JPS634616A - Steam treating unit - Google Patents

Steam treating unit

Info

Publication number
JPS634616A
JPS634616A JP14697486A JP14697486A JPS634616A JP S634616 A JPS634616 A JP S634616A JP 14697486 A JP14697486 A JP 14697486A JP 14697486 A JP14697486 A JP 14697486A JP S634616 A JPS634616 A JP S634616A
Authority
JP
Japan
Prior art keywords
steam
processing
filter
treating
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14697486A
Other languages
Japanese (ja)
Inventor
Kazuaki Mizogami
員章 溝上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Renesas Eastern Japan Semiconductor Inc
Original Assignee
Hitachi Tokyo Electronics Co Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Tokyo Electronics Co Ltd, Hitachi Ltd filed Critical Hitachi Tokyo Electronics Co Ltd
Priority to JP14697486A priority Critical patent/JPS634616A/en
Publication of JPS634616A publication Critical patent/JPS634616A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To reliaze highly reliable steam drying, by providing a steam feed channel which as a filter inserted therein and communicates between a steam generating section and a drying section, and providing the filter with a heating means. CONSTITUTION:A filter mechanism 13 inserted in a steam feed tube 11 is provided with a heater 15 so that a filter body 14 is heated constantly at a predetermined temperature. Treating steam 7 passing through the filter mechanism 13 is thereby prevented from being liquefied and a large amount of treating steam 7 can be supplied quickly into a treating tank 4. Further, the efficiency of the steam drying operation can be improved. Still further, by providing the filter mechanism 13 midway on the steam feed tube 11, foreign substances are prevented from entering into the treating chamber 4 together with the treating steam 7 and the steam drying can be performed in a reliable manner.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、処理技術に適用して特に有効な技術に関する
もので、たとえば、半導体装置の製造における半導体ウ
ェハの蒸気処理に利用して有効な技術に関するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a technology that is particularly effective when applied to processing technology, for example, a technology that is particularly effective when applied to steam processing of semiconductor wafers in the manufacture of semiconductor devices. It's about technology.

〔従来の技術〕[Conventional technology]

半導体ウェハの蒸気乾燥処理については、たとえば特開
昭56−16807号公報に記載されており、その概要
は有機溶剤の蒸気雰囲気中に半導体ウェハを浸漬させて
、該半導体ウェハの表面に付着した水滴等を除去するこ
とにより半導体ウェハの表面乾燥を達成しようとするも
のである。
Steam drying treatment for semiconductor wafers is described, for example, in Japanese Patent Laid-Open No. 16807/1983, and the outline is that a semiconductor wafer is immersed in a vapor atmosphere of an organic solvent, and water droplets attached to the surface of the semiconductor wafer are dried. The aim is to dry the surface of the semiconductor wafer by removing such substances.

本発明者は、前記のような蒸気処理技術について検討し
た。以下は、公知とされた技術ではないが、本発明者に
よって検討された技術であり、その概要は次の通りであ
る。
The present inventor studied the steam treatment technology as described above. Although the following is not a publicly known technique, it is a technique studied by the present inventor, and its outline is as follows.

すなわち、前記のような構造の蒸気乾燥装置では、有機
溶剤等の溶液を底部に貯留して、その上方で蒸気処理を
行う、いわゆる蒸気発生部と処理部とが一体構造となっ
たものが知られている。しかし、このような−体構造の
処理装置では被処理物の導入の際等に処理槽内の蒸気量
が急速に減少し、所定値までの1気量の回復に長時間の
時間経過が必要となる。
In other words, in the steam drying apparatus having the above-mentioned structure, a solution such as an organic solvent is stored at the bottom and steam treatment is performed above the solution, which is a so-called integrated structure of a steam generation section and a processing section. It is being However, in processing equipment with such a body structure, the amount of steam in the processing tank decreases rapidly when the material to be processed is introduced, and it takes a long time to recover one volume to the specified value. becomes.

そのため、蒸気発生部と処理部とを分離して、蒸気発生
部により生成された蒸気を搬送路を介して処理部に移送
し、短時間で大量の処理蒸気を処理部に供給する装置構
造が考えられる。
Therefore, the device structure is such that the steam generation section and the processing section are separated, the steam generated by the steam generation section is transferred to the processing section via a conveyance path, and a large amount of processed steam is supplied to the processing section in a short time. Conceivable.

ところで、このように処理部と蒸気発生部とを分離した
装置構造では、処理部への処理蒸気の供給制御を行うた
めに、移送路の途中部分に処理蒸気の供給量を制御する
制御パルプを介設することが知られているが、この制御
パルプの開閉動作により発塵し、発塵物質が処理蒸気中
に混入されたまま処理部に移送されるおそれがある。こ
のような点から、移送路の途中部分にフィルターを介装
して、処理蒸気中の異物の除去を行うことが考えられる
By the way, in the device structure in which the processing section and the steam generation section are separated in this way, in order to control the supply of processing steam to the processing section, a control pulp that controls the supply amount of processing steam is installed in the middle of the transfer path. However, there is a risk that dust may be generated due to the opening and closing operations of the control pulp, and the dust-generating substances may be transferred to the processing section while being mixed in the processing steam. From this point of view, it is conceivable to insert a filter in the middle of the transfer path to remove foreign substances from the treated steam.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかし、このように移送路の途中部分にフィルターを介
装した場合、移送されてきた処理蒸気が該フィルターの
部分で液化してしまい、蒸気の状態で処理部にまで到達
し得ない場合の多いことが本発明者によって明らかにさ
れた。
However, when a filter is inserted in the middle of the transfer path in this way, the transferred processed vapor often liquefies at the filter and cannot reach the processing section in vapor form. This was revealed by the inventor.

本発明は、上記問題点に着目してなされたものであり、
その目的は蒸気処理の信頼性を向上させることのできる
技術を提供することにある。
The present invention has been made focusing on the above problems,
The purpose is to provide a technique that can improve the reliability of steam processing.

本発明の前記ならびにその他の目的と新規な特徴は、本
明細書の記述および添付図面から明らかになるであろう
The above and other objects and novel features of the present invention will become apparent from the description of this specification and the accompanying drawings.

〔問題点を解決するための手段〕[Means for solving problems]

本願において開示される発明のうち代表的なものの概要
を節単に説明すれば、次の通りである。
A brief summary of typical inventions disclosed in this application is as follows.

すなわち、蒸気発生部と処理部とを連通ずる蒸気移送路
にフィルターを介設し、少なくとも該フィルターに加熱
手段を設けたものである。
That is, a filter is interposed in the steam transfer path that communicates the steam generation section and the processing section, and at least the filter is provided with heating means.

〔作用〕[Effect]

上記した手段によれば、フィルター内を所定の加熱状態
で維持しておくことができるため、処理蒸気がフィルタ
ーを通過する際に液化されることを防止でき、処理部に
清浄かつ十分な蒸気量を供給することができる。
According to the above-mentioned means, the inside of the filter can be maintained at a predetermined heating state, so it is possible to prevent the processing steam from being liquefied when passing through the filter, and to provide a clean and sufficient amount of steam to the processing section. can be supplied.

〔実施例1〕 第1図は本発明の一実施例である蒸気処理装置を示す概
略説明図である。
[Example 1] FIG. 1 is a schematic explanatory diagram showing a steam treatment apparatus that is an example of the present invention.

本実施例1の蒸気処理装置1は、たとえば半導体ウェハ
2(被処理物)の表面乾燥を行う蒸気乾燥装置であり、
蒸気発生部である蒸気発生槽3と処理部である処理槽4
とを有している。
The steam processing apparatus 1 of the first embodiment is, for example, a steam drying apparatus for drying the surface of a semiconductor wafer 2 (workpiece),
A steam generation tank 3 which is a steam generation section and a processing tank 4 which is a processing section
It has

蒸気発生槽3の内部には、たとえばイソプロピルアルコ
ール(IPA)等の有Ia溶剤等の処理液5が貯留され
、該蒸気発生槽3の下部に設けられたヒータ6によって
加熱されて処理蒸気7が発生される構造となっている。
A processing liquid 5 such as a la solvent such as isopropyl alcohol (IPA) is stored inside the steam generation tank 3, and is heated by a heater 6 provided at the bottom of the steam generation tank 3 to generate processing steam 7. The structure is generated.

一方、処理槽4はその内部に被処理物である半導体ウェ
ハ2が位置されるようになっており、この処理槽4の内
部は前記処理槽4の外側面近傍に設けられたヒータ8に
より常に所定温度、たとえば存機溶剤が蒸気状態を維持
できる82℃以上の温度となるように制御されている。
On the other hand, the processing tank 4 is configured such that the semiconductor wafer 2 as the object to be processed is placed inside the processing tank 4, and the interior of the processing tank 4 is constantly kept by a heater 8 provided near the outer surface of the processing tank 4. The temperature is controlled to be a predetermined temperature, for example, 82° C. or higher at which the existing solvent can maintain its vapor state.

半導体ウェハ2は図示しない治具等に収容された状態で
前記処理槽4の内外を移送される構造となっている。ま
た、処理槽4の内底部には廃液管9が接続されており、
半導体ウェハ2から処理槽4の底部に滴下された処理廃
液10が外部に排出される構造となっている。
The semiconductor wafer 2 is transported in and out of the processing tank 4 while being housed in a jig or the like (not shown). Furthermore, a waste liquid pipe 9 is connected to the inner bottom of the processing tank 4.
The structure is such that the processing waste liquid 10 dropped from the semiconductor wafer 2 to the bottom of the processing tank 4 is discharged to the outside.

蒸気発生槽3と処理槽4とは蒸気移送路としての蒸気移
送管11により連通されており、蒸気発生槽3からの処
理蒸気7が該蒸気移送管11を経て処理槽4に供給され
る構造となっている。蒸気移送管11の途中部分で蒸気
発生槽3寄りの部分には制御パルプ12が介設されてお
り、処理蒸気7の供給制御が行われる構造となっている
The steam generation tank 3 and the processing tank 4 are connected by a steam transfer pipe 11 as a steam transfer path, and the processing steam 7 from the steam generation tank 3 is supplied to the processing tank 4 through the steam transfer pipe 11. It becomes. A control pulp 12 is interposed in a midway portion of the steam transfer pipe 11 near the steam generation tank 3, so that the supply of the treated steam 7 is controlled.

蒸気移送管11の処理槽4寄りの部分にはフィルター機
構13が取付けられている。このフィルター機構13は
、その中央部分に蒸気移送管11を遮るように設けられ
た多孔質材からなるフィルター本体14と、このフィル
ター本体14を挟持するようにフィルター本体14の周
囲に設けられたヒータ15とが断熱材16により外部と
遮断された構造を有しており、ヒーター15の作用によ
り、フィルター本体14内は少な(とも処理蒸気7が蒸
気の状態を維持できる温度、たとえば82℃程度となる
ように制御されている。
A filter mechanism 13 is attached to a portion of the steam transfer pipe 11 near the processing tank 4. This filter mechanism 13 includes a filter body 14 made of a porous material provided in the central portion so as to block the steam transfer pipe 11, and a heater provided around the filter body 14 so as to sandwich the filter body 14. 15 is isolated from the outside by a heat insulating material 16, and due to the action of the heater 15, the inside of the filter body 14 is kept at a low temperature (at which the treated steam 7 can maintain its vapor state, for example, about 82°C). It is controlled to become.

次に、本実施例の作用について説明する。Next, the operation of this embodiment will be explained.

まず、蒸気発生槽3の内部に貯留された有機溶剤等の処
理液5がヒーター6によって加熱され沸点、たとえば8
2℃程度に達すると蒸気発生槽3の内部が処理蒸気7の
雰囲気で満たされる。
First, a processing liquid 5 such as an organic solvent stored inside the steam generation tank 3 is heated by a heater 6 to reach a boiling point of, for example, 8.
When the temperature reaches about 2° C., the inside of the steam generation tank 3 is filled with an atmosphere of the treated steam 7.

次に、処理槽4の内部に図示しない治具に収容された状
態の半導体ウェハ2が移送されると’iritmバルブ
12が開かれ、蒸気移送管11′に処理蒸気7が供給さ
れていく、ここで、制御バルブ12の作動による発塵に
ともない、微小異物が処理蒸気7内に混入される場合が
あるが、このような微小異物は、処理蒸気7がフィルタ
ー機構13を通過する際に処理蒸気7中から除去される
Next, when the semiconductor wafer 2 housed in a jig (not shown) is transferred into the processing tank 4, the 'iritm valve 12 is opened, and processing steam 7 is supplied to the steam transfer pipe 11'. Here, due to dust generation due to the operation of the control valve 12 , minute foreign matter may be mixed into the treated steam 7 , but such minute foreign matter is removed when the treated steam 7 passes through the filter mechanism 13 . It is removed from the steam 7.

ここで、フィルター機構13を通過する際に処、理蒸気
7が凝縮して液化してしまうことも考えられるが、本実
施例1によればヒーター15のはたらきにより、フィル
ター本体14の内部は処理液5である有機溶剤の沸点よ
りも高い温度となるように維持されているため、このフ
ィルター本体14を通過する際に有w1溶剤の処理蒸気
7は液化することなく、清浄化された蒸気の状態で処理
槽4内に順次供給される。
Here, it is possible that the processing steam 7 condenses and liquefies when passing through the filter mechanism 13, but according to the first embodiment, the inside of the filter body 14 is processed by the function of the heater 15. Since the temperature is maintained at a temperature higher than the boiling point of the organic solvent that is the liquid 5, the treated vapor 7 containing the w1 solvent does not liquefy when passing through the filter body 14, but instead becomes the purified vapor. They are sequentially supplied into the processing tank 4 in this state.

処理槽4内において、有機溶剤の処理蒸気7は常温状態
の半導体ウェハ2と接触すると、半導体ウェハ2の表面
に凝縮して液化する。ここで、半導体ウェハ2の表面に
付着していた水滴等は、前記有m溶剤の液滴に溶解・分
解されて処理槽4の底部に落下除去され、廃液管9を経
て外部に排出される。この現象が、半導体ウェハ2と周
囲の処理蒸気7の雰囲気とがほぼ等しい温度になるまで
繰り返されることによって、半導体ウェハ2の表面が所
定の乾燥状態となる。
In the processing tank 4, when the processing vapor 7 of the organic solvent comes into contact with the semiconductor wafer 2 at room temperature, it condenses on the surface of the semiconductor wafer 2 and liquefies. Here, water droplets and the like adhering to the surface of the semiconductor wafer 2 are dissolved and decomposed into droplets of the aforesaid solvent, fall to the bottom of the processing tank 4, and are removed, and are discharged to the outside via the waste liquid pipe 9. . This phenomenon is repeated until the temperature of the semiconductor wafer 2 and the surrounding atmosphere of the processing steam 7 reach approximately the same temperature, thereby bringing the surface of the semiconductor wafer 2 into a predetermined dry state.

このように、本実施例によれば以下の効果を得ることが
できる。
As described above, according to this embodiment, the following effects can be obtained.

+11.@気移送管11に介設されたフィルター機構1
3にヒータ15を備え、フィルター本体14を常に所定
の加熱状態にしておくことにより、フィルター機構13
を通過する際の処理蒸気7の液化を防止でき、処理槽4
内に大量の処理蒸気7を急速に供給することができる。
+11. @Filter mechanism 1 installed in pneumatic transfer pipe 11
3 is equipped with a heater 15 to keep the filter body 14 in a predetermined heated state at all times, so that the filter mechanism 13
It is possible to prevent the processing steam 7 from liquefying when passing through the processing tank 4.
A large amount of processing steam 7 can be rapidly supplied within the chamber.

(2)、前記+11により、蒸気乾燥処理の効率を向上
させることができる。
(2) The above +11 can improve the efficiency of the steam drying process.

(3)、蒸気移送管11にフィルター機構13を設ける
ことにより、処理蒸気7とともに異物が処理槽4内に混
入されることを防止でき、信頼性の高い蒸気乾燥処理を
実現できる。
(3) By providing the filter mechanism 13 in the steam transfer pipe 11, it is possible to prevent foreign matter from being mixed into the processing tank 4 together with the processing steam 7, and a highly reliable steam drying process can be realized.

〔実施例2〕 第2図は本発明の他の実施例である蒸気乾燥装置に適用
されるフィルター機構を示す概略斜視図である。
[Embodiment 2] FIG. 2 is a schematic perspective view showing a filter mechanism applied to a steam drying apparatus according to another embodiment of the present invention.

本実施例2のフィルター機構21は、蒸気移送管11に
対して垂直方向に設けられる一対の板状ヒータ23a、
23bと、この板状ヒータ23a。
The filter mechanism 21 of the second embodiment includes a pair of plate heaters 23a provided perpendicularly to the steam transfer pipe 11;
23b, and this plate-shaped heater 23a.

23bにより挟持される薄板状のフィルター24とから
なる。板状ヒータ23aにはそれぞれ複数個の孔25が
開設されており、各孔25はその途中部分でフィルター
24により遮られる構造となっている。
It consists of a thin plate-like filter 24 held between two parts 23b. A plurality of holes 25 are formed in each of the plate heaters 23a, and each hole 25 is blocked by a filter 24 in the middle thereof.

したがって、本実施例2では、1気移送管11の中を通
って送られてきた処理蒸気7は板状ヒータ23a、23
bの孔25内を通過する際にフィルター24の作用によ
り異物が除去されるようになっている。
Therefore, in the second embodiment, the processing steam 7 sent through the one-gas transfer pipe 11 is transferred to the plate heaters 23a, 23.
When passing through the hole 25 of b, foreign matter is removed by the action of the filter 24.

このように、本実施例2によれば簡易なフィルター構造
で処理蒸気7の液化を防止できる。またフィルター24
の交換も容易に行うことが可能となる。
In this manner, according to the second embodiment, liquefaction of the treated vapor 7 can be prevented with a simple filter structure. Also filter 24
can be easily replaced.

〔実施例3〕 第3図は本発明の他の実施例である蒸気乾燥装置に適用
されるフィルター機構を示す概略断面図である。
[Embodiment 3] FIG. 3 is a schematic sectional view showing a filter mechanism applied to a steam drying apparatus according to another embodiment of the present invention.

本実施例3では、フィルター機構31は蒸気移送管11
の所定内部に充填された多孔質材からなるフィルター本
体14と、該フィルター本体14を貫通して配管される
加熱管32とからなる。
In this third embodiment, the filter mechanism 31 is the vapor transfer pipe 11.
It consists of a filter body 14 made of a porous material filled in a predetermined interior of the filter body 14, and a heating pipe 32 that is piped through the filter body 14.

加熱管32には、たとえば加熱水蒸気あるいは高温水等
の加熱流体33が循環される構造となっており、これに
よりフィルター本体14が有機溶剤の沸点以上の温度を
維持できる構造となっている。
The heating tube 32 has a structure in which a heating fluid 33 such as heated steam or high-temperature water is circulated, so that the filter body 14 can maintain a temperature equal to or higher than the boiling point of the organic solvent.

このように、本実施例3では電気的なヒータを用いずに
、加熱管32内に加熱流体33を循環させる構造である
ため、有a溶剤への引火の危険性がなく、安全性の高い
処理蒸気7の加熱を実現できる。また、その結果として
、フィルター本体14の内部に直接加熱管32を配管す
ることが可能となり、フィルター本体14内での処理蒸
気7の液化をより完全に防止できる。
In this way, in the third embodiment, the heating fluid 33 is circulated within the heating tube 32 without using an electric heater, so there is no risk of ignition of the aqueous solvent, and the system is highly safe. Heating of the processing steam 7 can be achieved. Moreover, as a result, it becomes possible to directly install the heating pipe 32 inside the filter body 14, and liquefaction of the treated steam 7 within the filter body 14 can be more completely prevented.

以上本発明者によってなされた発明を実施例に基づき具
体的に説明したが、本発明は前記実施例に限定されるも
のではなく、その要旨を逸脱しない範囲で種々変更可能
であることはいうまでもない、たとえば、加熱手段につ
いては電気ヒータあるいは加熱管を用いるものについて
のみ説明したが、これに限らず、たとえばランプヒータ
等地の加熱手段を用いてもよい、また、実施例3に示し
た加熱管はフィルターの内設された蒸気移送管の外周に
巻回されるような構造のものであってもよい。
Although the invention made by the present inventor has been specifically explained above based on Examples, it goes without saying that the present invention is not limited to the Examples and can be modified in various ways without departing from the gist thereof. For example, as for the heating means, only those using an electric heater or a heating tube have been described, but the invention is not limited to this, and other heating means such as a lamp heater may also be used. The heating tube may have a structure such that it is wound around the outer periphery of a vapor transfer tube in which a filter is installed.

以上の説明では主として本発明者によってなされた発明
をその利用分野である、いわゆる蒸気乾燥装置に適用し
た場合について説明したが、これに限定されるものでは
なく、たとえば蒸気エツチング装置等にも適用できる。
In the above explanation, the invention made by the present inventor was mainly applied to a so-called steam drying apparatus, which is the field of use thereof, but the invention is not limited to this, and can also be applied to, for example, a steam etching apparatus. .

〔発明の効果〕〔Effect of the invention〕

本願において開示される発明のうち代表的なものによっ
て得られる効果を簡単に説明すれば、下記の通りである
A brief explanation of the effects obtained by typical inventions disclosed in this application is as follows.

すなわち、処理蒸気中に被処理物を位置させることによ
って前記被処理物、に所定の処理を施す処理装置であっ
て、処理蒸気を発生させる蒸気発生部と、被処理物が位
置される処理部と、前記蒸気発生部と該処理部とを連通
しフィルターの介設された蒸気移送路とを有しており、
少なくとも当該フィルターが加熱手段を備えた蒸気処理
装置構造とすることにより、処理蒸気がフィルターを通
過する際に異物の除去が可能であるとともに、処理蒸気
の液化を防止でき、処理部における信鯨性の高い蒸気処
理を実現することができる。
In other words, it is a processing apparatus that performs a predetermined process on the workpiece by placing the workpiece in processing steam, and includes a steam generation section that generates the processing steam, and a processing section in which the workpiece is placed. and a steam transfer path connecting the steam generation section and the processing section and having a filter interposed therein,
By having a steam treatment device structure in which at least the filter is equipped with a heating means, it is possible to remove foreign substances when the treated steam passes through the filter, and prevent the liquefaction of the treated steam, thereby improving reliability in the treatment section. It is possible to achieve high steam processing.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例である蒸気処理装置を示す概
略説明図、 第2図は本発明の他の実施例2である蒸気処理装置のフ
ィルター構造を示す概略斜視図、第3図は本発明の実施
例3である蒸気処理装置のフィルター構造を示す概略断
面図である。 l・・・蒸気処理装置、2・・・半導体ウェハ、3・・
・蒸気発生槽、4・・・処理槽、5・・・処理液、6・
・・ヒータ、7・・・処理蒸気、8・・・ヒータ、9・
・・廃液管、10・・・処理廃液、11・・・蒸気移送
管、12・・・f、If御バルブ、13・・・フィルタ
ー機構、14・・・フィルター本体、15・・・ヒータ
、16・・・断熱材、21・・・フィルター機構、23
a、23b・・・板状ヒータ、24・・・フィルター、
25・・・孔、31・・・フィルター機構、32・・・
加熱管、33・・・加熱流体。 代理人 弁理士 小 川 勝 男・:、!ζ”WC
FIG. 1 is a schematic explanatory diagram showing a steam treatment apparatus which is an embodiment of the present invention, FIG. 2 is a schematic perspective view showing a filter structure of a steam treatment apparatus which is another embodiment 2 of the present invention, and FIG. FIG. 2 is a schematic cross-sectional view showing a filter structure of a steam treatment apparatus according to a third embodiment of the present invention. 1... Steam processing equipment, 2... Semiconductor wafer, 3...
・Steam generation tank, 4... Processing tank, 5... Processing liquid, 6.
... Heater, 7... Processing steam, 8... Heater, 9.
... Waste liquid pipe, 10... Processed waste liquid, 11... Steam transfer pipe, 12... f, If control valve, 13... Filter mechanism, 14... Filter body, 15... Heater, 16... Insulating material, 21... Filter mechanism, 23
a, 23b... plate heater, 24... filter,
25... Hole, 31... Filter mechanism, 32...
Heating tube, 33... heating fluid. Agent: Patent attorney Katsuo Ogawa:,! ζ”WC

Claims (1)

【特許請求の範囲】 1、処理蒸気中に被処理物を位置させることによって前
記被処理物に所定の処理を施す処理装置であって、処理
蒸気を発生させる蒸気発生部と、被処理物が位置される
処理部と、前記蒸気発生部と該処理部とを連通しフィル
ターの介設された蒸気移送路とを有しており、少なくと
も前記フィルターが加熱手段を備えてなることを特徴と
する蒸気処理装置。 2、加熱手段が電気ヒータであることを特徴とする特許
請求の範囲第1項記載の蒸気処理装置。 3、加熱手段が内部に高温流体を循環させる加熱管であ
ることを特徴とする特許請求の範囲第1項記載の蒸気処
理装置。 4、被処理物が半導体ウェハであり、処理蒸気が有機溶
剤蒸気であることを特徴とする特許請求の範囲第1項、
第2項、又は第3項記載の蒸気処理装置。
[Scope of Claims] 1. A processing apparatus that performs a predetermined treatment on the object by placing the object in the processing steam, the device comprising: a steam generating section that generates the processing steam; and a steam transfer path in which a filter is interposed and communicates the steam generation section with the treatment section, and at least the filter is provided with a heating means. Steam treatment equipment. 2. The steam processing apparatus according to claim 1, wherein the heating means is an electric heater. 3. The steam processing apparatus according to claim 1, wherein the heating means is a heating tube that circulates high-temperature fluid therein. 4. Claim 1, characterized in that the object to be processed is a semiconductor wafer and the processing vapor is an organic solvent vapor;
The steam treatment apparatus according to item 2 or 3.
JP14697486A 1986-06-25 1986-06-25 Steam treating unit Pending JPS634616A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14697486A JPS634616A (en) 1986-06-25 1986-06-25 Steam treating unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14697486A JPS634616A (en) 1986-06-25 1986-06-25 Steam treating unit

Publications (1)

Publication Number Publication Date
JPS634616A true JPS634616A (en) 1988-01-09

Family

ID=15419771

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14697486A Pending JPS634616A (en) 1986-06-25 1986-06-25 Steam treating unit

Country Status (1)

Country Link
JP (1) JPS634616A (en)

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