JPS6355642B2 - - Google Patents
Info
- Publication number
- JPS6355642B2 JPS6355642B2 JP17902481A JP17902481A JPS6355642B2 JP S6355642 B2 JPS6355642 B2 JP S6355642B2 JP 17902481 A JP17902481 A JP 17902481A JP 17902481 A JP17902481 A JP 17902481A JP S6355642 B2 JPS6355642 B2 JP S6355642B2
- Authority
- JP
- Japan
- Prior art keywords
- axis
- light
- coordinate
- deflection
- edge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 101
- 238000001514 detection method Methods 0.000 claims description 81
- 238000005070 sampling Methods 0.000 claims description 68
- 230000007246 mechanism Effects 0.000 claims description 34
- 238000003384 imaging method Methods 0.000 claims description 15
- 230000008859 change Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 description 24
- 230000006870 function Effects 0.000 description 17
- 238000000034 method Methods 0.000 description 11
- 238000012545 processing Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 7
- 239000000523 sample Substances 0.000 description 6
- 238000007796 conventional method Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 206010047571 Visual impairment Diseases 0.000 description 3
- 206010027146 Melanoderma Diseases 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 239000004927 clay Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000004441 surface measurement Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Measurement Of Optical Distance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17902481A JPS5880510A (ja) | 1981-11-10 | 1981-11-10 | 稜線座標自動測定用の稜頂点検出装置および稜線座標測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17902481A JPS5880510A (ja) | 1981-11-10 | 1981-11-10 | 稜線座標自動測定用の稜頂点検出装置および稜線座標測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5880510A JPS5880510A (ja) | 1983-05-14 |
| JPS6355642B2 true JPS6355642B2 (enrdf_load_stackoverflow) | 1988-11-04 |
Family
ID=16058774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17902481A Granted JPS5880510A (ja) | 1981-11-10 | 1981-11-10 | 稜線座標自動測定用の稜頂点検出装置および稜線座標測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5880510A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0319450A (ja) * | 1989-06-15 | 1991-01-28 | Nec Corp | マルチポイント通信方式 |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0612252B2 (ja) * | 1984-03-21 | 1994-02-16 | 友彦 芥田 | 三次元形状の自動測定方法 |
| IT1184935B (it) * | 1984-03-29 | 1987-10-28 | Mitsubishi Electric Corp | Sistema per rilevare coordinate tridimensionali con l impiego di un elaboratore |
| JPS6186606A (ja) * | 1984-10-05 | 1986-05-02 | Hitachi Ltd | 非接触形状測定方法 |
| JPH0812044B2 (ja) * | 1986-09-10 | 1996-02-07 | 株式会社東海理化電機製作所 | テープ端座標測定方法およびその装置 |
| JPH02186213A (ja) * | 1989-01-12 | 1990-07-20 | Matsushita Electric Works Ltd | 形状検出装置 |
-
1981
- 1981-11-10 JP JP17902481A patent/JPS5880510A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0319450A (ja) * | 1989-06-15 | 1991-01-28 | Nec Corp | マルチポイント通信方式 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5880510A (ja) | 1983-05-14 |
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