JPS6342375A - Vapor growth device - Google Patents

Vapor growth device

Info

Publication number
JPS6342375A
JPS6342375A JP18598586A JP18598586A JPS6342375A JP S6342375 A JPS6342375 A JP S6342375A JP 18598586 A JP18598586 A JP 18598586A JP 18598586 A JP18598586 A JP 18598586A JP S6342375 A JPS6342375 A JP S6342375A
Authority
JP
Japan
Prior art keywords
reaction chamber
susceptor
gas
jar
bell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18598586A
Other languages
Japanese (ja)
Inventor
Tsugio Ishikawa
石川 二男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KYUSHU DENSHI KINZOKU KK
Original Assignee
KYUSHU DENSHI KINZOKU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KYUSHU DENSHI KINZOKU KK filed Critical KYUSHU DENSHI KINZOKU KK
Priority to JP18598586A priority Critical patent/JPS6342375A/en
Publication of JPS6342375A publication Critical patent/JPS6342375A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To optimize the concn. of the gaseous flow in the reaction chamber of a barrel type vapor growth device by constituting the reaction chamber of a bell-jar having the shape, the outside circumferential length of which decreases gradually from the upper gas introducing port side toward the lower gas discharge port side. CONSTITUTION:A susceptor 10 for holding the material 1 is constituted of the approximately pyramidal shape consisting of plural slopes and is mounted to a revolving shaft 11 suspended perpendicularly from a base plate in such a manner that said susceptor can be freely rotated. The susceptor 10 is introduced into the tulip-shaped bell-jar 12. A gaseous raw material is introduced from the gas introducing port 14 provided with an upper closing member 13 into the reaction chamber 15 and is discharged from the gas discharge port 16 provided to a lower closing member 16. A high-frequency coil 17 is disposed to the outside circumferential part of the bell-jar 12. The bell-jar 12 in the above-mentioned constitution is formed to the shape, the outside circumference of which is gradually decreased from the gas introducing port 14 side toward the gas discharge port 16 side. The gaseous flow and concn. in the reaction chamber 15 are thereby optimized and the uniformity of the thickness of the formed thin film is improved, by which the yield of the product is improved.

Description

【発明の詳細な説明】 利用産業分野 この発明は、化学反応により、基板上に所要の半導体薄
膜を気相成長させるバレル型気相成長装;lの改良に係
り、最適の原料ガス流を確保し、膜厚の均一性を向上さ
せ、製品歩留を向上させることができる気相成長装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION Field of Application The present invention relates to an improvement in a barrel-type vapor phase growth apparatus for vapor phase growth of a required semiconductor thin film on a substrate by chemical reaction, ensuring an optimal raw material gas flow. The present invention relates to a vapor phase growth apparatus that can improve film thickness uniformity and product yield.

背景技術 今日、集積回路の量産には、高温に加熱された基板を収
納したベルジャー内に、一方より原料ガスを導入し、該
基板上に特定組成の薄膜を気相化学反応により形成し、
ベルジャーの他方より排ガスを排出する構成からなる気
相成長装置が用いられている。
BACKGROUND ART Today, in the mass production of integrated circuits, raw material gas is introduced from one side into a bell jar containing a substrate heated to high temperature, and a thin film of a specific composition is formed on the substrate by a vapor phase chemical reaction.
A vapor phase growth apparatus is used in which exhaust gas is discharged from the other end of a bell jar.

一般に、気相成長装置において、基板上に薄膜を所要厚
みに均一に形成するには、温度、圧力、ガス濃度、基板
表面などの各種要素を最適に選択、保持する必要がある
とされている。
In general, in order to uniformly form a thin film to the required thickness on a substrate using a vapor phase growth apparatus, it is necessary to optimally select and maintain various factors such as temperature, pressure, gas concentration, and substrate surface. .

ベルジャー内の原料ガスの流体力学的な検討や、基板の
加熱方法などにより、横型、縦型、バレル型等の各種型
式の気相成長装置が開発され、一般に、原料ガスの流れ
状態が、薄膜厚みの均一性に悪影響を与えることが知ら
れており、特に、反応室内のガス濃度の不均一が歩留の
低下を招来することが指摘されている。
Various types of vapor phase growth equipment, such as horizontal, vertical, and barrel types, have been developed based on the fluid dynamics of the raw material gas in the bell jar and the heating method of the substrate. It is known that the uniformity of thickness is adversely affected, and in particular, it has been pointed out that non-uniform gas concentration within the reaction chamber causes a decrease in yield.

第3図に示すバレル型気相成長装置は、横型と縦型の利
点を有するものとされ、基板(1)を保持し回転駆動さ
れるサセプター(2)は複数の(IA’f=JF面から
なる略角錐状から構成され、ドーム状あるいは図示する
チューリップ状のベルジャー(3)の上部の開口を閉塞
する部材に設けたガス導入口(4)より原料ガスが円筒
状の反応室(5)へ導入され、下部の閉塞底部の中央に
設けたガス排出口(6)より排出され、ベルジャー(3
)の外周部に、赤外線ランプまたは高周波コイル(ここ
では高周波コイル(7)を示す)が配置される構成であ
る。また、前記のドーム型のベルジャーを用いたバレル
型の場合は、サセプター(2)の傾斜方向が同一方向で
ある以外、全てが上下逆配置となる。
The barrel type vapor phase growth apparatus shown in FIG. 3 has the advantages of horizontal and vertical types, and the susceptor (2) that holds the substrate (1) and is rotationally driven has a plurality of (IA'f = JF planes). The raw material gas is supplied to a cylindrical reaction chamber (5) through a gas inlet (4) provided in a member that closes the upper opening of a dome-shaped or tulip-shaped bell jar (3) as shown in the figure. The gas is introduced into the bell jar (3
), an infrared lamp or a high frequency coil (high frequency coil (7) is shown here) is arranged. In addition, in the case of the barrel type using the dome-shaped bell jar, all of the bell jars are arranged upside down except that the susceptors (2) are tilted in the same direction.

かかる気相成長装置において、1バツチにおける基板処
理枚数をふやす傾向にあるが、ガスの流の不均一やガス
濃度分布の不均一が問題となるため、被加熱体である基
板及びサセプターの均一な加熱を目的に、加熱源の高周
波コイル(7)とサセプター(2)との間隔調整や、高
周波コイル(7)の配置方法を考慮したり、赤外線ラン
プの場合、その帯域ごとに出力調整したりして、被加熱
体への熱量を制御し、基板(1)上の温度分布を一様に
し、さらに、減圧するなどの手段により、ガス流速を増
して原料ガスの供給1よを増大させ、ガス流方向の各基
板」二膜厚の不均一を改善する方法が取られていた。
In such a vapor phase growth apparatus, there is a tendency to increase the number of substrates processed in one batch, but uneven gas flow and uneven gas concentration distribution pose problems, so it is difficult to uniformly process substrates and susceptors that are heated objects. For the purpose of heating, it is necessary to adjust the distance between the high frequency coil (7) of the heating source and the susceptor (2), consider the arrangement of the high frequency coil (7), and in the case of infrared lamps, adjust the output for each band. Then, the amount of heat to the heated body is controlled, the temperature distribution on the substrate (1) is made uniform, and the gas flow rate is increased by means such as reducing the pressure to increase the supply of raw material gas, A method was taken to improve the non-uniformity of the film thickness on each substrate in the gas flow direction.

しかし、上記方法でもガス濃度分布の不均一が解消され
ず、成長する薄膜厚みが不均一となるため、サセプター
をガス流れに略平行に配置し、基板上垂直方向のガス濃
度を測定し、その結果に基づき補充原料ガスを供給する
方法が(特開昭55−75999号)が提案されている
が、かかるガス濃度測定、補充をリアルタイムに行なう
には、高度な演算制御が必要となり、操業工種々の問題
を派生させていた。
However, even with the above method, the non-uniformity of the gas concentration distribution is not resolved and the thickness of the grown thin film becomes non-uniform. Therefore, the susceptor is placed approximately parallel to the gas flow, and the gas concentration in the vertical direction on the substrate is measured. A method of supplying replenishment raw material gas based on the results has been proposed (Japanese Patent Application Laid-open No. 75999/1983), but performing such gas concentration measurement and replenishment in real time requires sophisticated calculation control and requires operational labor. This led to various problems.

発明の目的 この発明は、バレル型気相成長装置において、複雑なガ
ス濃度制御を行なうことなく、簡単な操業で、基板」二
に成長させる薄膜の膜厚の均一性を向上させることがで
き、製品歩留を向上させることができる気相成長装置を
目的としている。
Purpose of the Invention The present invention is capable of improving the uniformity of the thickness of a thin film grown on a substrate in a barrel-type vapor phase growth apparatus with simple operation without complicated gas concentration control. The aim is to create a vapor phase growth device that can improve product yield.

発明の構成と効果 この発明は、気相成長装置における基板上薄膜の均一成
長を目的に種々検討した結果、ガス導入口側より下側の
ガス排出口に向って、外周長が暫時減少する形状からな
るベルジャーで反応室を構成することにより、反応室内
のガス流並びに濃度の最適化が図られ、成形薄膜厚みの
均一性が向上し、製品歩留が向上することを知見したも
のである。
Structure and Effects of the Invention As a result of various studies aimed at uniformly growing a thin film on a substrate in a vapor phase growth apparatus, the present invention has developed a structure in which the outer circumference gradually decreases from the gas inlet side toward the lower gas outlet. It has been discovered that by configuring the reaction chamber with a bell jar made of 300% gas, the gas flow and concentration within the reaction chamber can be optimized, the uniformity of the formed thin film thickness can be improved, and the product yield can be improved.

すなわち、この発明は、 上下方向にガスの導入、排出口を設けたベルジャー内に
、ガス導入口側に頂部を対向させた角錐状サセプターを
配置し、水素還元、熱分解法等の化学的反応により、基
板上に結晶層を気相成長させるバレル型気相成長装置に
おいて、ガス導入口側より下側のガス排出口に向って、
外周長が暫時減少する形状からなるベルジャーで反応室
を構成したことを特徴とする気相成長装置である。
That is, this invention arranges a pyramid-shaped susceptor with its top facing the gas inlet in a bell jar with gas inlet and outlet ports in the vertical direction, and performs chemical reactions such as hydrogen reduction and thermal decomposition. In a barrel-type vapor phase growth apparatus that grows a crystal layer on a substrate in a vapor phase, from the gas inlet side toward the lower gas outlet,
This is a vapor phase growth apparatus characterized in that a reaction chamber is constituted by a bell jar having a shape whose outer circumference gradually decreases.

この発明において、ガス導入口側より下側のガス排出1
7Jに向って、外周長が暫時減少する形状からなるベル
ジャーで反応室を構成することにより、反応室内のガス
流並びに濃度の最適化が図られ、成形薄膜厚みの均一性
が向上し、製品歩留が向上する効果が得られるが、サセ
プターの傾斜角度と上記のガス導入口側に頂部を対向さ
せた角錐状ベルジャーの絞り傾斜角度との関係は、ベル
ジャー寸法やサセプター形状2寸法及びガス流等の諸条
件を考慮して適宜選定する必要がある。
In this invention, the gas discharge 1 below the gas inlet side
7J, by configuring the reaction chamber with a bell jar with a shape whose outer circumference gradually decreases, the gas flow and concentration within the reaction chamber can be optimized, improving the uniformity of the formed thin film thickness and improving the product process. However, the relationship between the inclination angle of the susceptor and the aperture inclination angle of the pyramidal bell jar with the top facing the gas inlet side depends on the dimensions of the bell jar, the two dimensions of the susceptor shape, the gas flow, etc. It is necessary to make an appropriate selection taking into account the following conditions.

発明の図面に基づく開示 第1図はこの発明によるバレル型気相成長装置の縦断説
明図である。第2図はこの発明の他の気相成長装置の縦
断説明図である。
DISCLOSURE OF THE INVENTION BASED ON THE DRAWINGS FIG. 1 is a longitudinal sectional view of a barrel-type vapor phase growth apparatus according to the present invention. FIG. 2 is a longitudinal sectional view of another vapor phase growth apparatus of the present invention.

第1図に示す気相成長装置は、基板(1)を保持するサ
セプター(10)は複数の傾斜面からなる略角錐状から
構成され、基台に垂直に垂架された回転軸(11)に装
着されて回転可能に保持され、チューリップ状のベルジ
ャー(12)内に装入されており、該ベルジャー(12
)の上部の開口を閉塞する部材(13)に設けたガス導
入口(14)より原料ガスが反応室(15)へ導入され
、ベルジャー(12)下部の閉塞底部の中央に設けたガ
スjJI=出口(16)よりJJI−出され、ベルジャ
ー(12)の外周部に高周波コイル(17)が配置され
る構成である。なお、加熱源には赤外線ランプを使用で
きるが、ここでは高周波コイルを用いた例を示す。
In the vapor phase growth apparatus shown in FIG. 1, a susceptor (10) that holds a substrate (1) has a substantially pyramidal shape with a plurality of inclined surfaces, and a rotating shaft (11) is suspended perpendicularly to a base. The bell jar (12) is attached to a tulip-shaped bell jar (12), and is rotatably held in the bell jar (12).
) The source gas is introduced into the reaction chamber (15) from the gas inlet (14) provided in the member (13) that closes the opening at the top of the bell jar (12), and the gas jJI= JJI is output from the outlet (16), and a high frequency coil (17) is disposed around the outer periphery of the bell jar (12). Although an infrared lamp can be used as the heating source, an example using a high frequency coil will be shown here.

ベルジャー(12)は、ガス導入口(14)側より下側
のガス排出口(16)に向って、外周長が暫時減少する
形状からなる。
The bell jar (12) has a shape in which the outer circumference gradually decreases from the gas inlet (14) side toward the lower gas outlet (16).

第2図に示すバレル型気相成長装置は、基板(1)を保
持するサセプター(20)は同様形状の略多角錐状から
なり、また、基台に垂直に軸支された回転軸(21)に
装着されて回転可能に保持され、これを覆うように配置
されるベルジャー(22)は、頭部中央にガス導入口(
24)を開孔し、下側開口部に向って水平方向の外周長
が暫時減少する形状からなり、原料ガスは上部のガス導
入口(24)より、ベルジャー(22)内の反応室(2
5)内を下降して、ベルジャー(22)下部の開口を閉
塞する部材あるいは基台に設けたガス排出口(26)よ
り排出され、ベルジャー(22)の外周部に高周波コイ
ル(27)が配置される構成である。なお、加熱源には
赤外線ランプを使用できるが、ここでは高周波コイルを
用いた例を示す4゜ 上述の如く、ベルジャー(12X22)の形状を、サセ
プター(10X20)の傾斜角度等に応じて、この発明
による特殊な形状とすることにより、次のような利点が
ある。
In the barrel type vapor phase growth apparatus shown in FIG. ), the bell jar (22) is rotatably held and arranged to cover the bell jar (22), which has a gas inlet (22) in the center of the head.
24), and the outer circumference length in the horizontal direction gradually decreases toward the lower opening, and the raw material gas enters the reaction chamber (2) in the bell jar (22) from the upper gas inlet (24).
5) The gas descends inside the bell jar (22) and is discharged from a member that closes the opening at the bottom of the bell jar (22) or from a gas outlet (26) provided in the base, and a high frequency coil (27) is arranged around the outer periphery of the bell jar (22). This is the configuration that will be used. Although an infrared lamp can be used as the heating source, here we show an example using a high-frequency coil.As mentioned above, the shape of the bell jar (12 x 22) can be adjusted depending on the inclination angle of the susceptor (10 x 20), etc. The special shape according to the invention has the following advantages.

すなわち、一般に、原料ガスは、従来の円筒状の反応室
(5)(第3図参照)内を下方へ行くほど加熱されて膨
ノ展するため、浮力を生じて下流側はどその流速が乱れ
、上流側で原料ガスの濃度が高く、下流側で低くなり、
下流側基板に形成される膜厚が不均一になる傾向があっ
たが、この発明による外周長さが暫時減少する所謂尻窄
み形状の反応室(15に25)とすることにより、下流
側はど通過1析面積が少なくなるため、流速が速くなり
、浮力の影響少なく、均一な膜)1を得ることができる
That is, in general, the raw material gas is heated and expands as it goes downward in the conventional cylindrical reaction chamber (5) (see Figure 3), which creates buoyancy and lowers the flow velocity everywhere on the downstream side. turbulence, the concentration of the raw material gas is high on the upstream side and low on the downstream side,
The thickness of the film formed on the downstream substrate tended to be non-uniform, but by creating a reaction chamber with a so-called tapered shape (15 to 25) in which the outer circumferential length is temporarily reduced according to the present invention, the thickness of the film formed on the downstream substrate can be improved. Since the area passing through the tube is reduced, the flow rate becomes faster, and a uniform film can be obtained with less influence of buoyancy.

なお、ベルジャーを円筒状とし、サセプターの傾き角度
を緩くすると、相対的に上記の場合と同様と考えられる
が、サセプター形状が変り、基板の保持面積が変化し、
ガス濃度も変化するなど種々の問題を招来するため好ま
しくない。
Note that if the bell jar is made cylindrical and the inclination angle of the susceptor is made gentler, the situation is considered to be relatively similar to the above case, but the shape of the susceptor changes, the holding area of the substrate changes,
This is not preferable because it causes various problems such as a change in gas concentration.

実施例 第1図に示したバレル型気相成長装置を用いて、 サセプター;6角錘形状 対角線長さ上側250mm、 下側280mm、 回転数6/min ベルジャー;上側直径335mm、下側直径310mm
、高周波コイルと光反射構造体間距離;20〜35mm
加熱時間;1時間 加熱温度; 1200℃、 反応時間;30分 半導体ガス; 5iC14 なる条件のこの発明装置による気相成長を行なったとこ
ろ、ベルジャーが直径335mmの円筒状形状の従来装
置に比較して、形成薄膜厚みが均一となり、膜厚ばらつ
きが10%減少した。
Example Using the barrel type vapor phase growth apparatus shown in Fig. 1, susceptor: hexagonal pyramid diagonal length upper side 250 mm, lower side 280 mm, rotation speed 6/min Bell jar: upper diameter 335 mm, lower diameter 310 mm
, distance between the high frequency coil and the light reflecting structure; 20 to 35 mm
Heating time: 1 hour Heating temperature: 1200°C, reaction time: 30 minutes Semiconductor gas: 5iC14 When vapor phase growth was performed using the apparatus of the present invention under the following conditions, compared to the conventional apparatus in which the bell jar had a cylindrical shape with a diameter of 335 mm, , the formed thin film thickness became uniform, and the film thickness variation was reduced by 10%.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明によるバレル型気相成長装置の縦断説
明図である。第2図はこの発明の他の気相成長装置の縦
18I−説明図である。第3図は従来のバレル型気相成
長装置の縦断説明図である。 1・・・基板、10.20・・・サセプター、12.2
2・・・石英ベルジャー、14.24・・・ガス導入口
、15.25・・・反応室、16.26・・・ガス排出
口、I7,27・・・高周波コイル。
FIG. 1 is a longitudinal sectional view of a barrel type vapor phase growth apparatus according to the present invention. FIG. 2 is a vertical 18I-illustration diagram of another vapor phase growth apparatus of the present invention. FIG. 3 is a vertical sectional view of a conventional barrel type vapor phase growth apparatus. 1... Substrate, 10.20... Susceptor, 12.2
2...Quartz bell jar, 14.24...Gas inlet, 15.25...Reaction chamber, 16.26...Gas outlet, I7, 27...High frequency coil.

Claims (1)

【特許請求の範囲】[Claims] 1 上下方向にガスの導入、排出口を設けたベルジャー
内に、ガス導入口側に頂部を対向させた略角錐状サセプ
ターを配置し、水素還元、熱分解法等の化学的反応によ
り、基板上に結晶層を気相成長させるバレル型気相成長
装置において、ガス導入口側より下側のガス排出口に向
って、外周長が暫時減少する形状からなるベルジャーで
反応室を構成したことを特徴とする気相成長装置。
1 A substantially pyramid-shaped susceptor with its top facing the gas inlet is placed in a bell jar with gas inlet and outlet ports in the vertical direction, and a chemical reaction such as hydrogen reduction or pyrolysis is used to form a susceptor on the substrate. A barrel-type vapor phase growth apparatus for growing a crystal layer in a vapor phase, characterized in that the reaction chamber is configured with a bell jar whose outer circumference gradually decreases from the gas inlet side toward the lower gas outlet. Vapor phase growth equipment.
JP18598586A 1986-08-07 1986-08-07 Vapor growth device Pending JPS6342375A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18598586A JPS6342375A (en) 1986-08-07 1986-08-07 Vapor growth device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18598586A JPS6342375A (en) 1986-08-07 1986-08-07 Vapor growth device

Publications (1)

Publication Number Publication Date
JPS6342375A true JPS6342375A (en) 1988-02-23

Family

ID=16180343

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18598586A Pending JPS6342375A (en) 1986-08-07 1986-08-07 Vapor growth device

Country Status (1)

Country Link
JP (1) JPS6342375A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140038421A1 (en) * 2012-08-01 2014-02-06 Taiwan Semiconductor Manufacturing Company, Ltd. Deposition Chamber and Injector

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50349A (en) * 1973-04-04 1975-01-06

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50349A (en) * 1973-04-04 1975-01-06

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140038421A1 (en) * 2012-08-01 2014-02-06 Taiwan Semiconductor Manufacturing Company, Ltd. Deposition Chamber and Injector

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