JPS6355653B2 - - Google Patents

Info

Publication number
JPS6355653B2
JPS6355653B2 JP9832781A JP9832781A JPS6355653B2 JP S6355653 B2 JPS6355653 B2 JP S6355653B2 JP 9832781 A JP9832781 A JP 9832781A JP 9832781 A JP9832781 A JP 9832781A JP S6355653 B2 JPS6355653 B2 JP S6355653B2
Authority
JP
Japan
Prior art keywords
output
cylindrical object
detection circuit
flaw
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9832781A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58743A (ja
Inventor
Kunihiko Edamatsu
Kazue Shimizu
Tetsuji Kawasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP9832781A priority Critical patent/JPS58743A/ja
Publication of JPS58743A publication Critical patent/JPS58743A/ja
Publication of JPS6355653B2 publication Critical patent/JPS6355653B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP9832781A 1981-06-26 1981-06-26 傷検査装置 Granted JPS58743A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9832781A JPS58743A (ja) 1981-06-26 1981-06-26 傷検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9832781A JPS58743A (ja) 1981-06-26 1981-06-26 傷検査装置

Publications (2)

Publication Number Publication Date
JPS58743A JPS58743A (ja) 1983-01-05
JPS6355653B2 true JPS6355653B2 (enrdf_load_stackoverflow) 1988-11-04

Family

ID=14216803

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9832781A Granted JPS58743A (ja) 1981-06-26 1981-06-26 傷検査装置

Country Status (1)

Country Link
JP (1) JPS58743A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59226974A (ja) * 1983-06-09 1984-12-20 Fuji Electric Co Ltd 外観検査装置

Also Published As

Publication number Publication date
JPS58743A (ja) 1983-01-05

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