JP3213866B2 - Work surface smoothness inspection method - Google Patents

Work surface smoothness inspection method

Info

Publication number
JP3213866B2
JP3213866B2 JP29692293A JP29692293A JP3213866B2 JP 3213866 B2 JP3213866 B2 JP 3213866B2 JP 29692293 A JP29692293 A JP 29692293A JP 29692293 A JP29692293 A JP 29692293A JP 3213866 B2 JP3213866 B2 JP 3213866B2
Authority
JP
Japan
Prior art keywords
work surface
light
reflected light
image
smoothness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP29692293A
Other languages
Japanese (ja)
Other versions
JPH07151530A (en
Inventor
憲嗣 加藤
健一郎 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honda Motor Co Ltd
Original Assignee
Honda Motor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honda Motor Co Ltd filed Critical Honda Motor Co Ltd
Priority to JP29692293A priority Critical patent/JP3213866B2/en
Publication of JPH07151530A publication Critical patent/JPH07151530A/en
Application granted granted Critical
Publication of JP3213866B2 publication Critical patent/JP3213866B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

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  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、ワークの塗装面等のワ
ーク表面の平滑度を検査する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for inspecting the smoothness of a work surface such as a painted surface of the work.

【0002】[0002]

【従来の技術】従来、ワークの塗装面にごみの付着等に
よる凸部が存在するか否かを検査する方法として、実開
平5−14902号公報により、図3に示す如く、ワー
ク表面Aに向けて検出光を照射する投光手段1と、ワー
ク表面Aからの反射光を受光する撮像手段2とを備える
光学式検査装置を用い、撮像手段2に結像される反射光
の画像データに基づいてワーク表面Aの凸部Bを検出す
るものが知られている。
2. Description of the Related Art Conventionally, as a method for inspecting whether or not a convex portion due to adhesion of dust or the like exists on a painted surface of a work, Japanese Unexamined Utility Model Publication No. 5-14902 discloses a method for inspecting a work surface A as shown in FIG. Using an optical inspection device including a light projecting means 1 for irradiating the detection light toward the light source and an imaging means 2 for receiving the reflected light from the work surface A, and converting the reflected light image data formed on the imaging means 2 into image data. One that detects a convex portion B of a work surface A based on the same is known.

【0003】このもので投光手段1は、光源10と光源
10からの光をワーク表面Aに向けて照射するフレネル
レンズ等の集光光学系11とで構成されており、集光光
学系11による検出光の集光作用により反射光を撮像手
段2に向けて収束させ、撮像手段2により反射光を受光
可能なワーク表面Aの有効検査範囲を拡大し得るように
している。
The light projecting means 1 comprises a light source 10 and a condensing optical system 11 such as a Fresnel lens for irradiating the light from the light source 10 toward the work surface A. The reflected light is converged toward the image pickup means 2 by the light condensing action of the detection light, and the effective inspection range of the work surface A where the image pickup means 2 can receive the reflected light can be expanded.

【0004】また、撮像手段2はCCDカメラで構成さ
れており、反射光が撮像手段2のレンズから成る入光部
20の中央部に向けて収束するように光学式検査装置を
配置して検査を行っている。
The image pickup means 2 is composed of a CCD camera, and an optical inspection device is arranged so that reflected light converges toward the center of the light input section 20 composed of a lens of the image pickup means 2 for inspection. It is carried out.

【0005】ここで、ワーク表面Aに凸部Bが有ると、
凸部Bからの反射光Rbは入光部20に入射されず、撮
像手段2の画像の凸部Bに対応する部分は暗部となり、
この暗部から凸部Bの存在を検出できる。
Here, if the work surface A has a convex portion B,
The reflected light Rb from the convex portion B is not incident on the light incident portion 20, and a portion corresponding to the convex portion B of the image of the imaging means 2 becomes a dark portion,
The presence of the convex portion B can be detected from this dark portion.

【0006】[0006]

【発明が解決しようとする課題】然し、上記従来の検査
方法では、ワーク表面Aの凸部Bが或る程度以上の大き
さにならないと、凸部Bからの反射光が撮像手段2の入
光部20に入射され、画像の凸部Bに対応する部分に反
射光が結像されてこの部分が暗部ならなくなる。従っ
て、ワーク表面に塗装むらによるうねり等の微小な凹凸
を生じても、撮像手段の画像に凹凸に対応する暗部は現
われず、ワーク表面の平滑度を精度良く検査することは
困難である。本発明は、以上の点に鑑み、上記した光学
式検査装置を用いてワーク表面の平滑度を精度良く検査
できるようにした方法を提供することをその目的として
いる。
However, in the above-described conventional inspection method, if the convex portion B of the work surface A does not become a certain size or more, the reflected light from the convex portion B enters the imaging means 2. The light is incident on the light portion 20 and the reflected light is imaged on a portion corresponding to the convex portion B of the image, and this portion does not become a dark portion. Therefore, even if minute irregularities such as undulations due to uneven coating are generated on the work surface, no dark portion corresponding to the irregularities appears in the image of the imaging means, and it is difficult to accurately inspect the smoothness of the work surface. In view of the above, it is an object of the present invention to provide a method capable of accurately inspecting the smoothness of a work surface using the above-described optical inspection device.

【0007】[0007]

【課題を解決するための手段】上記目的を達成すべく、
本発明は、ワーク表面に向けて検出光を照射する投光手
段と、ワーク表面からの反射光を受光する撮像手段とを
備え、投光手段に反射光が撮像手段に向けて収束するよ
うに検出光を集光する集光光学系を組込んで成る光学式
検査装置を用いてワーク表面の平滑度を検査する方法に
おいて、反射光が撮像手段の入光部の端部に向けて収束
するように光学式検査装置を配置し、この状態で撮像手
段に結像される反射光の画像データに基づいて検査を行
うことを特徴とする。
In order to achieve the above object,
The present invention includes light projecting means for irradiating detection light toward the work surface, and image pickup means for receiving light reflected from the work surface, so that the reflected light converges on the light projecting means toward the image pickup means. In a method of inspecting the smoothness of a work surface using an optical inspection device that incorporates a condensing optical system that condenses detection light, reflected light converges toward an end of a light incident portion of an imaging unit. The optical inspection apparatus is arranged as described above, and in this state, the inspection is performed based on the image data of the reflected light imaged on the imaging means.

【0008】[0008]

【作用】ワーク表面の凹凸が微小であっても、この凹凸
からの反射光は平坦なワーク表面からの反射光が収束す
る撮像手段の入光部の端部領域から外れて入光部に入射
されなくなり、撮像手段の画像の本来明部となる領域に
暗部が現われる。かくて、撮像手段の画像データに基づ
いてワーク表面の平滑度を精度良く検査できる。
[Function] Even if the unevenness of the work surface is minute, the light reflected from the unevenness deviates from the end area of the light incoming portion of the imaging means where the reflected light from the flat work surface converges and enters the light incoming portion. And a dark part appears in a region that is originally a bright part of the image of the imaging means. Thus, the smoothness of the work surface can be accurately inspected based on the image data of the imaging means.

【0009】[0009]

【実施例】図1は光学式検査装置を用いてワーク表面A
の平滑度を検査する状態を示している。この検査装置の
基本構成は図3に示した検査装置と同一であり、同一の
部材には図3で用いた符号と同一の符号を付してその説
明を省略する。
FIG. 1 shows a work surface A using an optical inspection device.
2 shows a state in which the smoothness of the image is inspected. The basic configuration of this inspection apparatus is the same as that of the inspection apparatus shown in FIG. 3, and the same members are denoted by the same reference numerals as those used in FIG. 3, and description thereof will be omitted.

【0010】この光学式検査装置は図示しないロボット
の動作端に投光手段1と撮像手段2との相対位置関係が
一定に保たれるように搭載されており、ワーク表面Aの
塗装不良(ごみ等による凸部)の検査に際しては、ワー
ク表面Aからの反射光が図3に示す如く撮像手段2の入
光部20の中央部に収束するように検査装置をワークに
対し位置決めし、ワーク表面Aの平滑度の検査に際して
は、反射光が図1に示す如く入光部22の端部に収束す
るように検査装置を図3の状態から傾むける。
This optical inspection apparatus is mounted on the operating end of a robot (not shown) so that the relative positional relationship between the light projecting means 1 and the imaging means 2 is kept constant. In the inspection of the convex portion due to, for example, the inspection device is positioned with respect to the workpiece so that the reflected light from the workpiece surface A converges on the central portion of the light entrance 20 of the imaging means 2 as shown in FIG. In the inspection of the smoothness of A, the inspection device is tilted from the state of FIG. 3 so that the reflected light converges on the end of the light entrance 22 as shown in FIG.

【0011】これによれば、ワーク表面Aに存在する凹
凸のうち入光部20の前記端部側に位置する凹凸部Cか
らの反射光RCは凹凸部Cが微小であっても入光部22
に入射されなくなり、一方、入光部22の前記端部から
離れた側に位置する凹凸部Dからの反射光Rdは通常の
反射光の入射領域外の部分に入射され、撮像手段2の画
像の通常の反射光の結像領域外の部分に反射光Rdが結
像される。
According to this, of the unevenness existing on the work surface A, the reflected light RC from the unevenness portion C located on the end side of the light incident portion 20 can receive the reflected light RC even if the unevenness portion C is minute. 22
On the other hand, the reflected light Rd from the concave / convex portion D located on the side of the light incident portion 22 away from the end portion is incident on a portion outside the normal reflected light incident area, and the image of the imaging means 2 The reflected light Rd is imaged in a portion outside the normal reflected light imaging region.

【0012】従って、ワーク表面Aが平滑であれば、撮
像手段2の画像には、図2(a)に示す如く、検出光の照
射区域に対応する明部領域と非照射区域に対応する暗部
領域とが明瞭に現われるが、ワーク表面Aの面粗度が悪
いと、図2(b)に示す如く、凹凸部Cからの反射光Rc
が入光部22に入射されないことに起因して暗部が明部
領域内に散在し、また、凹凸部Dからの反射光Rdの結
像に起因して暗部領域に明部が散在した画像になる。
Therefore, if the work surface A is smooth, the image of the imaging means 2 has a bright area corresponding to the irradiation area of the detection light and a dark area corresponding to the non-irradiation area, as shown in FIG. Although the region clearly appears, if the surface roughness of the work surface A is poor, as shown in FIG.
Are not scattered in the bright portion region due to the light not entering the light incident portion 22, and the bright portions are scattered in the dark portion region due to the imaging of the reflected light Rd from the uneven portion D. Become.

【0013】かくて、撮像手段2の画像に複数のウイン
ドWを設定して、明部100%或いは暗部100%のウ
インドWの数を計測するといった画像処理を行うことに
より、ワーク表面Aの平滑度を定量的に検査できるよう
になり、塗装面の肌品質の管理に大いに役立つ。
Thus, by setting a plurality of windows W in the image of the image pickup means 2 and performing image processing such as counting the number of windows W of 100% of the bright portion or 100% of the dark portion, the work surface A can be smoothed. The degree can be inspected quantitatively, which is very useful for controlling the quality of the painted skin.

【0014】[0014]

【発明の効果】以上の説明から明らかなように、本発明
によれば、ワーク表面の微小な凹凸も検出でき、ワーク
表面の平滑度を光学的に精度良く検査できる。
As is apparent from the above description, according to the present invention, fine irregularities on the work surface can be detected, and the smoothness of the work surface can be optically accurately inspected.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明によるワーク表面の平滑度の検査状況
を示す図
FIG. 1 is a diagram showing an inspection state of a work surface smoothness according to the present invention.

【図2】 (a)ワーク表面が平滑である場合の画像を示
す図、(b)ワーク表面の面粗度が悪い場合の画像を示す
2A is a diagram illustrating an image when the work surface is smooth, and FIG. 2B is a diagram illustrating an image when the surface roughness of the work surface is poor.

【図3】 ワーク表面の通常の検査状況を示す図FIG. 3 is a diagram showing a normal inspection state of a work surface;

【符号の説明】[Explanation of symbols]

1 投光手段 2 撮像手段 20 入光部 A ワーク表面 DESCRIPTION OF SYMBOLS 1 Projection means 2 Imaging means 20 Light entrance part A Work surface

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) G01B 11/00 - 11/30 102 G01N 21/84 - 21/958 ──────────────────────────────────────────────────続 き Continued on the front page (58) Fields surveyed (Int. Cl. 7 , DB name) G01B 11/00-11/30 102 G01N 21/84-21/958

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 ワーク表面に向けて検出光を照射する投
光手段と、ワーク表面からの反射光を受光する撮像手段
とを備え、投光手段に反射光が撮像手段に向けて収束す
るように検出光を集光する集光光学系を組込んで成る光
学式検査装置を用いてワーク表面の平滑度を検査する方
法において、反射光が撮像手段の入光部の端部に向けて
収束するように光学式検査装置を配置し、この状態で撮
像手段に結像される反射光の画像データに基づいて検査
を行うことを特徴とするワーク表面の平滑度検査方法。
A light projecting means for irradiating the work surface with detection light; and an image pickup means for receiving reflected light from the work surface, wherein the reflected light converges toward the image pickup means. In the method of inspecting the smoothness of the work surface using an optical inspection device that incorporates a condensing optical system that collects the detection light, the reflected light converges toward the end of the light entrance of the imaging means A method for inspecting the smoothness of a workpiece surface, wherein an optical inspection device is arranged so as to perform inspection based on image data of reflected light imaged on an imaging means in this state.
JP29692293A 1993-11-26 1993-11-26 Work surface smoothness inspection method Expired - Fee Related JP3213866B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29692293A JP3213866B2 (en) 1993-11-26 1993-11-26 Work surface smoothness inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29692293A JP3213866B2 (en) 1993-11-26 1993-11-26 Work surface smoothness inspection method

Publications (2)

Publication Number Publication Date
JPH07151530A JPH07151530A (en) 1995-06-16
JP3213866B2 true JP3213866B2 (en) 2001-10-02

Family

ID=17839918

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29692293A Expired - Fee Related JP3213866B2 (en) 1993-11-26 1993-11-26 Work surface smoothness inspection method

Country Status (1)

Country Link
JP (1) JP3213866B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104848808B (en) * 2015-06-03 2017-08-25 湖南大学 A kind of Surface Roughness Detecting Method and equipment

Also Published As

Publication number Publication date
JPH07151530A (en) 1995-06-16

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