JPS634941B2 - - Google Patents
Info
- Publication number
- JPS634941B2 JPS634941B2 JP57026124A JP2612482A JPS634941B2 JP S634941 B2 JPS634941 B2 JP S634941B2 JP 57026124 A JP57026124 A JP 57026124A JP 2612482 A JP2612482 A JP 2612482A JP S634941 B2 JPS634941 B2 JP S634941B2
- Authority
- JP
- Japan
- Prior art keywords
- silicon wafer
- solder
- solder foil
- silicon
- separated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910000679 solder Inorganic materials 0.000 claims abstract description 42
- 239000004065 semiconductor Substances 0.000 claims abstract description 26
- 239000011888 foil Substances 0.000 claims abstract description 22
- 239000008188 pellet Substances 0.000 claims abstract description 20
- 238000000034 method Methods 0.000 claims description 12
- 238000004519 manufacturing process Methods 0.000 claims description 8
- 239000002184 metal Substances 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 claims description 5
- 239000000155 melt Substances 0.000 claims description 2
- 238000010309 melting process Methods 0.000 claims 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 34
- 229910052710 silicon Inorganic materials 0.000 abstract description 34
- 239000010703 silicon Substances 0.000 abstract description 34
- 238000002844 melting Methods 0.000 abstract description 10
- 230000008018 melting Effects 0.000 abstract description 10
- 239000011521 glass Substances 0.000 abstract description 8
- 238000005520 cutting process Methods 0.000 abstract description 7
- 229910052759 nickel Inorganic materials 0.000 abstract description 4
- 230000001681 protective effect Effects 0.000 abstract description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 239000010419 fine particle Substances 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000005530 etching Methods 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 230000004927 fusion Effects 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000005453 pelletization Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/33—Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01024—Chromium [Cr]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Die Bonding (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57026124A JPS58143553A (ja) | 1982-02-22 | 1982-02-22 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57026124A JPS58143553A (ja) | 1982-02-22 | 1982-02-22 | 半導体装置の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58143553A JPS58143553A (ja) | 1983-08-26 |
JPS634941B2 true JPS634941B2 (enrdf_load_stackoverflow) | 1988-02-01 |
Family
ID=12184811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57026124A Granted JPS58143553A (ja) | 1982-02-22 | 1982-02-22 | 半導体装置の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58143553A (enrdf_load_stackoverflow) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100514075B1 (ko) * | 1998-12-04 | 2005-11-25 | 삼성전자주식회사 | 레이저 빔을 이용한 기판용 및 액정표시기 패널용절단 장치 |
US6562698B2 (en) * | 1999-06-08 | 2003-05-13 | Kulicke & Soffa Investments, Inc. | Dual laser cutting of wafers |
US7772090B2 (en) * | 2003-09-30 | 2010-08-10 | Intel Corporation | Methods for laser scribing wafers |
JP2006269897A (ja) * | 2005-03-25 | 2006-10-05 | Disco Abrasive Syst Ltd | ウエーハのレーザー加工方法 |
DE102011075328A1 (de) * | 2011-05-05 | 2012-11-08 | Interpane Entwicklungs-Und Beratungsgesellschaft Mbh | Vorrichtung und Verfahren zum Randentschichten und Kerben beschichteter Substrate |
NL2026427B1 (en) | 2019-09-10 | 2021-10-13 | Tokyo Seimitsu Co Ltd | Laser machining apparatus |
CN117840614B (zh) * | 2024-03-07 | 2024-05-07 | 南京航空航天大学 | 基于纳米焊丝浅层熔覆的多波长激光改性焊接装置及方法 |
-
1982
- 1982-02-22 JP JP57026124A patent/JPS58143553A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58143553A (ja) | 1983-08-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5290986A (en) | Thermally assisted shorts removal process for glass ceramic product using an RF field | |
JP3129728B2 (ja) | 薄膜半導体装置 | |
JP5342772B2 (ja) | 加工対象物切断方法 | |
US4404453A (en) | Laser bonding of microelectronic circuits | |
US9302410B2 (en) | Method for cutting object to be processed | |
US3672047A (en) | Method for bonding a conductive wire to a metal electrode | |
US20120104066A1 (en) | Method for cutting processing target | |
JP2003188294A (ja) | 電子部品の製造方法 | |
JPS634941B2 (enrdf_load_stackoverflow) | ||
JP3509985B2 (ja) | 半導体デバイスのチップ分離方法 | |
JPS634940B2 (enrdf_load_stackoverflow) | ||
JPH08264819A (ja) | 半導体装置及び該製造方法 | |
JP4572984B2 (ja) | レーザ溶接構造およびレーザ溶接方法 | |
EP0040669B1 (fr) | Procédé d'élimination des plots de soudure demeurant sur un substrat céramique après retrait d'une microplaquette semi-conductrice, par absorption dans un bloc de cuivre poreux et application au retravaillage des modules | |
JPH0252425B2 (enrdf_load_stackoverflow) | ||
JPH01209736A (ja) | 半導体素子の交換方法 | |
JPS5919356A (ja) | 半導体装置の製造方法 | |
JPS603134A (ja) | ワイヤボンデイング方法 | |
JPS6240119B2 (enrdf_load_stackoverflow) | ||
JP3636128B2 (ja) | 半導体モジュールの製造方法 | |
JPH0729942A (ja) | 電子装置のリペア方法 | |
JP5351267B2 (ja) | 半導体部品、半導体ウェハ部品、半導体部品の製造方法、及び、接合構造体の製造方法 | |
JPH01309360A (ja) | 銀ろう付リードピンの製造方法 | |
JP2970636B2 (ja) | 光半導体モジュール及びその製造方法 | |
JPH07273133A (ja) | 半導体装置の製造方法 |