JPS6364721B2 - - Google Patents

Info

Publication number
JPS6364721B2
JPS6364721B2 JP57029621A JP2962182A JPS6364721B2 JP S6364721 B2 JPS6364721 B2 JP S6364721B2 JP 57029621 A JP57029621 A JP 57029621A JP 2962182 A JP2962182 A JP 2962182A JP S6364721 B2 JPS6364721 B2 JP S6364721B2
Authority
JP
Japan
Prior art keywords
image sensor
interference fringes
address
flatness
counter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57029621A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58146806A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2962182A priority Critical patent/JPS58146806A/ja
Priority to US06/449,733 priority patent/US4627733A/en
Priority to DE19823247238 priority patent/DE3247238A1/de
Publication of JPS58146806A publication Critical patent/JPS58146806A/ja
Publication of JPS6364721B2 publication Critical patent/JPS6364721B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Supporting Of Heads In Record-Carrier Devices (AREA)
JP2962182A 1981-12-25 1982-02-24 平面度測定装置 Granted JPS58146806A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2962182A JPS58146806A (ja) 1982-02-24 1982-02-24 平面度測定装置
US06/449,733 US4627733A (en) 1981-12-25 1982-12-14 Flatness measuring apparatus
DE19823247238 DE3247238A1 (de) 1981-12-25 1982-12-21 Ebenheitsmessgeraet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2962182A JPS58146806A (ja) 1982-02-24 1982-02-24 平面度測定装置

Publications (2)

Publication Number Publication Date
JPS58146806A JPS58146806A (ja) 1983-09-01
JPS6364721B2 true JPS6364721B2 (de) 1988-12-13

Family

ID=12281152

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2962182A Granted JPS58146806A (ja) 1981-12-25 1982-02-24 平面度測定装置

Country Status (1)

Country Link
JP (1) JPS58146806A (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0781846B2 (ja) * 1985-01-09 1995-09-06 株式会社東芝 パタ−ンエッジ測定方法および装置
JPH0591293U (ja) * 1992-05-19 1993-12-14 勝造商事株式会社 育苗トレイ

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS632446A (ja) * 1986-06-20 1988-01-07 Matsushita Electric Ind Co Ltd Dpsk変調デ−タの復調回路

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS632446A (ja) * 1986-06-20 1988-01-07 Matsushita Electric Ind Co Ltd Dpsk変調デ−タの復調回路

Also Published As

Publication number Publication date
JPS58146806A (ja) 1983-09-01

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