JPS6381745A - 走査型トンネル顕微鏡の探針走査機構 - Google Patents
走査型トンネル顕微鏡の探針走査機構Info
- Publication number
- JPS6381745A JPS6381745A JP22628686A JP22628686A JPS6381745A JP S6381745 A JPS6381745 A JP S6381745A JP 22628686 A JP22628686 A JP 22628686A JP 22628686 A JP22628686 A JP 22628686A JP S6381745 A JPS6381745 A JP S6381745A
- Authority
- JP
- Japan
- Prior art keywords
- piezoelectric element
- probe
- movable block
- scanning
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22628686A JPS6381745A (ja) | 1986-09-26 | 1986-09-26 | 走査型トンネル顕微鏡の探針走査機構 |
| US07/101,233 US4798989A (en) | 1986-09-26 | 1987-09-24 | Scanning tunneling microscope installed in electron microscope |
| DE19873732426 DE3732426A1 (de) | 1986-09-26 | 1987-09-25 | In ein elektronenmikroskop eingebautes rastertunnelmikroskop |
| GB8722573A GB2197752B (en) | 1986-09-26 | 1987-09-25 | Prove moving mechanism |
| GB9014054A GB2232294B (en) | 1986-09-26 | 1990-06-25 | Scanning electron microscope. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22628686A JPS6381745A (ja) | 1986-09-26 | 1986-09-26 | 走査型トンネル顕微鏡の探針走査機構 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6381745A true JPS6381745A (ja) | 1988-04-12 |
| JPH0529243B2 JPH0529243B2 (enExample) | 1993-04-28 |
Family
ID=16842832
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22628686A Granted JPS6381745A (ja) | 1986-09-26 | 1986-09-26 | 走査型トンネル顕微鏡の探針走査機構 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6381745A (enExample) |
-
1986
- 1986-09-26 JP JP22628686A patent/JPS6381745A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0529243B2 (enExample) | 1993-04-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4798989A (en) | Scanning tunneling microscope installed in electron microscope | |
| US5015850A (en) | Microfabricated microscope assembly | |
| US6861649B2 (en) | Balanced momentum probe holder | |
| JPH0212381B2 (enExample) | ||
| JP2534442B2 (ja) | 二重たわみ部材キャリッジ及び二重たわみ部材組立体 | |
| JP2010508502A (ja) | 走査プローブ顕微鏡用プローブアセンブリ | |
| US5075548A (en) | Tunnel current probe moving mechanism having parallel cantilevers | |
| JPS6381745A (ja) | 走査型トンネル顕微鏡の探針走査機構 | |
| Olfat et al. | A single-chip scanning probe microscope array | |
| JP3892184B2 (ja) | 走査型プローブ顕微鏡 | |
| JPS63153405A (ja) | 走査型トンネル顕微鏡 | |
| KR101151136B1 (ko) | 주사탐침현미경용 스캐너 | |
| JPH07181030A (ja) | 原子間力顕微鏡 | |
| JPH0625642B2 (ja) | 走査型トンネル顕微鏡装置 | |
| JPH0544723Y2 (enExample) | ||
| JP3536193B2 (ja) | 走査型プローブ顕微鏡 | |
| JPH01287403A (ja) | 走査型トンネル顕微鏡 | |
| JPH07134133A (ja) | 走査型プローブ顕微鏡 | |
| JPH034102A (ja) | 走査型トンネル顕微鏡 | |
| JPH04179043A (ja) | 位置決め装置 | |
| RU2181212C2 (ru) | Способ перемещения зонда сканирующего микроскопа-нанолитографа в поле грубого x-y позиционера | |
| JP2691460B2 (ja) | トンネル電流検出装置 | |
| JPH04556B2 (enExample) | ||
| Petersen et al. | Large AFM scans with a nanometer coordinate measuring machine (NCMM) | |
| JP3512259B2 (ja) | 走査型プローブ顕微鏡 |