi-mode fiber
GB9824671D0 (en) * 1998-11-11 1999-01-06 Cashmaster Int Ltd Monitoring apparatus
IES20000322A2 (en) * 2000-04-28 2001-11-14 Viveen Ltd Apparatus for testing a light source
US6597195B1 (en) * 2000-07-28 2003-07-22 Labsphere, Inc. Method of and cassette structure for burn-in and life testing of multiple LEDs and the like
DE10048447B4 (de) * 2000-09-29 2006-05-18 Premosys Gmbh Verfahren und Vorrichtung zum Testen von selbstleuchtenden optoelektronischen Komponenten
US6490037B1 (en) * 2000-11-13 2002-12-03 Test Coach Corporation Method and apparatus for verifying a color of an LED in a printed circuit board
US6493077B1 (en) * 2001-07-16 2002-12-10 International Business Machines Corporation Optical test probe for silicon optical bench
US7302382B2 (en) * 2002-02-20 2007-11-27 Xerox Corporation Generating with lexical functional grammars
AUPS261402A0 (en) * 2002-05-28 2002-06-20 Compusign Pty Ltd Array monitoring
US7129722B1 (en) * 2002-10-09 2006-10-31 Cypress Semiconductor Corp. Methods of improving reliability of an electro-optical module
US20040135595A1 (en) * 2002-10-30 2004-07-15 Finisar Corporation Methods, systems, and devices for burn-in testing of optoelectronic devices
US6956226B2 (en) * 2003-01-15 2005-10-18 Hewlett-Packard Development Company, L.P. Light image sensor test of opto-electronics for in-circuit test
US7064832B2 (en) * 2003-02-26 2006-06-20 Delaware Capital Formation, Inc. Color and intensity measuring module for test of light emitting components by automated test equipment
US7023554B2 (en) * 2003-11-14 2006-04-04 Test Coach Corporation Method and apparatus for determining a color and brightness of an LED in a printed circuit board
US7348786B2 (en) * 2004-08-31 2008-03-25 Georgia Tech Research Corporation Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication
US7265822B2 (en) * 2004-10-01 2007-09-04 Test Coach Corporation Method and apparatus for determining presence of a component in a printed circuit board
US20060214089A1 (en) * 2005-03-22 2006-09-28 An Byoung E Method and apparatus for real time output monitoring of light sources and flexible sensitivity adjustment of light sensors
CN100573168C (zh) * 2005-04-21 2009-12-23 鸿富锦精密工业（深圳）有限公司 测试计算机面板发光二极管灯及其连接线的系统及方法
CN101169340B (zh) * 2006-10-27 2010-12-08 鸿富锦精密工业（深圳）有限公司 主板发光二极管检测装置及方法
TWI390194B (zh) * 2006-11-10 2013-03-21 Hon Hai Prec Ind Co Ltd 主機板發光二極體測試裝置及方法
CN101424722B (zh) * 2007-10-31 2011-01-05 鸿富锦精密工业（深圳）有限公司 主板发光二极管测试系统及方法
JP5314634B2 (ja) * 2010-05-17 2013-10-16 株式会社アドバンテスト 試験装置、試験方法、およびデバイスインターフェイス
EP2388605B1 (en) * 2010-05-19 2018-10-17 Feasa Enterprises Limited Testing a light producing element
US7964839B1 (en) 2010-06-11 2011-06-21 Optomistic Products, Inc. Universal LED testing device
US8823406B2 (en) * 2010-10-20 2014-09-02 Cascade Micotech, Inc. Systems and methods for simultaneous optical testing of a plurality of devices under test
KR20120061656A (ko) * 2010-12-03 2012-06-13 삼성엘이디 주식회사 수납용 트레이, 이를 이용한 검사 장치 및 검사 방법
CN102185003B (zh) * 2011-04-15 2013-04-10 复旦大学 一种由隧穿场效应晶体管组成的光探测器及其制造方法
TWM430614U (en) * 2011-12-21 2012-06-01 Youngtek Electronics Corp Fiber optic light guiding top cover structure
TW201329425A (zh) * 2012-01-10 2013-07-16 Askey Technology Jiangsu Ltd 指示燈檢測系統
JP6043246B2 (ja) * 2013-07-11 2016-12-14 株式会社アドバンテスト デバイスインターフェイス装置、試験装置、および試験方法
US10302496B2 (en) 2016-02-09 2019-05-28 Nasa Solutions, Llc Method and apparatus for determining presence and operation of a component in a printed circuit board
AT518369B1 (de) * 2016-02-11 2023-06-15 Zkw Group Gmbh Verfahren und ICT-Einrichtung zum Überprüfen von zumindest zwei LEDs enthaltenden Modulen einer Beleuchtungseinrichtung
GB2547428A (en) 2016-02-16 2017-08-23 Feasa Entpr Ltd Method and apparatus for testing optical outputs
CN110648616B (zh) * 2019-09-29 2023-02-28 云谷（固安）科技有限公司 柔性显示屏检测装置及方法
IT201900025027A1 (it) * 2019-12-20 2021-06-20 Techno Sky S R L Dispositivo per testare luci di terra aeroportuali
CN112378625B (zh) * 2020-11-11 2022-09-16 北方夜视技术股份有限公司 用于电子轰击cmos研究中电子图像分辨力的测试装置及方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62119644U (ja) * 1986-01-23 1987-07-29

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US3215843A (en) * 1961-06-02 1965-11-02 Special Instr Lab Inc Photosensitive light source intensity control system
US3484614A (en) * 1965-10-14 1969-12-16 Brady Co W H Position control method and apparatus
BE671813A (ja) * 1965-11-04 1966-05-04 Merlin Gerin
US3609450A (en) * 1969-02-20 1971-09-28 Lindor Electronics Inc Automatic headlight-washing system
US3681654A (en) * 1971-02-18 1972-08-01 Wagner Electric Corp Light-regulating power supply circuit for gaseous discharge lamp
US3963920A (en) * 1975-03-10 1976-06-15 General Dynamics Corporation Integrated optical-to-electrical signal transducing system and apparatus
JPS5429034Y2 (ja) * 1975-05-01 1979-09-17
US4275294A (en) * 1977-09-28 1981-06-23 Fibun B.V. Security system and strip or strand incorporating fibre-optic wave-guide means therefor
US4234820A (en) * 1979-04-06 1980-11-18 Controlled Environments Systems Light regulation system
DE2939231C2 (de) * 1979-09-27 1983-01-20 Siemens AG, 1000 Berlin und 8000 München Mehrfachstecker zum Anschluß einer Glasfaserleitung an einen opto-elektrischen Baustein
US4427881A (en) * 1981-03-09 1984-01-24 Siemens Corporation Sensor device for measuring a physical parameter
DE3126897A1 (de) * 1981-07-08 1983-06-01 AEG-Telefunken Nachrichtentechnik GmbH, 7150 Backnang Opto-elektrischer tastkopf
FR2512217A1 (fr) * 1981-08-28 1983-03-04 Alsthom Cgee Tete opto-electronique de transmission
SE428061B (sv) * 1981-09-15 1983-05-30 Asea Ab Fiberoptisk metapparatur
US4544843A (en) * 1983-01-28 1985-10-01 Santa Barbara Research Center Radiation detector with built-in test capability
US4699454A (en) * 1984-03-29 1987-10-13 American Telephone And Telegraph Company, At&T Bell Laboratories Fiber optic connector

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62119644U (ja) * 1986-01-23 1987-07-29

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107607850A (zh) * 2017-09-21 2018-01-19 重庆秉为科技有限公司 一种半导体照明产品散热性能检测装置
JP2022097804A (ja) * 2020-12-21 2022-07-01 株式会社日本マイクロニクス 測定システム
US12379398B2 (en) 2020-12-21 2025-08-05 Kabushiki Kaisha Nihon Micronics Measurement system

Also Published As

Publication number Publication date
EP0285493A3 (en) 1990-12-27
DE3853644T2 (de) 1996-01-25
DE3853644D1 (de) 1995-06-01
US4808815A (en) 1989-02-28
JP2755952B2 (ja) 1998-05-25
EP0285493A2 (en) 1988-10-05
EP0285493B1 (en) 1995-04-26

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