JPS6341017B2 - - Google Patents
Info
- Publication number
- JPS6341017B2 JPS6341017B2 JP5658180A JP5658180A JPS6341017B2 JP S6341017 B2 JPS6341017 B2 JP S6341017B2 JP 5658180 A JP5658180 A JP 5658180A JP 5658180 A JP5658180 A JP 5658180A JP S6341017 B2 JPS6341017 B2 JP S6341017B2
- Authority
- JP
- Japan
- Prior art keywords
- optical
- mask
- straight line
- light beam
- optical system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 90
- 238000001514 detection method Methods 0.000 claims description 38
- 238000012360 testing method Methods 0.000 claims description 11
- 230000004907 flux Effects 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
- G01M11/0235—Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5658180A JPS56153233A (en) | 1980-04-28 | 1980-04-28 | Measuring device for optical characteristic of optical system |
US06/257,271 US4410268A (en) | 1980-04-28 | 1981-04-24 | Apparatus for automatically measuring the characteristics of an optical system |
DE19813116671 DE3116671A1 (de) | 1980-04-28 | 1981-04-27 | Instrument zum automatischen bestimmen der kennwerte eines optischen systems |
FR8108404A FR2481452B1 (fr) | 1980-04-28 | 1981-04-28 | Appareil et procede pour effectuer la mesure automatique des caracteristiques d'un systeme optique |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5658180A JPS56153233A (en) | 1980-04-28 | 1980-04-28 | Measuring device for optical characteristic of optical system |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56153233A JPS56153233A (en) | 1981-11-27 |
JPS6341017B2 true JPS6341017B2 (enrdf_load_stackoverflow) | 1988-08-15 |
Family
ID=13031125
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5658180A Granted JPS56153233A (en) | 1980-04-28 | 1980-04-28 | Measuring device for optical characteristic of optical system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56153233A (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5829446A (ja) * | 1981-08-18 | 1983-02-21 | キヤノン株式会社 | 眼科測定装置 |
-
1980
- 1980-04-28 JP JP5658180A patent/JPS56153233A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS56153233A (en) | 1981-11-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7161664B2 (en) | Apparatus and method for optical determination of intermediate distances | |
JP5016245B2 (ja) | 物体の六つの自由度を求めるための測定システム | |
CA1232444A (en) | Method and apparatus for the contact-less measuring of objects | |
US4410268A (en) | Apparatus for automatically measuring the characteristics of an optical system | |
JPH0318707A (ja) | 光切断法による物体の立体形状検知装置 | |
US4281926A (en) | Method and means for analyzing sphero-cylindrical optical systems | |
US4982102A (en) | Apparatus for detecting three-dimensional configuration of object employing optical cutting method | |
JPH06509416A (ja) | 表面計測のためのプローブ | |
JP3175393B2 (ja) | 距離測定方法および装置 | |
JPS6341017B2 (enrdf_load_stackoverflow) | ||
JPH0310898B2 (enrdf_load_stackoverflow) | ||
JPH0124251B2 (enrdf_load_stackoverflow) | ||
JPS581120A (ja) | テレセントリツク光線を発生する装置および物体の寸法または位置を測定する方法 | |
JPH10267624A (ja) | 三次元形状測定装置 | |
US20050002044A1 (en) | Method for determination of the level of two or more measurement points, and an arrangement for this purpose | |
JPH0117093B2 (enrdf_load_stackoverflow) | ||
JPS60142204A (ja) | 物体の寸法計測方法 | |
JPH0213727B2 (enrdf_load_stackoverflow) | ||
JP2959518B2 (ja) | 高さ測定装置 | |
JPH08219733A (ja) | 三次元スキャナ | |
JPH0634344A (ja) | 表面の曲率を測定する装置および方法 | |
JPH09292218A (ja) | 高さ測定装置及び高さ測定方法 | |
JPH0213728B2 (enrdf_load_stackoverflow) | ||
JPH053537B2 (enrdf_load_stackoverflow) | ||
JPH02277432A (ja) | 曲率測定装置 |