JPS6396907A - Automatic punching machine for protective film at semiconductor wafer - Google Patents

Automatic punching machine for protective film at semiconductor wafer

Info

Publication number
JPS6396907A
JPS6396907A JP61242744A JP24274486A JPS6396907A JP S6396907 A JPS6396907 A JP S6396907A JP 61242744 A JP61242744 A JP 61242744A JP 24274486 A JP24274486 A JP 24274486A JP S6396907 A JPS6396907 A JP S6396907A
Authority
JP
Japan
Prior art keywords
protective film
wafer
cylinder
moving plate
semiconductor wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61242744A
Other languages
Japanese (ja)
Other versions
JPH0116012B2 (en
Inventor
Ryoji Wakabayashi
若林 良治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP61242744A priority Critical patent/JPS6396907A/en
Publication of JPS6396907A publication Critical patent/JPS6396907A/en
Publication of JPH0116012B2 publication Critical patent/JPH0116012B2/ja
Granted legal-status Critical Current

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  • Dicing (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To easily punch a protective film along the contour of a wafer by a method wherein the surface of the wafer is set at the level which is slightly higher than that of a protruding cutter and the protective film is attached to the surface of the wafer while the surface of the wafer is set at the level which is slightly lower than that of the cutter. CONSTITUTION:At the position of a shifting plate 1 as shown by a solid line, a semiconductor wafer is dropped into the limited space of a protruding cutter 2 at the shifting plate. Then, by supplying the air to a cylinder 7 in such a way that the shifting plate 1 is shifted to the position directly under guide rolls 12, 13 at a going-up-and-down stage 5 which is at the lifted position, its rod is pulled into the cylinder 7. At this moment, the air is supplied to a cylinder 17, and a piston 18 is lowered so that a wafer W can be lowered to the level where the surface of the wafer W is slightly lower than that of the cutter 2. Then, the air is supplied to a cylinder 8; a piston 9 is lowered; a protective film 16 is pressed to the cutter 2. After the protective film 16 has been punched along the periphery of the wafer W, the stage 5 is raised. Then, the air is blown to the cylinder 7 so that the rod can be shifted from the cylinder 7 to the stop end of the shifting plate 1. At the same time, a rack 14 is shifted in the direction which is opposite to the rod, and the punched part of the film is wound by a collection roller.

Description

【発明の詳細な説明】 童呈上曳肌里分■ 本発明は半導体ウェーへの保護膜の自動打抜き装置に係
るものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an automatic punching device for forming a protective film onto a semiconductor wafer.

l米夏挾青 半導体ウェーハ(0,2〜0.25n+m厚)はそのま
までは脆いので取扱いの際に損壊しないよう半導体ウェ
ーハの底面に台紙、頂面にビニール等の保護膜を付着さ
せる。通常半導体ウェーハよりも大きな保護膜を半導体
ウェーハの頂面に置いて半導体ウェーハの周縁に沿って
保護膜を切り抜いて半導体ウェーハに保護膜を付着させ
ている。従来この半導体ウェーハの周縁に沿っての保護
膜の切り抜きはナイフ等を使用して手作業により行なわ
れていた。手作業によったのは半導体ウェーへの保護膜
を切出し位置に精確に設定することの困難さと、切出し
工具による半導体ウェーハへの衝撃が半導体ウェーへの
破壊を招くからである。
A blue semiconductor wafer (0.2 to 0.25n+m thick) is fragile as it is, so a mount is attached to the bottom of the semiconductor wafer and a protective film such as vinyl is attached to the top to prevent damage during handling. Usually, a protective film larger than the semiconductor wafer is placed on the top surface of the semiconductor wafer, and the protective film is cut out along the periphery of the semiconductor wafer to attach the protective film to the semiconductor wafer. Conventionally, the protective film was cut out along the periphery of the semiconductor wafer by hand using a knife or the like. The reason for the manual operation is that it is difficult to accurately set the protective film on the semiconductor wafer at the cutting position, and the impact on the semiconductor wafer caused by the cutting tool may cause damage to the semiconductor wafer.

日が勺しようとする間 占 本発明の目的は、半導体ウェーハの保護膜を切出し位置
に精確に設定することの困難を回避し、同時に切出し工
具による半導体ウェーハへの衝撃を回避して半導体ウェ
ーハの保護膜を自動的に打抜き、効率よく半導体ウェー
ハに保護膜を被せる装置を提供することにある。
An object of the present invention is to avoid the difficulty of accurately setting the protective film of a semiconductor wafer at the cutting position, and at the same time avoid the impact on the semiconductor wafer by the cutting tool, so that the semiconductor wafer is An object of the present invention is to provide an apparatus that automatically punches out a protective film and efficiently covers a semiconductor wafer with the protective film.

い 占を”2するための  と 上記の目的は本発明に従って、保護膜を付着させる半導
体ウェーハの輪郭と同形でウェーハより大きめの空間を
限定する突出刃を有する移動板を用意する。この移動板
の空間にウェーハを収容しウェーハの上面を突出刃から
僅かに高いレベルに設定する。この状態で保護膜を被せ
ると、保護膜はウェーハの上面に容易に付着する0次に
ウェーハの上面を突出刃から僅かに低いレベルに設定す
ると保護膜はウェーハの周縁から突出刃へと持上がる。
According to the present invention, a movable plate having a protruding blade defining a space larger than the wafer and having the same shape as the outline of a semiconductor wafer to which a protective film is to be attached is prepared. The wafer is housed in the space and the upper surface of the wafer is set at a slightly higher level than the protruding blade.If the protective film is covered in this state, the protective film will easily adhere to the upper surface of the wafer. When set at a level slightly below the blade, the protective film is lifted from the periphery of the wafer to the protruding blade.

この状態で平らな面を使用して上から保護膜を押圧する
と、突出刃よりも低い位置にあるウェーハには衝撃を与
えることなく保護膜をウェーハの輪郭に沿って切抜くこ
とができる。
In this state, if the protective film is pressed from above using a flat surface, the protective film can be cut out along the contour of the wafer without impacting the wafer located at a position lower than the protruding blade.

この目的を達成するため本発明に従って半導体ウェーハ
の保護膜の自動打抜き装置は、保護膜を付着させる半導
体ウェーハの輪郭と同形でウェーハより大きめの空間を
限定する突出刃を有する移動板;半導体ウェーハの上面
を前記の突出刃よりも僅かに低い位置と僅かに高い位置
との間で上下させるウェーハ昇降手段;前記の移動板を
基台面上で間欠的に移動させる移動板駆動装置;前記の
基台面上の移動板の上方に帯状の保護膜を駆動する保護
膜駆動装置; 前記の移動板が一時停止した位置で帯状保護膜を前記の
移動板の突出刃に押しつける押圧装置;及び 帯状保護膜の送りと移動板の間欠移動とを同期させ、移
動板の停止と帯状薄膜の突出刃への押圧とウェーハの下
降とを同期させるよう前記の移動板駆動装置と保護膜駆
動装置と押圧装置とウェーハ昇降手段とを制御する制御
装置を備えている。
To achieve this object, an automatic punching device for a protective film of a semiconductor wafer according to the present invention comprises: a moving plate having a protruding blade defining a space larger than the wafer and having the same shape as the outline of the semiconductor wafer to which the protective film is attached; Wafer lifting means for raising and lowering the upper surface between a slightly lower position and a slightly higher position than the protruding blade; a moving plate driving device for intermittently moving the moving plate on the base surface; A protective film drive device that drives a strip-shaped protective film above the upper movable plate; a pressing device that presses the strip-shaped protective film against the protruding blade of the movable plate at the position where the movable plate is temporarily stopped; The above-mentioned moving plate driving device, protective film driving device, pressing device, and wafer lifting device are used to synchronize the feeding and the intermittent movement of the moving plate, and to synchronize the stopping of the moving plate, the pressing of the band-shaped thin film against the protruding blade, and the lowering of the wafer. and a control device for controlling the means.

本発明の実施例を以下に添付図面を参照して詳細に説明
する。
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

ス」1殊 第1ないし第3図を参照して第1の実施例を説明する。1 special A first embodiment will be described with reference to FIGS. 1 to 3.

第1図において、土は移動板、2は突出刃、3はこの突
出刃が限定する半導体ウェーハの輪郭と同形で、ウェー
ハより大きめの空間である。第2図は第1図の移動板の
断面を示し、Wは突出刃2の限定空間に収容した半導体
ウェーハ、17はシリンダ、18はピストンでウェハの
昇降手段を構成する。16は帯状保護膜を示す。突出刃
2の先端が両方から刃をつけているのは、保護膜を反覆
して打抜いていると片刃の場合は間もな(刃が内側へ曲
がってきて保護膜の打抜きや、ウェーハの出し入れに支
障をきたすことになるからである。
In FIG. 1, soil is a moving plate, 2 is a protruding blade, and 3 is a space defined by this protruding blade that has the same shape as the outline of a semiconductor wafer and is larger than the wafer. FIG. 2 shows a cross section of the movable plate shown in FIG. 1, where W is a semiconductor wafer accommodated in the limited space of the protruding blade 2, 17 is a cylinder, and 18 is a piston, which constitutes means for lifting and lowering the wafer. 16 indicates a belt-shaped protective film. The reason why the tip of the protruding blade 2 has blades on both sides is that if the protective film is repeatedly punched, it will not be long if the blade is single-edged (the blade will bend inward and the protective film will be punched out or the wafer will be cut out). This is because it will cause problems in loading and unloading.

第3図を参照する。iは昇降台、6は基台、7は移動板
上を基台面上で間欠的に移動させる移動板駆動装置であ
って、シリンダとこのシリンダからのび移動板上の縁面
へ固定されたピストンロッードとから成る。8はシリン
ダであり、9はそのシリンダからのびるピストンであっ
て移動板が一時停止した位置で帯状保護膜16を移動板
の突出刃2に押しつける押圧装置を構成している。10
.11は帯状保護膜を巻いているローラで、ローラ10
は保護膜を送り出す供給ロールであり、ローラ15は打
抜いた後の保護膜を取込む回収ローラである。12.1
3はウェーハ保護膜16を圧着するガイドローラである
0回収ローラ11はピニオン15を有しこのピニオンは
昇降台5の上昇位置でラック14と係合し、このラック
14は移動板駆動袋W7の動作と同期して回収ローラを
回動させて帯状保護膜16の打抜き部分を回収しガイド
ローラ12.13の間に新しい保護膜を配置する。
See Figure 3. i is a lifting platform, 6 is a base, and 7 is a movable plate drive device that moves the movable plate intermittently on the base surface, which includes a cylinder and a piston rod extending from the cylinder and fixed to the edge surface of the movable plate. It consists of 8 is a cylinder, and 9 is a piston extending from the cylinder, which constitutes a pressing device that presses the band-shaped protective film 16 against the protruding blade 2 of the movable plate at the position where the movable plate is temporarily stopped. 10
.. 11 is a roller wrapped with a band-shaped protective film; roller 10;
is a supply roll that sends out the protective film, and roller 15 is a collection roller that takes in the protective film after being punched out. 12.1
3 is a guide roller that presses the wafer protective film 16.0 The collection roller 11 has a pinion 15, which engages with a rack 14 at the raised position of the lifting table 5, and this rack 14 is connected to the movable plate driving bag W7. The collecting roller is rotated in synchronization with the operation to collect the punched out portion of the band-shaped protective film 16, and a new protective film is placed between the guide rollers 12, 13.

動作を説明する。第3図の移動板上の実線の位置で半導
体ウェーハを移動板の突出刃2の限定空間に落ち込む、
このとき半導体ウェーハWの上面は突出刃2よりも僅か
に低(なっている。次に上昇位置にある昇降金工のガイ
ドロール12.13の直下に移動板1を移動させるよう
シリンダ7に空気を送ってそのロンドをシリンダ7に引
込む。
Explain the operation. The semiconductor wafer is dropped into the limited space of the protruding blade 2 of the moving plate at the position indicated by the solid line on the moving plate in FIG.
At this time, the upper surface of the semiconductor wafer W is slightly lower than the protruding blade 2.Next, air is supplied to the cylinder 7 to move the movable plate 1 directly below the guide rolls 12 and 13 of the lifting metalwork in the raised position. and pull the rondo into cylinder 7.

このとき移動板1はウェーハ昇降手段17.18の直上
にある。シリンダ17に空気を送ってピストン18によ
りウェーハWを突出刃よりも僅かに高く押し上げる。昇
降台上を下降させて保護膜16を突出刃2とその中のウ
ェーハWの上からかぶせる(第2A図)。
At this time, the moving plate 1 is located directly above the wafer lifting means 17, 18. Air is sent to the cylinder 17 and the piston 18 pushes up the wafer W slightly higher than the protruding blade. The elevating table is lowered to cover the protruding blade 2 and the wafer W therein with the protective film 16 (FIG. 2A).

次にシリンダ17に空気を送り、ピストン18を下降さ
せ、ウェーハWの上面が突出刃2よりも僅かに低いレベ
ルヘウエーハWを下降させる(第2B図)。
Next, air is sent to the cylinder 17 and the piston 18 is lowered to lower the wafer W to a level where the upper surface of the wafer W is slightly lower than the protruding blade 2 (FIG. 2B).

シリンダ8に空気を送り、ピストンを下降させて保護膜
16を突出刃2に押し付けてウェーハの周囲に沿って保
護膜を切断し、昇降台上を上昇させる。この状態でラッ
ク14とピニオン15とは係合する。シリンダ7に空気
を送ってロンドをシリンダ7から繰り出して移動板上を
前方の休止端まで押出す。これと同時にラック14もシ
リンダ7のロンドとは逆方向に動いて回収ロール11を
時計方向に回転させ、打抜いた膜部分を回収ローラ11
へ巻取る。保護膜を付着したウェーハを取除き、次に保
護膜を付着しようとするウェーハを突出刃の中へ落し込
む。以後は上述のプロセスを繰返す。
Air is sent to the cylinder 8, the piston is lowered, the protective film 16 is pressed against the protruding blade 2, the protective film is cut along the periphery of the wafer, and the wafer is raised on the lifting table. In this state, the rack 14 and pinion 15 are engaged. Air is sent to the cylinder 7 to let out the rondo from the cylinder 7 and push it out on the movable plate to the forward resting end. At the same time, the rack 14 also moves in the opposite direction to the cylinder 7, rotates the collecting roll 11 clockwise, and the punched film portion is transferred to the collecting roller 11.
Wind it up. The wafer to which the protective film is attached is removed, and then the wafer to which the protective film is to be attached is dropped into the protruding blade. Thereafter, repeat the above process.

第4図は第2の実施例を示す。第1の実施例と共通の構
成要素には同じ参照番号と付し、その説明は省略する。
FIG. 4 shows a second embodiment. Components common to those in the first embodiment are given the same reference numerals, and their explanations will be omitted.

第1の実施例との相違は、第1の実施例は半導体ウェー
ハを1個づ\被膜していくのに対して第2の実施例は半
導体ウェーハを連続的に被膜していくことにある。この
ため連続処理しようとする数の半導体ウェーハと同数の
移動板上を一直線上につき合わせて配置するだけの長さ
の基台6を備え、この基台6の一端にシリンダ7とピス
トンとを配置し、ピストンの衝程を移動板の長さに等し
くしている。−線上に列んだ移動板はピストンの往復動
に応じて保護膜を打抜き付着させたウェーハを運ぶ移動
板をガイドローラ13の外へ押し出し、ピストン9の直
下に保護膜をかぶせた移動板を設定する。
The difference from the first embodiment is that in the first embodiment, semiconductor wafers are coated one by one, whereas in the second embodiment, semiconductor wafers are coated continuously. . For this purpose, a base 6 is provided that is long enough to arrange the same number of semiconductor wafers to be continuously processed on a moving plate in a straight line, and a cylinder 7 and a piston are placed at one end of this base 6. The stroke of the piston is made equal to the length of the moving plate. - The movable plates arranged in a line push out the movable plate carrying the wafer with the protective film punched and attached to the outside of the guide roller 13 according to the reciprocating motion of the piston, and the movable plate covered with the protective film is placed directly under the piston 9. Set.

第4図で7b、8b、17bはそれぞれシリンダ7.8
.17への空気供給を制御する電磁弁であり、19はこ
れらの電磁弁の切替動作を制御するカム機構である。動
作を説明する。加圧空気は電磁弁7bの下側ポートから
シリンダ7へ送られ、このシリンダのピストンはシリン
ダ7から操り出されて移動板1をその長さに相当する距
離だけ送り出す、移動板1はピストン9の直下、ピスト
ン18の直上まで進み、停止する。次に加圧空気は電磁
弁17bの下側ボートからシリンダ17に送られてピス
トン18を繰出してウェーハWの上面と保護膜16とを
接着させる(第2A図)。次にカム19は電磁弁17b
を付勢して流路を切替え、加圧空気は電磁弁17の上側
ポートからシリンダ17へ加えられてピストン18を繰
込み、ウェーハWの上面を突出刃2よりも僅かに下げる
(第2B図)0次に、加圧空気は電磁弁8bの下側ボー
トからシリンダ8に空気を送りピストン9を繰り出して
、突出刃2の周りで保護膜を打抜く。カム19は電磁弁
8bのスイッチを閉じて通路を切替え、加圧空気は電磁
弁8bの上側ポートからシリンダ8へ送られ、ピストン
9を移動板1から離す。
In Figure 4, 7b, 8b, and 17b are cylinders 7.8, respectively.
.. 17 is a solenoid valve that controls the air supply, and 19 is a cam mechanism that controls the switching operation of these solenoid valves. Explain the operation. Pressurized air is sent from the lower port of the solenoid valve 7b to the cylinder 7, the piston of which is steered out of the cylinder 7 and moves the moving plate 1 by a distance corresponding to its length. It advances to just below the piston 18 and stops. Next, pressurized air is sent from the lower boat of the solenoid valve 17b to the cylinder 17, and the piston 18 is fed out to bond the upper surface of the wafer W to the protective film 16 (FIG. 2A). Next, the cam 19 is operated by the solenoid valve 17b.
is energized to switch the flow path, pressurized air is applied from the upper port of the solenoid valve 17 to the cylinder 17, retracts the piston 18, and lowers the upper surface of the wafer W slightly below the protruding blade 2 (Fig. 2B). ) Next, the pressurized air is sent from the lower boat of the solenoid valve 8b to the cylinder 8 to advance the piston 9 and punch out the protective film around the protruding blade 2. The cam 19 closes the switch of the solenoid valve 8b to switch the passage, and pressurized air is sent from the upper port of the solenoid valve 8b to the cylinder 8 to move the piston 9 away from the moving plate 1.

カム19は電磁弁7bのスイッチを閉じ、流路を切替え
て上側ボートから加圧空気をシリンダ7へ送り、ピスト
ンを繰込む。その後に生じた空間へ次の移動板上を設定
する。以後このプロセスを繰返す。
The cam 19 closes the switch of the solenoid valve 7b, switches the flow path, sends pressurized air from the upper boat to the cylinder 7, and retracts the piston. Then set up the next moving board in the space created. Repeat this process thereafter.

ウェーハ昇降手段としてはシリンダとピストンを使用し
たが、移動板の底を閉じて中央に小さい空気の噴出口を
設け、下から加圧空気を送ってウェーハWを突出刃2内
の空間で上下動させるようにしてもよい。
A cylinder and a piston were used to raise and lower the wafer, but by closing the bottom of the movable plate and providing a small air outlet in the center, pressurized air is sent from below to move the wafer W up and down in the space inside the protruding blade 2. You may also do so.

発明の効果 本発明によりウェーハに保護膜を付着する際のウェーハ
の位置決めは極めて容易となり、自動打抜き装置を現実
的価格で実現することができ、効率よくウェーハに保護
膜を接着することができる。
Effects of the Invention According to the present invention, positioning of a wafer when attaching a protective film to a wafer becomes extremely easy, an automatic punching device can be realized at a practical cost, and a protective film can be efficiently adhered to a wafer.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は移動板の斜視図である。 第2図は移動板とウェーハ昇降手段との作動関係を示す
図で、第2A図はウェーハを高いレベルに移して保護膜
を付着させている状態を示し、第2B図はウェーハを低
いレベルに移して保護膜を打抜く用意ができた状態を示
す。 第3図は本発明の第1の実施例を示す略図である。 第4図は本発明の第2の実施例を示す略図である。 図中: 1・・・移動板 2・・・突出刃 3・・・突出刃が限定する空間 5・・・昇降台 6・・・基台 7.8.17・・・シリンダ 9.18・・・ピストン 10・・・供給ローラ 11・・・回収ローラ 12.13・・・ガイドローラ 14・・・ラック 15・・・ピニオン 16・・・保護膜 19・・・カム
FIG. 1 is a perspective view of the moving plate. Fig. 2 is a diagram showing the operational relationship between the moving plate and the wafer lifting means, Fig. 2A shows the wafer being moved to a higher level and a protective film is attached, and Fig. 2B shows the wafer being moved to a lower level. This shows the state in which the protective film is ready to be transferred and punched out. FIG. 3 is a schematic diagram showing a first embodiment of the invention. FIG. 4 is a schematic diagram showing a second embodiment of the invention. In the diagram: 1... Moving plate 2... Protruding blade 3... Space limited by the protruding blade 5... Elevating table 6... Base 7.8.17... Cylinder 9.18. ... Piston 10 ... Supply roller 11 ... Collection roller 12.13 ... Guide roller 14 ... Rack 15 ... Pinion 16 ... Protective film 19 ... Cam

Claims (1)

【特許請求の範囲】 保護膜を付着させる半導体ウェーハの輪郭と同形でウェ
ーハより大きめの空間を限定する突出刃を有する移動板
; 半導体ウェーハの上面を前記の突出刃よりも僅かに低い
位置と僅かに高い位置との間で上下させるウェーハ昇降
手段; 前記の移動板を基台面上で間欠的に移動させる移動板駆
動装置; 前記の基台面上の移動板の上方に帯状の保護膜を駆動す
る保護膜駆動装置; 前記の移動板が一時停止した位置で帯状保護膜を前記の
移動板の突出刃に押しつける押圧装置;及び 帯状保護膜の送りと移動板の間欠移動とを同期させ、移
動板の停止と帯状薄膜の突出刃への押圧とウェーハの下
降とを同期させるよう前記の移動板駆動装置と保護膜駆
動装置と押圧装置とウェーハ昇降手段とを制御する制御
装置 を備えたことを特徴とする半導体ウェーハの保護膜の自
動打抜き装置。
[Claims] A moving plate having a protruding blade that defines a space larger than the wafer and having the same shape as the outline of a semiconductor wafer to which a protective film is to be attached; a moving plate driving device that moves the moving plate intermittently on the base surface; driving a strip-shaped protective film above the moving plate on the base surface; a protective film drive device; a pressing device that presses the strip-shaped protective film against the protruding blade of the movable plate at the position where the movable plate is temporarily stopped; It is characterized by comprising a control device that controls the moving plate driving device, the protective film driving device, the pressing device, and the wafer lifting means so as to synchronize the stopping, the pressing of the band-shaped thin film against the protruding blade, and the lowering of the wafer. Automatic punching equipment for protective film on semiconductor wafers.
JP61242744A 1986-10-13 1986-10-13 Automatic punching machine for protective film at semiconductor wafer Granted JPS6396907A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61242744A JPS6396907A (en) 1986-10-13 1986-10-13 Automatic punching machine for protective film at semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61242744A JPS6396907A (en) 1986-10-13 1986-10-13 Automatic punching machine for protective film at semiconductor wafer

Publications (2)

Publication Number Publication Date
JPS6396907A true JPS6396907A (en) 1988-04-27
JPH0116012B2 JPH0116012B2 (en) 1989-03-22

Family

ID=17093611

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61242744A Granted JPS6396907A (en) 1986-10-13 1986-10-13 Automatic punching machine for protective film at semiconductor wafer

Country Status (1)

Country Link
JP (1) JPS6396907A (en)

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JP2009123784A (en) * 2007-11-12 2009-06-04 Denso Corp Tape sticking device and tape sticking method
JP2009212173A (en) * 2008-03-03 2009-09-17 Csun Mfg Ltd Wafer film cutting apparatus
KR100918485B1 (en) 2009-03-10 2009-09-24 김중섭 Tape attaching unit
JP2011035174A (en) * 2009-08-01 2011-02-17 Masaki Ura Device and method for sticking sheet
JP2011091118A (en) * 2009-10-20 2011-05-06 Csun Mfg Ltd Wafer laminate dicing saw
CN102189736A (en) * 2010-02-03 2011-09-21 志圣工业股份有限公司 Film cutting mechanism for wafer film laminator
CN107200301A (en) * 2017-05-23 2017-09-26 中国科学院微电子研究所 Pad pasting aligning device of MEMS wafer

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Publication number Priority date Publication date Assignee Title
JP2010080838A (en) * 2008-09-29 2010-04-08 Lintec Corp Sheet pasting device and sheet pasting method

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6852241B2 (en) 2001-08-14 2005-02-08 Lexmark International, Inc. Method for making ink jet printheads
JP2009123784A (en) * 2007-11-12 2009-06-04 Denso Corp Tape sticking device and tape sticking method
JP2009212173A (en) * 2008-03-03 2009-09-17 Csun Mfg Ltd Wafer film cutting apparatus
KR100918485B1 (en) 2009-03-10 2009-09-24 김중섭 Tape attaching unit
JP2011035174A (en) * 2009-08-01 2011-02-17 Masaki Ura Device and method for sticking sheet
JP2011091118A (en) * 2009-10-20 2011-05-06 Csun Mfg Ltd Wafer laminate dicing saw
CN102189736A (en) * 2010-02-03 2011-09-21 志圣工业股份有限公司 Film cutting mechanism for wafer film laminator
CN107200301A (en) * 2017-05-23 2017-09-26 中国科学院微电子研究所 Pad pasting aligning device of MEMS wafer

Also Published As

Publication number Publication date
JPH0116012B2 (en) 1989-03-22

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