JPS6344110A - Apparatus for inspecting surface roughness - Google Patents
Apparatus for inspecting surface roughnessInfo
- Publication number
- JPS6344110A JPS6344110A JP18898586A JP18898586A JPS6344110A JP S6344110 A JPS6344110 A JP S6344110A JP 18898586 A JP18898586 A JP 18898586A JP 18898586 A JP18898586 A JP 18898586A JP S6344110 A JPS6344110 A JP S6344110A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- surface roughness
- inspected
- speckle pattern
- speckle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003746 surface roughness Effects 0.000 title claims abstract description 27
- 230000001427 coherent effect Effects 0.000 claims abstract description 13
- 238000006243 chemical reaction Methods 0.000 claims description 13
- 238000007689 inspection Methods 0.000 claims description 10
- 238000003908 quality control method Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 6
- 238000009499 grossing Methods 0.000 description 3
- 238000003754 machining Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000002679 ablation Methods 0.000 description 1
- 235000014121 butter Nutrition 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000004439 roughness measurement Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
〈産業上の利用分野〉
この発明は、軸受の円筒コロ等の被検査物の表面粗さを
検査する表面粗さ検査装置に関する。DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to a surface roughness inspection device for inspecting the surface roughness of an object to be inspected, such as a cylindrical roller of a bearing.
〈従来の技術〉
従来、レーザー光を利用した表面粗さ検査装置としては
二光線干渉方式のものがある。この表面粗さ検査装置は
、レーザー光源からのレーザー光を半透過鏡により被検
査物と標や反射面との方向に二分解し、その標準面と被
検査物とから反射されたレーザー光によって生じる干渉
縞により被検査物の表面粗さを非接触で検査できるよう
にしている。<Prior Art> Conventionally, there is a two-beam interference type surface roughness inspection device using laser light. This surface roughness inspection device uses a semi-transmissive mirror to split the laser beam from the laser light source into two directions: the object to be inspected and the target or reflective surface, and the laser beam reflected from the standard surface and the object to be inspected The resulting interference fringes allow for non-contact inspection of the surface roughness of the object to be inspected.
〈発明が解決しようとする問題点〉
しかしながら、上記従来の三光線干1歩方式の表面粗さ
検査装置では、標準反射面を必要とし、また被検査物の
精度の高い位置決めを必要とするf二め、たとえば円筒
コロの加工ラインに適用ずろことができないという問題
があっfこ。なよj、円筒コロの粗さ測定においては、
その絶対値の測定よ;)も加工工具の摩耗などによる相
対値の変化の検出が望まれることが多い。<Problems to be Solved by the Invention> However, the conventional three-ray one-step method surface roughness inspection device requires a standard reflective surface and requires highly accurate positioning of the object to be inspected. Second, there is the problem that it cannot be applied to a machining line for cylindrical rollers, for example. Nayoj, when measuring the roughness of cylindrical rollers,
In addition to measuring its absolute value;), it is often desirable to detect changes in relative values due to wear of processing tools, etc.
そこで、この発明の目的は、標準反射面を必要と什ず、
また被検査物の精度の高い位置決めを必要とせず、加工
ラインの品質管理に簡弔に適用することができ、特に表
面粗さの相対値の変化の検出に好適な表面粗さ検査装置
を提供することにある。Therefore, the purpose of this invention is to eliminate the need for a standard reflective surface,
In addition, we provide a surface roughness inspection device that does not require highly accurate positioning of the inspected object, can be easily applied to quality control on processing lines, and is especially suitable for detecting changes in relative values of surface roughness. It's about doing.
く問題点を解決するための手段〉
この発明の表面粗さ検査装置は、コヒーレント光の光源
と、駆動ローラに載置して回転させられる置注状の被検
査物の表面に上記コヒーレント光を一定の速度で走査す
る走査装置と、上記被検査物の表面から反射されたコヒ
ーレント光の反射光を光電変換する光電変換装置と、上
記光電変換装置から人力された信号からスペックルパタ
ーンおよび走査速度により定まる特定周波数の信号を識
別して、この特定周波数の信号に基づいて上記被検査物
の表面粗さを判別ずろ判別装置とを備えたことを特徴と
している。Means for Solving the Problems> The surface roughness inspection apparatus of the present invention includes a coherent light source and a surface of an object to be inspected that is placed on a drive roller and rotated. A scanning device that scans at a constant speed, a photoelectric conversion device that photoelectrically converts coherent light reflected from the surface of the object to be inspected, and a speckle pattern and scanning speed are generated from signals manually input from the photoelectric conversion device. The present invention is characterized by comprising a deviation discriminating device that identifies a signal of a specific frequency determined by the above, and discriminates the surface roughness of the object to be inspected based on the signal of the specific frequency.
く作 用〉
円筒状の検査物は駆動ローラに載置して回転さU′ろれ
ろ。走査装置によってコヒーレント光の光源からのコヒ
ーレント光は一定の速度で検査物の表面を走査−tt−
る。被検査物の表面から反射された反射光は光電変換装
置」二に結像される。この光電変換装置上にはスペック
ルパターンすなわち明暗模様が形成される。このスペッ
クルパターンは検査物の反射面の粗さの相関長円の面か
らの反射光が互いに干渉し合うことによって生じ、この
スペックルパターンの大きさは、検査物の表面粗さ、コ
ヒーレント光の波面曲率および被検査物と各装置間の距
離で定まり、波面曲率および非検査物と各装置間の距離
が一定であるから光電変換装置の受光面でのスペックル
径の大きさは粗さに依存する。Function: The cylindrical test object is placed on the drive roller and rotated. A scanning device scans the surface of the object to be inspected with coherent light from a coherent light source at a constant speed -tt-
Ru. The light reflected from the surface of the object to be inspected is imaged on a photoelectric conversion device. A speckle pattern, that is, a bright and dark pattern is formed on this photoelectric conversion device. This speckle pattern is caused by the interference of the reflected light from the elliptical surface with the roughness of the reflective surface of the object to be inspected, and the size of this speckle pattern depends on the surface roughness of the object to be inspected and the coherent light It is determined by the wavefront curvature and the distance between the inspected object and each device.Since the wavefront curvature and the distance between the non-inspected object and each device are constant, the size of the speckle diameter on the light receiving surface of the photoelectric conversion device is determined by the roughness. Depends on.
したがって、コヒーレント光で被検査物の表面を一定の
速度で走査しているから、光電変換装置からは走査速度
およびスペックル径によって定まる特定周波数の信号が
得られる。この光電変換装置からの出力を判別装置に入
力して、スペックルの大きさに対応した周波数の信号を
求め、この信号によりスペックルパターンの大きさを求
め、表面粗さが判別される。特に表面粗さの相対値の変
化は判別装置の出力の変化によ−て簡単に分かる。Therefore, since the surface of the object to be inspected is scanned with coherent light at a constant speed, a signal of a specific frequency determined by the scanning speed and the speckle diameter is obtained from the photoelectric conversion device. The output from this photoelectric conversion device is input to a discrimination device to obtain a signal with a frequency corresponding to the size of the speckles, and the size of the speckle pattern is determined using this signal to determine the surface roughness. In particular, changes in the relative value of surface roughness can be easily recognized by changes in the output of the discriminator.
〈実施例〉 以下、この発明を図示の実施例により詳細に説明ずろ。<Example> The present invention will now be described in detail with reference to illustrated embodiments.
第1因において、25は駆動ローラ32.32上に載置
されて回転させられる検査物であるコロである。20は
コロ25の円筒面を照射する投光装置で、この投光装置
20はレーザー21と走査装置としての@動ミラー22
と集光レンズ23からなる。ま1こ、26はフレネルレ
ンズ、27はスペックルパターンに関係ずろ周波数成分
を強調するス゛ノット状格子、28は光電変換装置とし
ての)し電子増倍で、31は判別装置であり、二の判別
装置31は第3図に示すようにローパスフィルタ311
とハ(パスフィルタ313と整流平滑回路312.31
・1ど演算増幅器315とからfヱる。In the first factor, 25 is a roller that is an object to be inspected that is placed on the driving rollers 32 and 32 and rotated. Reference numeral 20 denotes a light projecting device that illuminates the cylindrical surface of the roller 25, and this projecting device 20 includes a laser 21 and a moving mirror 22 as a scanning device.
and a condensing lens 23. 1, 26 is a Fresnel lens, 27 is a snout-shaped grating that emphasizes frequency components related to the speckle pattern, 28 is an electron multiplier (as a photoelectric conversion device), and 31 is a discrimination device, which is used for the second discrimination. The device 31 includes a low-pass filter 311 as shown in FIG.
and C (pass filter 313 and rectification smoothing circuit 312.31
・F is generated from the first operational amplifier 315.
また、第2図はコロ25の両・端面の表面粗さを検査す
る走査装置の部分を示し、20°、20′はコロの両端
面にレーザー光を照射する投光装置で、第1図に示す投
光装置20と同じ構成をしている。In addition, Figure 2 shows the part of the scanning device that inspects the surface roughness of both end faces of the roller 25, and 20° and 20' are the projecting devices that irradiate laser light onto both end faces of the roller. It has the same configuration as the light projecting device 20 shown in FIG.
ま、:、26°;よフレネルレンズ、27′はスリット
状烙子、28゛は光電子増幅器、33°は増幅器、3ビ
は判別装置であり、これらは第1図に示すものと同じ構
成をしている。26° is a Fresnel lens, 27' is a slit-shaped grille, 28' is a photoelectronic amplifier, 33° is an amplifier, and 3B is a discriminator, which have the same configuration as shown in Figure 1. are doing.
上記構成において、第1図に示すように、レーザー2I
から出射されたレーザー光は振動ミラー22によって、
集光レンズ23を通過し、コロ25の円筒面251上を
中心軸に沿って端から端まで走査させられる。このコロ
25の円筒面251からの反射光はフレネルレンズ26
を通り、さらにスリット状格子27でスペックルパター
ンに関連した光信号の周波数成分か強調されて、光7ト
)を増幅管28に入力される。光電子増幅管28からは
、振動ミラー22による走査にに二じてコσ’25の円
筒面251の表面粗さを表す第・1図に示すようなスペ
ックルパターンの明暗を表す信号か増幅器33に入力さ
れ、増幅されて判別装J731に入力じれる。判別装置
31においては、第3図に示すように、増幅器33から
の信号がローパスフィルタ31・Iとバイパスフィルタ
313にモr9ぞれ通されて、ローパスフィルタ311
によ−)で拉変の大きいスペックルバター〉を表4゛信
号か通過させられ、バイパスフィルタ313によって粒
度の小さいスペックルパターンを表す信号が通過させら
れる。In the above configuration, as shown in FIG.
The laser beam emitted from the vibrating mirror 22
The light passes through the condenser lens 23 and is scanned over the cylindrical surface 251 of the roller 25 from end to end along the central axis. The reflected light from the cylindrical surface 251 of this roller 25 is reflected by the Fresnel lens 25.
The frequency components of the optical signal related to the speckle pattern are further emphasized by a slit-like grating 27, and the light 7) is input to an amplifier tube 28. From the photoelectron amplifier tube 28, a signal representing the brightness of a speckle pattern as shown in FIG. The signal is input to the discriminator J731 after being amplified. In the discrimination device 31, as shown in FIG. 3, the signal from the amplifier 33 is passed through a low-pass filter 31.
The speckle butter with large ablation is passed through the signal shown in Table 4, and the bypass filter 313 allows the signal representing the speckle pattern with small particle size to pass through.
第5図は、ローパスフィルタ311とバイパスフィルタ
313との特性を表す線図であり、foは特徴周波数を
表す。ローパスフィルタ311およびバイパスフィルタ
313から出力された各信号はそれぞれ整流平滑回路3
12,314によって整流され、平滑化されて演算増幅
器の半端子と一端子に入力される。したがって、演算増
幅器315からは低周波信号(粒度の大きいスペックル
パターンを表す)と高周波信号(粒度の小さいスペック
ルパターンを表す)とのレベルの差を表す信号が出力さ
れる。したがって、演算増幅器315の出力は表面粗さ
の粗い部分と徂くない部分との割合を表すことになり、
この演算増幅器315の出力によってコロ25の円筒面
251の表面粗さの相対値の変化が直ちに検出される。FIG. 5 is a diagram showing the characteristics of the low-pass filter 311 and the bypass filter 313, and fo represents the characteristic frequency. Each signal output from the low-pass filter 311 and the bypass filter 313 is transmitted to the rectifying and smoothing circuit 3.
12, 314, and is then rectified and smoothed and input to the half terminal and one terminal of the operational amplifier. Therefore, the operational amplifier 315 outputs a signal representing the difference in level between the low frequency signal (representing a speckle pattern with large grain size) and the high frequency signal (representing a speckle pattern with small grain size). Therefore, the output of the operational amplifier 315 represents the ratio of the rough portion to the rough portion of the surface roughness,
A change in the relative value of the surface roughness of the cylindrical surface 251 of the roller 25 is immediately detected by the output of the operational amplifier 315.
このように表面粗さの相対値の変化が直ちに検出できる
ので、加工工具の曜耗などが直ちに解り、加工ラインに
おいて表面粗さをオンライン計測するのに適する。Since changes in the relative value of surface roughness can be detected immediately in this way, wear and tear on the machining tool can be immediately determined, making it suitable for online measurement of surface roughness in a machining line.
なお、駆動ローラ32を回転することによてコロ25を
回転させてコロ25の円筒面25+全体について上述の
検査を行う。Note that the roller 25 is rotated by rotating the drive roller 32, and the above-mentioned inspection is performed on the entire cylindrical surface 25+ of the roller 25.
第2図はコロ25の両端面252.253を走査して表
面粗さを測定するもので、両端面252゜253を走査
する点のみが第1図と異なり、池は同様であるので説明
を省略する。In Figure 2, the surface roughness is measured by scanning both end faces 252 and 253 of the roller 25.The only difference from Figure 1 is that both end faces 252 and 253 are scanned, and the pond is the same, so we will explain it below. Omitted.
上記実施例では、判別装置3!をローパスフィルタ31
1およびバイパスフィルタ313、整流平滑回路3i2
.314および演算増幅回路315より構成したが、た
とえば判別装置をF −Vコンバータより構成して、第
6図に示すように高周波に対して出力電圧を高くとるよ
うにして、スペックルパターンの粒度(細かければ周波
数が高くなる)あるいは粒塵成分をF−Vコンバータの
出力により検出するようにしてもよい。In the above embodiment, the discrimination device 3! The low pass filter 31
1 and bypass filter 313, rectifier smoothing circuit 3i2
.. 314 and an operational amplifier circuit 315, for example, the discriminating device is constructed from an F-V converter, and the output voltage is set high for high frequencies as shown in FIG. (The finer the frequency, the higher the frequency.) Alternatively, the particulate dust component may be detected by the output of the F-V converter.
〈発明の効果〉
以上より明らかなように、この発明の表面粗さ検出装置
は、被検査物の表面を走査装置によってコヒーレント光
で一定速度で走査して、被検査物の表面から反射された
コヒーレント光を光電変換装置で光電変換し、この光電
変換装置から判別装置に信号を人力して、スペックルパ
ターンおよび走査速度により定まる特定周波数の信号を
識別して、この特定周波数の信号に基づいて被検査物の
表面粗さを検出しているので、標準反射面を必要とせず
、被検査物の精度の高い位置決めを必要とけず、加工ラ
インにおいての簡単な装置で粗さ測定を精度高くでき、
特に表面粗さの相対値の変化を検出するのに適する。<Effects of the Invention> As is clear from the above, the surface roughness detection device of the present invention scans the surface of an object to be inspected with coherent light at a constant speed using a scanning device, and detects the reflected light from the surface of the object to be inspected. Coherent light is photoelectrically converted by a photoelectric conversion device, and a signal is manually sent from the photoelectric conversion device to a discrimination device to identify a signal with a specific frequency determined by the speckle pattern and scanning speed. Since the surface roughness of the object to be inspected is detected, there is no need for a standard reflective surface, there is no need for highly accurate positioning of the object to be inspected, and roughness measurement can be performed with high accuracy using a simple device on the processing line. ,
It is particularly suitable for detecting changes in relative values of surface roughness.
第1図はこの発明の一実施例の円筒コロの円筒面を検査
する光学系統図、第2図は上記実施例の円筒コロの両端
面を検査ずろ光学系統図、第3図は判別装置のブロック
図、第71図はスペックルパターンを示す図、第5図は
ローパスフィルタとノ\イパスフィルタとの特性を表す
線図、第6図は出力電圧と周波数との関係を示す図であ
る。
20・・・投光装置、21・・・光源、25・・被検査
物、28・・・光電変換装置、31・・・判別装置、3
2・・・駆動ローラ。
特 許 出 願 人 光洋精工株式会社代 理 人
弁理士 青山 葆 ほか2名第4図
第5図FIG. 1 is an optical system diagram for inspecting the cylindrical surface of a cylindrical roller according to an embodiment of the present invention, FIG. 2 is an optical system diagram for inspecting both end surfaces of the cylindrical roller according to the above embodiment, and FIG. 71 is a block diagram showing a speckle pattern, FIG. 5 is a diagram showing the characteristics of a low-pass filter and a low-pass filter, and FIG. 6 is a diagram showing the relationship between output voltage and frequency. 20... Light projecting device, 21... Light source, 25... Inspection object, 28... Photoelectric conversion device, 31... Discrimination device, 3
2... Drive roller. Patent applicant: Koyo Seiko Co., Ltd. Agent
Patent attorney Aoyama Aoyama and 2 others Figure 4 Figure 5
Claims (1)
回転させられる円柱状の被検査物の表面に上記コヒーレ
ント光を一定の速度で走査する走査装置と、上記被検査
物の表面から反射されたコヒーレント光の反射光を光電
変換する光電変換装置と、上記光電変換装置から入力さ
れた信号からスペックルパターンおよび走査速度により
定まる特定周波数の信号を識別して、この特定周波数の
信号に基づいて上記被検査物の表面粗さを判別する判別
装置とを備えたことを特徴とする表面粗さ検査装置。(1) A light source of coherent light, a scanning device that scans the surface of the cylindrical test object placed on a drive roller and rotated with the coherent light at a constant speed, and reflection from the surface of the test object. A photoelectric conversion device that photoelectrically converts the reflected light of the coherent light, and a signal of a specific frequency determined by the speckle pattern and scanning speed is identified from the signal input from the photoelectric conversion device, and based on the signal of this specific frequency, A surface roughness inspection device comprising: a discrimination device for discriminating the surface roughness of the object to be inspected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18898586A JPS6344110A (en) | 1986-08-12 | 1986-08-12 | Apparatus for inspecting surface roughness |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18898586A JPS6344110A (en) | 1986-08-12 | 1986-08-12 | Apparatus for inspecting surface roughness |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6344110A true JPS6344110A (en) | 1988-02-25 |
Family
ID=16233369
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18898586A Pending JPS6344110A (en) | 1986-08-12 | 1986-08-12 | Apparatus for inspecting surface roughness |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6344110A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007333729A (en) * | 2006-05-05 | 2007-12-27 | Asml Netherlands Bv | Inspection method and device using it |
JP2011220816A (en) * | 2010-04-09 | 2011-11-04 | Niigata Univ | Method for measuring shape of cylindrical surface |
-
1986
- 1986-08-12 JP JP18898586A patent/JPS6344110A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007333729A (en) * | 2006-05-05 | 2007-12-27 | Asml Netherlands Bv | Inspection method and device using it |
JP2011220816A (en) * | 2010-04-09 | 2011-11-04 | Niigata Univ | Method for measuring shape of cylindrical surface |
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