JPS6390837U - - Google Patents
Info
- Publication number
- JPS6390837U JPS6390837U JP18653886U JP18653886U JPS6390837U JP S6390837 U JPS6390837 U JP S6390837U JP 18653886 U JP18653886 U JP 18653886U JP 18653886 U JP18653886 U JP 18653886U JP S6390837 U JPS6390837 U JP S6390837U
- Authority
- JP
- Japan
- Prior art keywords
- ring
- sleeve fixing
- shaped sleeve
- fixing members
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 11
- 239000011159 matrix material Substances 0.000 claims 4
- 239000011148 porous material Substances 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18653886U JPH0341467Y2 (enExample) | 1986-12-03 | 1986-12-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18653886U JPH0341467Y2 (enExample) | 1986-12-03 | 1986-12-03 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6390837U true JPS6390837U (enExample) | 1988-06-13 |
| JPH0341467Y2 JPH0341467Y2 (enExample) | 1991-08-30 |
Family
ID=31136181
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18653886U Expired JPH0341467Y2 (enExample) | 1986-12-03 | 1986-12-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0341467Y2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63178327U (enExample) * | 1987-05-11 | 1988-11-18 |
-
1986
- 1986-12-03 JP JP18653886U patent/JPH0341467Y2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63178327U (enExample) * | 1987-05-11 | 1988-11-18 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0341467Y2 (enExample) | 1991-08-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI451093B (zh) | 多重偏移晶粒頭 | |
| US4523144A (en) | Complex probe card for testing a semiconductor wafer | |
| US7629804B2 (en) | Probe head assembly for use in testing multiple wafer die | |
| US20040113640A1 (en) | Apparatus and method for limiting over travel in a probe card assembly | |
| JPS6011170A (ja) | 座屈はりテスト・プロ−ブ組立体 | |
| JPS6390837U (enExample) | ||
| JPH0267644U (enExample) | ||
| USH663H (en) | High density probe head for chip testing | |
| JPS59762Y2 (ja) | プロ−ブカ−ド | |
| JPH03205842A (ja) | プローブカード装置 | |
| JPS5991735U (ja) | 半導体ウエ−ハ移し替え装置 | |
| JPH073833B2 (ja) | プローブ装置 | |
| JPS6244052A (ja) | 扁平コイルの実装方法 | |
| JP2555716Y2 (ja) | テストヘッド | |
| JPH058681Y2 (enExample) | ||
| JPS6449310U (enExample) | ||
| JPS6259846U (enExample) | ||
| JPH0316905U (enExample) | ||
| JPS60118765U (ja) | プロ−ブカ−ド | |
| JPS6359332U (enExample) | ||
| JPS6329538A (ja) | プロ−ブ装置 | |
| JPH0513559A (ja) | ウエハ挿入用アダプタ | |
| JPH0171676U (enExample) | ||
| JPS6336042U (enExample) | ||
| JPS62153647U (enExample) |