JPS634056U - - Google Patents

Info

Publication number
JPS634056U
JPS634056U JP9849386U JP9849386U JPS634056U JP S634056 U JPS634056 U JP S634056U JP 9849386 U JP9849386 U JP 9849386U JP 9849386 U JP9849386 U JP 9849386U JP S634056 U JPS634056 U JP S634056U
Authority
JP
Japan
Prior art keywords
sample image
displaying
electron microscope
display means
stitching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9849386U
Other languages
Japanese (ja)
Other versions
JPH0441562Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9849386U priority Critical patent/JPH0441562Y2/ja
Publication of JPS634056U publication Critical patent/JPS634056U/ja
Application granted granted Critical
Publication of JPH0441562Y2 publication Critical patent/JPH0441562Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Image Processing (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案の一実施例を説明するためのブ
ロツク図、第２図及び第３図は本考案を説明する
ための図である。 １：試料ステージ、２：試料、３：電子ビーム
、４：ステージ制御回路、５：撮像管、６：ビデ
オアンプ、７：陰極線管、８：制御部、９：条件
入力装置。 FIG. 1 is a block diagram for explaining an embodiment of the present invention, and FIGS. 2 and 3 are diagrams for explaining the present invention. 1: sample stage, 2: sample, 3: electron beam, 4: stage control circuit, 5: image pickup tube, 6: video amplifier, 7: cathode ray tube, 8: control section, 9: condition input device.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子顕微鏡によつて得られる試料像を分割し、
該分割された各像を視野移動手段によつて移動さ
せることにより順次撮影し、得られた各像をつな
ぎ合わせることによつて一枚の試料像を作成する
電子顕微鏡つなぎ写真撮影装置において、前記試
料像を表示する表示手段と、該表示手段に表示さ
れる試料像につなぎ写真撮影する際のつなぎ部を
表わす格子像を重畳させて表示するための手段と
を備えたことを特徴とする電子顕微鏡つなぎ写真
撮影装置。 Divide the sample image obtained by an electron microscope,
In the electron microscope stitching photographing apparatus, which sequentially photographs each of the divided images by moving them by a field of view moving means, and creates a single sample image by stitching together the obtained images. An electronic device comprising: a display means for displaying a sample image; and a means for displaying a grid image representing a connecting part when photographing is superimposed on the sample image displayed on the display means. A photographic device connected to a microscope.
JP9849386U 1986-06-27 1986-06-27 Expired JPH0441562Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9849386U JPH0441562Y2 (en) 1986-06-27 1986-06-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9849386U JPH0441562Y2 (en) 1986-06-27 1986-06-27

Publications (2)

Publication Number Publication Date
JPS634056U true JPS634056U (en) 1988-01-12
JPH0441562Y2 JPH0441562Y2 (en) 1992-09-30

Family

ID=30966476

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9849386U Expired JPH0441562Y2 (en) 1986-06-27 1986-06-27

Country Status (1)

Country Link
JP (1) JPH0441562Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006127805A (en) * 2004-10-26 2006-05-18 Hitachi High-Technologies Corp Transmission electron microscope
WO2010050136A1 (en) * 2008-10-31 2010-05-06 株式会社 日立ハイテクノロジーズ Method for observing sample and electronic microscope

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006127805A (en) * 2004-10-26 2006-05-18 Hitachi High-Technologies Corp Transmission electron microscope
JP4596881B2 (en) * 2004-10-26 2010-12-15 株式会社日立ハイテクノロジーズ Transmission electron microscope equipment
WO2010050136A1 (en) * 2008-10-31 2010-05-06 株式会社 日立ハイテクノロジーズ Method for observing sample and electronic microscope

Also Published As

Publication number Publication date
JPH0441562Y2 (en) 1992-09-30

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