JPS634056U - - Google Patents
Info
- Publication number
- JPS634056U JPS634056U JP9849386U JP9849386U JPS634056U JP S634056 U JPS634056 U JP S634056U JP 9849386 U JP9849386 U JP 9849386U JP 9849386 U JP9849386 U JP 9849386U JP S634056 U JPS634056 U JP S634056U
- Authority
- JP
- Japan
- Prior art keywords
- sample image
- displaying
- electron microscope
- display means
- stitching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Image Processing (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9849386U JPH0441562Y2 (fr) | 1986-06-27 | 1986-06-27 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9849386U JPH0441562Y2 (fr) | 1986-06-27 | 1986-06-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS634056U true JPS634056U (fr) | 1988-01-12 |
JPH0441562Y2 JPH0441562Y2 (fr) | 1992-09-30 |
Family
ID=30966476
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9849386U Expired JPH0441562Y2 (fr) | 1986-06-27 | 1986-06-27 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0441562Y2 (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006127805A (ja) * | 2004-10-26 | 2006-05-18 | Hitachi High-Technologies Corp | 透過型電子顕微鏡装置 |
WO2010050136A1 (fr) * | 2008-10-31 | 2010-05-06 | 株式会社 日立ハイテクノロジーズ | Procédé d’observation d’un échantillon et microscope électronique |
-
1986
- 1986-06-27 JP JP9849386U patent/JPH0441562Y2/ja not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006127805A (ja) * | 2004-10-26 | 2006-05-18 | Hitachi High-Technologies Corp | 透過型電子顕微鏡装置 |
JP4596881B2 (ja) * | 2004-10-26 | 2010-12-15 | 株式会社日立ハイテクノロジーズ | 透過型電子顕微鏡装置 |
WO2010050136A1 (fr) * | 2008-10-31 | 2010-05-06 | 株式会社 日立ハイテクノロジーズ | Procédé d’observation d’un échantillon et microscope électronique |
Also Published As
Publication number | Publication date |
---|---|
JPH0441562Y2 (fr) | 1992-09-30 |
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