JPS635682B2 - - Google Patents

Info

Publication number
JPS635682B2
JPS635682B2 JP57052649A JP5264982A JPS635682B2 JP S635682 B2 JPS635682 B2 JP S635682B2 JP 57052649 A JP57052649 A JP 57052649A JP 5264982 A JP5264982 A JP 5264982A JP S635682 B2 JPS635682 B2 JP S635682B2
Authority
JP
Japan
Prior art keywords
wavelength
interference fringe
refractive index
light
atmosphere
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57052649A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58169004A (ja
Inventor
Koichi Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP57052649A priority Critical patent/JPS58169004A/ja
Publication of JPS58169004A publication Critical patent/JPS58169004A/ja
Publication of JPS635682B2 publication Critical patent/JPS635682B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02007—Two or more frequencies or sources used for interferometric measurement

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP57052649A 1982-03-31 1982-03-31 大気中での高精度干渉測長法 Granted JPS58169004A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57052649A JPS58169004A (ja) 1982-03-31 1982-03-31 大気中での高精度干渉測長法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57052649A JPS58169004A (ja) 1982-03-31 1982-03-31 大気中での高精度干渉測長法

Publications (2)

Publication Number Publication Date
JPS58169004A JPS58169004A (ja) 1983-10-05
JPS635682B2 true JPS635682B2 (US06265458-20010724-C00056.png) 1988-02-04

Family

ID=12920692

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57052649A Granted JPS58169004A (ja) 1982-03-31 1982-03-31 大気中での高精度干渉測長法

Country Status (1)

Country Link
JP (1) JPS58169004A (US06265458-20010724-C00056.png)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004286575A (ja) * 2003-03-20 2004-10-14 National Institute Of Advanced Industrial & Technology 光学材料の群屈折率精密計測方法及び装置
JP2007114206A (ja) * 2006-11-30 2007-05-10 National Institute Of Advanced Industrial & Technology 光学材料の群屈折率精密計測方法
CN102032950A (zh) * 2010-10-15 2011-04-27 中国科学院安徽光学精密机械研究所 一种通过白日观测恒星测量整层大气相干长度的方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0743243B2 (ja) * 1985-04-25 1995-05-15 工業技術院長 干渉計における位相差検出方法
JPH0711406B2 (ja) * 1985-08-03 1995-02-08 株式会社ニコン 高精度干渉計装置
JPH0198902A (ja) * 1987-10-12 1989-04-17 Res Dev Corp Of Japan 光波干渉測長装置
JPH01210803A (ja) * 1988-02-19 1989-08-24 Kitamura Mach Co Ltd レーザ測長方法
JPH0820235B2 (ja) * 1991-04-26 1996-03-04 新技術事業団 真直度測定装置
US5825493A (en) * 1996-06-28 1998-10-20 Raytheon Company Compact high resolution interferometer with short stroke reactionless drive
CN1304879C (zh) * 2005-06-23 2007-03-14 哈尔滨工业大学 基于光程倍增补偿方法的二维光电自准直装置和测量方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004286575A (ja) * 2003-03-20 2004-10-14 National Institute Of Advanced Industrial & Technology 光学材料の群屈折率精密計測方法及び装置
JP2007114206A (ja) * 2006-11-30 2007-05-10 National Institute Of Advanced Industrial & Technology 光学材料の群屈折率精密計測方法
CN102032950A (zh) * 2010-10-15 2011-04-27 中国科学院安徽光学精密机械研究所 一种通过白日观测恒星测量整层大气相干长度的方法

Also Published As

Publication number Publication date
JPS58169004A (ja) 1983-10-05

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